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Single atom imaging and spectroscopy in nanostructured carbon materials

Published online by Cambridge University Press:  13 January 2012

Kazu Suenaga ,
Haruka Kobayashi  and
Masanori Koshino
Kazu Suenaga
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Central 5, Tsukuba, 305-8565, Japan; [email protected]
Haruka Kobayashi
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Central 5, Tsukuba, 305-8565, Japan; [email protected]
Masanori Koshino
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Central 5, Tsukuba, 305-8565, Japan; [email protected]
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Abstract

Identifying constituent atoms in materials is the ultimate goal for all analytical techniques. Here, we describe the successful achievement of single atom spectroscopy in nanostructured carbon-based materials using a scanning transmission electron microscope equipped with electron energy-loss spectroscopy. The chemical analyis of individual metallofullerene molecules can be successfully performed without massive beam damage. Atom-by-atom spectroscopy of the edge carbon atoms in single layer graphene is also discussed.

Keywords

Nanoscaleelectron energy-loss spectroscopy (EELS)scanning transmission electron microscopy (STEM)defects
Type
Research Article
Information
MRS Bulletin , Volume 37 , Issue 1: Spectroscopic imaging in electron microscopy , January 2012 , pp. 36 - 38
Copyright
Copyright © Materials Research Society 2012

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References

1.Suenaga, K., Tencé, M., Mory, C., Colliex, C., Kato, H., Okazaki, T., Shinohara, H., Hirahara, K., Bandow, S., Iijima, S., Science 290, 2280 (2000).CrossRefGoogle Scholar
2.Hirahara, K., Suenaga, K., Bandow, S., Okazaki, T., Kato, H., Shinohara, H., Iijima, S., Phys. Rev. Lett. 85, 5384 (2000).CrossRefGoogle Scholar
3.Tencé, M., Quartuccio, M., Colliex, C., Ultramicroscopy 58, 42 (1995).CrossRefGoogle Scholar
4.Sawada, H., Sasaki, T., Hosokawa, F., Yuasa, S., Terao, M., Kawazoe, M., Nakamichi, T., Kaneyama, T., Kondo, Y., Kimoto, K., Suenaga, K., J. Electron Microscopy 58, 341 (2009).CrossRefGoogle Scholar
5.Sawada, H., Sasaki, T., Hosokawa, F., Yuasa, S., Terao, M., Kawazoe, M., Nakamichi, T., Kaneyama, T., Kondo, Y., Kimoto, K., Suenaga, K., Ultramicroscopy 110, 958 (2010).CrossRefGoogle Scholar
6.Sasaki, T., Sawada, H., Hosokawa, F., Kohno, Y., Tomita, T., Kaneyama, T., Kondo, Y., Kimoto, K., Sato, Y., Suenaga, K., J. Electron Microscopy 59, S7 (2010).CrossRefGoogle Scholar
7.Suenaga, K., Sato, Y., Liu, Z., Kataura, H., Okazaki, T., Kimoto, K., Sawada, H., Sasaki, T., Omoto, K., Tomita, T., Kaneyama, T., Kondo, Y., Nature Chem. 1, 415 (2010).CrossRefGoogle Scholar
8.Krivanek, O., Dellby, N., Murfitt, M.F., Chisholm, M.F., Pennycook, T.J., Suenaga, K., Nicolosi, V., Ultramicroscopy 110, 935 (2010).CrossRefGoogle Scholar
9.Banhart, F., Reports on Progress in Physics 62, 1181 (1999).CrossRefGoogle Scholar
10.Gubbens, A., Barfels, M., Trevor, C., Twesten, R., Mooney, P., Thomas, P., Menon, N., Kraus, B., Mao, C., McGinn, B., Ultramicroscopy 110, 962 (2010).CrossRefGoogle Scholar
11.Suenaga, K., Iizumi, Y., Okazaki, T., European Physical Journal Applied Physics 54, 33508 (2011).CrossRefGoogle Scholar
12.Girit, C.O., Meyer, J.C., Erni, R., Rossell, M.D., Kisielowski, C., Yang, L., Park, C-H., Crommie, M.F., Cohen, M.L., Louie, S.G., Zettl, A., Science 323, 1705 (2009).CrossRefGoogle Scholar
13.Kobayashi, Y., Fukui, K., Enoki, T., Kusakabe, K., Phys. Rev. B 73, 125415 (2006).CrossRefGoogle Scholar
14.Suenaga, K., Koshino, M., Nature 468 1088 (2010).CrossRefGoogle Scholar