Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-28T01:06:18.246Z Has data issue: false hasContentIssue false

Research and Development of Biaxially Textured IBAD-GZO Templates for Coated Superconductors

Published online by Cambridge University Press:  31 January 2011

Get access

Abstract

Ion-beam-assisted deposition (IBAD) has been used to prepare biaxially textured templates necessary to realizing high superconducting performance in coated conductors.The IBAD method is characterized by the direct deposition of sharply aligned templates on nontextured metal substrates using fluorite-like oxide films (yttrium-stabilized zirconia, Gd2Zr2O7, etc.).Recent progress in vacuum technology for IBAD has made it possible to reproducibly fabricate long lengths (100 m) of IBAD-GZO templates.Continuous deposition of YBCO films on these templates has been achieved by pulsed laser deposition (PLD).Furthermore, a new approach to improving the texture of IBAD templates was found by using CeO2 films grown by PLD.Trifluoroacetate-based metalorganic deposition has also been used instead of PLD to produce superconducting layers on IBAD buffered tapes, aiming at a low-cost process.This article reviews progress in the research and development of biaxially textured templates produced using IBAD and their subsequent use in fabricating superconducting tapes and wires by means of several processes.

Type
Research Article
Copyright
Copyright © Materials Research Society 2004

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1Dimos, D.Chaudhari, P. and Mannhart, J.Phys. Rev.B 41 (1990) p.4038.CrossRefGoogle Scholar
2Iijima, Y.Tanabe, N.Kohno, O. and Ikeno, Y.Appl. Phys. Lett. 60 (1992) p.769.CrossRefGoogle Scholar
3Iijima, Y.Onabe, K.Futaki, N.Tanabe, N.Sadakata, N.Kohno, O. and Ikeno, Y.IEEE Trans. Appl. Supercond. 3 (1993) p.1510.CrossRefGoogle Scholar
4Iijima, Y. and Matsumoto, K.Supercond. Sci. Technol. 13 (2000) p.68.CrossRefGoogle Scholar
5Kakimoto, K.Iijima, Y. and Saitoh, T.Physica C 392–396 (2003) p.783.CrossRefGoogle Scholar
6Iijima, Y.Kakimoto, K.Sutoh, Y.Ajimura, S. and Saitoh, T. Physica C (2004) in press.Google Scholar
7Iijima, Y.Kakimoto, K. and Takeda, K.IEEE Trans. Appl. Supercond. 12 (2001) p.3457.CrossRefGoogle Scholar
8Muroga, T.Araki, T.Niwa, T.Iijima, Y.Saitoh, T.Hirabayashi, I.Yamada, Y. and Shiohara, Y.IEEE Trans. Appl. Supercond. 13 (2003) p.2532.CrossRefGoogle Scholar
9Kakimoto, K.Iijima, Y.Sutoh, Y. and Saitoh, T. unpublished manuscript.Google Scholar
10Fuji, H.Honjo, T.Teranishi, R.Tokunaga, Y. J.Shibata, Izumi, T.Shiohara, Y.Iijima, Y. and Saitoh, T.Physica C 392–396 (2003) p.905.CrossRefGoogle Scholar
11Bradley, R.M. in Handbook of Ion Beam Processing Technology, Chapter 15, edited by Cuomo, J.J.Rossnagel, S.M. and Kaufman, H.R. (Noyes Publications, Park Ridge, NJ, 1989) p.300.Google Scholar
12Yu, L.S.Harper, J.M.E.Cuomo, J.J. and Smith, D.A.Appl. Phys. Lett. 47 (1985) p.932.CrossRefGoogle Scholar
13Bradley, R.M.Harper, J.M.E. and Smith, D.A.J.Appl. Phys. 60 (1986) p.4160.CrossRefGoogle Scholar
14Resslar, K.G.Sonnenberg, N. and Cima, M.J.J.Am. Ceram. Soc. 80 (1997) p.2637.CrossRefGoogle Scholar
15Dong, L.Zepeda-Ruiz, L.A., and Srolovitz, D.J.J.Appl. Phys. 89 (2001) p.4105.CrossRefGoogle Scholar
16Foltyn, S.R.Arendt, P.N.Dowden, C.DePaula, R.F.Groves, J.R.Coulter, J.Y.Jia, Q.Maley, M.P. and Peterson, D.E.IEEE Trans. Appl. Su-percond. 9 (1999) p.1519.CrossRefGoogle Scholar
17Selvamanickam, V.Lee, H.G.Li, Y.Xiong, X.Qiao, Y.Reeves, J., Xie, Y.Knoll, A. and Lenseth, K.Physica C 392–396 (2003) p.859.CrossRefGoogle Scholar
18Usoskin, A.Freyhardt, H.C.Issaev, A.Dzick, J.Knoke, J.Oomen, M.P.Leghissa, M. and Neumueller, H.W.IEEE Trans. Appl. Super-cond. 13 (2003) p.2452.CrossRefGoogle Scholar
19Wang, C.P.Do, K.B.Beasley, M.R.Geballe, T.H. and Hammond, R.H.Appl. Phys. Lett. 71 (1997) p.2955.CrossRefGoogle Scholar
