Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-24T03:27:21.519Z Has data issue: false hasContentIssue false
  • English
  • Français

Scanning ultrafast electron microscopy: Four-dimensional imaging of materials dynamics in space and time

Published online by Cambridge University Press:  10 July 2018

Ding-Shyue Yang ,
Bolin Liao  and
Omar F. Mohammed
Ding-Shyue Yang
Affiliation:
University of Houston, USA; [email protected]
Bolin Liao
Affiliation:
University of California, Santa Barbara, USA; [email protected]
Omar F. Mohammed
Affiliation:
Division of Physical Sciences and Engineering, King Abdullah University of Science and Technology, Saudi Arabia; [email protected]
Get access

Abstract

Conventional electron microscopy during the last three decades has experienced tremendous developments, especially in equipment design and engineering, to become one of the most widely recognized and powerful tools for key research areas in materials science and nanotechnology. In this article, we discuss scanning ultrafast electron microscopy (S-UEM) as a new methodology for four-dimensional electron imaging of material surfaces. We also illustrate a few unique applications. By monitoring secondary electrons emitted from surfaces of photoactive materials, photo- and electron-impact-induced electrons and holes near surfaces, interfaces, and heterojunctions can be imaged with adequate spatial and temporal resolution. Charge separation, transport, and anisotropic motions as well as their dependence on carrier energies can be resolved. S-UEM is poised to directly image and visualize relevant interfacial dynamics in real space and time for emerging optoelectronic devices and help push their performance.

