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Synchrotron X-Ray Powder Diffraction

Published online by Cambridge University Press:  29 November 2013

D.E. Cox
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X-ray powder diffraction is one of the most widely used techniques by scientists engaged in the synthesis, analysis, and characterization of solids. It is estimated that there are now about 25,000 users throughout the world, of which about one third are in the United States. Any single-phase polycrystalline material gives an x-ray pattern which can be regarded as a unique “fingerprint,” and modern automated search-and-match techniques used in conjunction with the Powder Diffraction File (maintained by the International Center for Diffraction Data, Swarthmore, PA) allow routine analysis of samples in minutes. From an x-ray pattern of good quality it is possible to determine unit cell parameters with high accuracy and impurity concentrations of 1-5%, so that powder techniques are extremely valuable in phase equilibrium studies and residual stress measurements, for example. In addition, a detailed analysis of line shapes gives information about physical properties such as the size and shape of the individual crystallites, microscopic strain, and stacking disorder.

In the early days of crystallography many simple (and some not-so-simple) structures were solved from x-ray powder diffraction patterns, but the obvious limitations to the number of individual reflection intensities which can be estimated and the increasing sophistication of single-crystal techniques resulted in a decline in the importance of this application in the 1950s and 1960s.

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Technical Features
Information
MRS Bulletin , Volume 12 , Issue 1 , February 1987 , pp. 16 - 20
Copyright
Copyright © Materials Research Society 1987

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References

1.Jenkins, R., Science 232 (1986) p. G141.Google Scholar
2.Rietveld, H.M., J. Appl. Cryst. 2 (1969) p. 65.CrossRefGoogle Scholar
3.Wilson, A.J.C., Mathematical Theory of X-Ray Powder Diffractometry, Philips, Eindhoven (1963); H.P. Klug and L.E. Alexander, X-Ray Diffraction Procedures, Wiley, New York (1974).Google Scholar
4.Cox, D.E., Hastings, J.B., Thomlinson, W., and Prewitt, C.T., Nucl. Instrum. Methods 208 (1983) p. 573; J.B. Hastings, W. Thomlinson, and D.E. Cox, J. Appl. Cryst. 17 (1984) p. 85.CrossRefGoogle Scholar
5.Suortti, P., Hastings, J.B., and Cox, D.E., Acta Cryst. A41 (1985) p. 413, 417.CrossRefGoogle Scholar
6.Cox, D.E., Hastings, J.B., Cardoso, L.P., and Finger, L.W., High Resolution Powder Diffraction, edited by Catlow, C.R.A., Materials Science Forum, Trans. Tech. Publications, Aedermannsdorf, Switzerland (1986).Google Scholar
7.Kokotailo, G.T., Chu, P., Lawton, S.L., and Meier, W.M., Nature 275 (1978) p. 119.CrossRefGoogle Scholar
8.Toby, B., Eddy, M.M., Kokotailo, G.T., Fyfe, C.A., and Cox, D.E. (in preparation).Google Scholar
9.Attfield, J.P., Sleight, A.W., and Cheetham, A.K., Nature 322 (1986) p. 620.CrossRefGoogle Scholar
10.Kofalt, D.D., Nanao, S., Egami, T., Wong, K.M., and Poon, S.J., Phys. Rev. Lett. 57 (1986) p. 114.CrossRefGoogle Scholar
11.Parrish, W., Hart, M., and Huang, T.C., J. Appl. Cryst. 19 (1986) p. 92; W. Parrish and M. Hart, Trans. Amer. Cryst. Assoc. 21 (1985) p. 51.CrossRefGoogle Scholar
12.Christensen, A.N., Lehmann, M.S., and Nielsen, M., Aust. J. Phys. 38 (1985) p. 497; M.S. Lehmann, A.N. Christensen, H. Fjellvag, R. Feidenhans'l, and M. Nielsen, J. Appl. Cryst. (in press).CrossRefGoogle Scholar
13.Arnold, H. and Kosten, K., Nucl. Instrum. Methods 208 (1983) p. 599; Acta Cryst. A40 (1984) p. C362.CrossRefGoogle Scholar
14.Glazer, A.M., Thompson, P., Groves, P., Swindells, N., and Thomas, P.A., Annual Report, Daresbury (1984/1985) p. 105.Google Scholar
15.Yamanaka, T., Takeuchi, Y., Tokonami, M., Matsumoto, T., and Kotou, K., Photon Factory Activity Report, National Laboratory for High Energy Physics (1983/1984); K. Ogata, T. Yamanaka, K. Sugiyama, M. Tokonami, H. Morikawa, and S. Sasaki, Photon Factory Activity Report, National Laboratory for High Energy Physics (1984/85).Google Scholar
16.Buras, B., Olsen, J. Staun, Gerward, L., Will, G., and Hinze, E., J. Appl. Cryst. 10 (1977) p. 431.CrossRefGoogle Scholar
17.Bordas, J., Glazer, A.M., Howard, C.J., and Bourdillon, A.J., Phil. Mag. 35 (1977) p. 311.CrossRefGoogle Scholar
18.Buras, B., Nucl. Instrum. Methods 208 (1983) p. 563; E.F. Skelton, Physics Today (1984) p. 44.CrossRefGoogle Scholar
19.Shimomura, O., Yamaoka, S., Yagi, T., Wakatsuki, M., Tsuji, K., Fukunaga, O., Kawamura, H., Aoki, K., and Akimoto, S. in High Pressure in Science and Technology, Part III, edited by Homan, C.G., MacCrone, R.K., and Whalley, E., Elsevier, New York (1984) p. 17; see also the Photon Factory Activity Report, National Laboratory for High Energy Physics, Tsukuba (1983/84); and also (1984/85).Google Scholar
20.Schaefer, M.W., Schiferl, D., Katz, A.I., Skelton, E.F., and Qadri, S.B., Stanford Synchrotron Radiation Laboratory Activity Report, Stanford (1985) p. 127.Google Scholar
21.Vohra, Y.K., Brister, K.E., Weir, S.T., Duelos, S.J., and Ruoff, A.L., Science 231 (1986) p. 1136; Y.K. Vohra, K.E. Brister, S. Desgreniers, A.L. Ruoff, K.J. Chang, and M.L. Cohen, Phys. Rev. Lett. 56 (1986) p. 1944.CrossRefGoogle Scholar
22.Zha, C.S., Mao, H.K., Jephcoat, A.P., Bell, P.M., Hemley, R.J., Finger, L.W., and Cox, D.E., Amer. Geophys. Union Annual Meeting, San Francisco (1986); H.K. Mao, C.S. Zha, A.P. Jephcoat, R.J. Hemley, L.W. Finger, and D.E. Cox, Bull. Amer. Phys. Soc. (1987), in press.Google Scholar
23.Jephcoat, A.P., Mao, H.K., Finger, L.W., Hemley, R.J., Zha, C.S., and Cox, D.E., Bull. Amer. Phys. Soc. (1987), in press.Google Scholar