Keywords

field emissionscanning electron microscopy (SEM) nanostructurephotovoltaicoptoelectronic
Type
Ultrafast Imaging of Materials Dynamics
Information
MRS Bulletin , Volume 43 , Issue 7: Ultrafast Imaging of Materials Dynamics , July 2018 , pp. 491 - 496
Copyright
Copyright © Materials Research Society 2018 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Bonaccorso, F., Colombo, L., Yu, G., Stoller, M., Tozzini, V., Ferrari, A.C., Ruoff, R.S., Pellegrini, V., Science 347, 1246501 (2015).CrossRefGoogle Scholar
Bhimanapati, G.R., Lin, Z., Meunier, V., Jung, Y., Cha, J., Das, S., Xiao, D., Son, Y., Strano, M.S., Cooper, V.R., Liang, L., Louie, S.G., Ringe, E., Zhou, W., Kim, S.S., Naik, R.R., Sumpter, B.G., Terrones, H., Xia, F., Wang, Y., Zhu, J., Akinwande, D., Alem, N., Schuller, J.A., Schaak, R.E., Terrones, M., Robinson, J.A., ACS Nano 9, 11509 (2015).CrossRefGoogle Scholar
Manser, J.S., Christians, J.A., Kamat, P.V., Chem. Rev. 116, 12956 (2016).CrossRefGoogle Scholar
Minovich, A.E., Miroshnichenko, A.E., Bykov, A.Y., Murzina, T.V., Neshev, D.N., Kivshar, Y.S., Laser Photon. Rev. 9, 195 (2015).CrossRefGoogle Scholar
Zewail, A.H., J. Phys. Chem. A 104, 5660 (2000).CrossRefGoogle Scholar
Othonos, A., J. Appl. Phys. 83, 1789 (1998).CrossRefGoogle Scholar
Anderson, N.A., Lian, T., Annu. Rev. Phys. Chem. 56, 491 (2005).CrossRefGoogle Scholar
Zhang, L.Y., Yang, Y., Kao, Y.T., Wang, L.J., Zhong, D.P., J. Am. Chem. Soc. 131, 10677 (2009).CrossRefGoogle Scholar
Cowan, S.R., Banerji, N., Leong, W.L., Heeger, A.J., Adv. Funct. Mater. 22, 1116 (2012).CrossRefGoogle Scholar
Grumstrup, E.M., Gabriel, M.M., Cating, E.E.M., Van Goethem, E.M., Papanikolas, J.M., Chem. Phys. 458, 30 (2015).CrossRefGoogle Scholar
Davydova, D.Y., de la Cadena, A., Akimov, D., Dietzek, B., Laser Photon. Rev. 10, 62 (2016).CrossRefGoogle Scholar
Guo, Z., Wan, Y., Yang, M.J., Snaider, J., Zhu, K., Huang, L.B., Science 356, 59 (2017).CrossRefGoogle Scholar
Lobastov, V.A., Srinivasan, R., Zewail, A.H., Proc. Natl. Acad. Sci. U.S.A. 102, 7069 (2005).CrossRefGoogle Scholar
Zewail, A.H., Annu. Rev. Phys. Chem. 57, 65 (2006).CrossRefGoogle Scholar
Zewail, A.H., Science 328, 187 (2010).CrossRefGoogle Scholar
Barwick, B., Flannigan, D.J., Zewail, A.H., Nature 462, 902 (2009).CrossRefGoogle Scholar
Flannigan, D.J., Zewail, A.H., Acc. Chem. Res. 45, 1828 (2012).CrossRefGoogle Scholar
Flannigan, D.J., Lindenberg, A.M., MRS Bull. 43 (7), 485 (2018).CrossRefGoogle Scholar
Feist, A., Storeck, G., Schäfer, S., Ropers, C., MRS Bull. 43 (7), 504 (2018).CrossRefGoogle Scholar
Pomarico, E., Kim, Y.-J., García de Abajo, F.J., Kwon, O.-H., Carbone, F., van der Veen, R.M., MRS Bull. 43 (7), 497 (2018).CrossRefGoogle Scholar
Yang, D.-S., Mohammed, O.F., Zewail, A.H., Proc. Natl. Acad. Sci. U.S.A. 107, 14993 (2010).CrossRefGoogle Scholar
Mohammed, O.F., Yang, D.-S., Pal, S.K., Zewail, A.H., J. Am. Chem. Soc. 133, 7708 (2011).CrossRefGoogle Scholar
Sun, J.Y., Melnikov, V.A., Khan, J.I., Mohammed, O.F., J. Phys. Chem. Lett. 6, 3884 (2015).CrossRefGoogle Scholar
Hosokawa, T., Fujioka, H., Ura, K., Rev. Sci. Instrum. 49, 624 (1978).CrossRefGoogle Scholar
Merano, M., Sonderegger, S., Crottini, A., Collin, S., Renucci, P., Pelucchi, E., Malko, A., Baier, M.H., Kapon, E., Deveaud, B., Ganière, J.D., Nature 438, 479 (2005).CrossRefGoogle Scholar
Shaheen, B.S., Sun, J.Y., Yang, D.-S., Mohammed, O.F., J. Phys. Chem. Lett. 8, 2455 (2017).CrossRefGoogle Scholar
Yang, D.-S., Mohammed, O.F., Zewail, A.H., Angew. Chem. Int. Ed. Engl. 52, 2897 (2013).CrossRefGoogle Scholar
Feist, A., Bach, N., Rubiano da Silva, N., Danz, T., Möller, M., Priebe, K.E., Domröse, T., Gatzmann, J.G., Rost, S., Schauss, J., Strauch, S., Bormann, R., Sivis, M., Schäfer, S., Ropers, C., Ultramicroscopy 176, 63 (2017).CrossRefGoogle Scholar
Sun, J.Y., Adhikari, A., Shaheen, B.S., Yang, H.Z., Mohammed, O.F., J. Phys. Chem. Lett. 7, 985 (2016).CrossRefGoogle Scholar
Najafi, E., Liao, B., Scarborough, T., Zewail, A., Ultramicroscopy 184, 46 (2018).CrossRefGoogle Scholar
Everhart, T.E., Thornley, R.F.M., J. Sci. Instrum. 37, 246 (1960).CrossRefGoogle Scholar
Cho, J.W., Hwang, T.Y., Zewail, A.H., Proc. Natl. Acad. Sci. U.S.A. 111, 2094 (2014).CrossRefGoogle Scholar
Najafi, E., Scarborough, T.D., Tang, J., Zewail, A.H., Science 347, 164 (2015).CrossRefGoogle Scholar
Liao, B., Najafi, E., Li, H., Minnich, A.J., Zewail, A.H., Nat. Nanotechnol. 12, 871 (2017).CrossRefGoogle Scholar
Najafi, E., Ivanov, V., Zewail, A., Bernardi, M., Nat. Commun. 8, 15177 (2017).CrossRefGoogle Scholar
Van Roosbroeck, W., Casey, H.C. Jr., Phys. Rev. B Condens. Matter 5, 2154 (1972).CrossRefGoogle Scholar
Liao, B., Zhao, H., Najafi, E., Yan, X.D., Tian, H., Tice, J., Minnich, A.J., Wang, H., Zewail, A.H., Nano Lett. 17, 3675 (2017).CrossRefGoogle Scholar
Bose, R., Bera, A., Parida, M.R., Adhikari, A., Shaheen, B.S., Alarousu, E., Sun, J., Wu, T., Bakr, O.M., Mohammed, O.F., Nano Lett. 16, 4417 (2016).CrossRefGoogle Scholar
Bose, R., Sun, J., Khan, J.I., Shaheen, B.S., Adhikari, A., Ng, T.K., Burlakov, V.M., Parida, M.R., Priante, D., Goriely, A., Ooi, B.S., Bakr, O.M., Mohammed, O.F., Adv. Mater. 28, 5106 (2016).CrossRefGoogle Scholar
Khan, J.I., Adhikari, A., Sun, J., Priante, D., Bose, R., Shaheen, B.S., Ng, T.K., Zhao, C., Bakr, O.M., Ooi, B.S., Mohammed, O.F., Small 12, 2313 (2016).CrossRefGoogle ScholarPubMed
Bose, R., Adhikari, A., Burlakov, V.M., Liu, G., Haque, M.A., Priante, D., Hedhili, M.N., Wehbe, N., Zhao, C., Yang, H., Ng, T.K., Goriely, A., Bakr, O.M., Wu, T., Ooi, B.S., Mohammed, O.F., ACS Energy Lett. 3, 476 (2018).CrossRefGoogle Scholar
Zani, M., Sala, V., Irde, G., Pietralunga, S.M., Manzoni, C., Cerullo, G., Lanzani, G., Tagliaferri, A., Ultramicroscopy 187, 93 (2018).CrossRefGoogle Scholar