20Groves, J.R.Arendt, P.N.Foltyn, S.R.Jia, Q.X.Holesinger, T.G.Emmert, L.A.DePaula, R.F.Dowden, P.C. and Stan, L.IEEE Trans. Appl. Supercond. 13 (2003) p.2651.CrossRefGoogle Scholar
21Zhu, S.Lowndes, D.H.Budai, J.D. and Norton, D.P.Appl. Phys. Lett. 65 (1994) p.2012.CrossRefGoogle Scholar
22Xiong, X. and Winkler, D.Physica C 336 (2000) p.70.CrossRefGoogle Scholar
23Betz, V.Holzapfel, B.Raouser, D. and Schultz, L.Appl. Phys. Lett. 71 (1997) p.2952.CrossRefGoogle Scholar
24Iijima, Y.Kimura, M. and Saitoh, T. in Fundamental Mechanisms of Low-Energy-Beam-Modified Surface Growth and Processing, edited by Moss, S.C.Chason, E.H.Cooper, B.H.Harper, J.M.E.Rubia, T.D. de la, and Murty, M.V.R. (Mat. Res. Soc. Symp. Proc. 585, Warrendale, PA, 2000) p.45.Google Scholar
25Iijima, Y.Kakimoto, K.Saitoh, T.Katoh, T. and Hirayama, T.Physica C 378–381 (2002) p.960.CrossRefGoogle Scholar
26Iijima, Y.Kakimoto, K.Saitoh, T.Katoh, T. and Hirayama, T.J. Jpn. Inst. Metals 66 (2002) p.528 (in Japanese).CrossRefGoogle Scholar
27Kato, T.Iijima, Y.Muroga, T.Saitoh, T.Hirayama, T.Hirabayashi, I.Yamada, Y.Izumi, T.Shiohara, Y. and Ikuhara, Y.Physica C 392–396 (2003) p.790.CrossRefGoogle Scholar
28Iijima, Y.Hosaka, M.Tanabe, N.Sadakata, N.Saitoh, T.Kohno, O. and Takeda, K.J.Mater. Res. 13 (1998) p.3106.CrossRefGoogle Scholar
29Iijima, Y.Kakimoto, K.Kimura, M.Takeda, K. and Saitoh, T.IEEE Trans. Appl. Super-cond. 12 (2001) p.2816.CrossRefGoogle Scholar
30Iijima, Y.Kimura, M.Saitoh, T. and Takeda, K.Physica C 335 (2000) p.15.CrossRefGoogle Scholar
31Takahashi, T.Araki, T.Yamagiwa, K.Yamada, Y.Kim, S.B.Iijima, Y.Takeda, K. and Hirabayashi, I.Physica C 357–360 (2001) p.1003.CrossRefGoogle Scholar
32Yamada, Y.Muroga, T.Iwai, H.Izumi, T. and Shiohara, Y.Physica C 392–396 (2003) p. 777.CrossRefGoogle Scholar
33Muroga, T.Iwai, H.Yutaka, Y.Izumi, T.Shiohara, Y.Iijima, Y.Saito, T.Kato, T.Sugawara, Y. and Hirayama, T.Physica C 392–396 (2003) p.796.CrossRefGoogle Scholar
34Goyal, A.Lee, D.F.List, F.A.Specht, E.D.Feenstra, R.Paranthaman, M.Cui, X.Lu, S.W.Martin, P.M.Kroeger, D.M.Christen, D.K.Kang, B.W.Norton, D.P.Park, C.Verebelyi, D.T.Thompson, J.R.Williams, R.K.Aytug, T. and Cantoni, C.Physica C 357–360 (2001) p.903.CrossRefGoogle Scholar
35Muroga, T.Watanabe, T.Miyata, S.Iwai, H.Yamada, Y.Shiohara, Y.Kato, T.Sugawara, Y. and Hirayama, T. Physica C (2004) in press.Google Scholar
36Yamada, Y.Watanabe, T.Muroga, T.Miyata, S.Iwai, H.Yamada, Y. and Shiohara, Y.Supercond. Sci. Technol. 17 (2004) p.S70.CrossRefGoogle Scholar
37Iwai, H.Muroga, T.Watanabe, T.Miyata, S.Yamada, Y.Shiohara, Y.Kato, T. and Hirayama, T. Adv. Cryo. Eng. (2004) in press.Google Scholar
38Mclntyre, P.C.Cima, M.J. and Ng, M.F.J. Appl. Phys. 68 (1990) p.4183.CrossRefGoogle Scholar
39Fuji, H.Honjo, T.Nakamura, Y.Izumi, T.Araki, T.Hirabayashi, I.Shiohara, Y.Iijima, Y. and Takeda, K.Physica C 357–360 (2001) p.1011.CrossRefGoogle Scholar
40Izumi, T.Honjo, T.Tokunaga, Y.Fuji, H.Teranishi, R.Iijima, Y.Saitoh, T.Nakamura, Y. and Shiohara, Y.IEEE Trans. Appl. Supercond. 13 (2003) p.2500.CrossRefGoogle Scholar
41Honjo, T.Nakamura, Y.Teranishi, R.Tokunaga, Y.Fuji, H.Shibata, J., Asada, S.Izumi, T.Shiohara, Y.Iijima, Y.Saitoh, T.Kaneko, A. and Murata, K.Physica C 392–396 (2003) p.873.CrossRefGoogle Scholar
42Fuji, H.Honjo, T.Teranishi, R.Tokunaga, Y.Shibata, J., Izumi, T.Shiohara, Y.Iijima, Y. and Saitoh, T.Physica C 392–396 (2003) p.905.CrossRefGoogle Scholar
43Tokunaga, Y.Fuji, H.Teranishi, R.Shibata, J.Asada, S.Honjo, T.Izumi, T.Shiohara, Y.Iijima, Y. and Saitoh, T.Physica C 392–396 (2003) p.392.Google Scholar
44Izumi, T.Tokunaga, Y.Fuji, H.Teranishi, R.Matsuda, J.Asada, S.Honjo, T.Shiohara, Y.Muroga, T.Miyata, S.Watanabe, T.Yamada, Y.Iijima, Y.Saitoh, T.Goto, T.Yoshinaka, A. and Yajima, A. Physica C (2004) in press.Google Scholar
45Tokunaga, Y.Fuji, H.Teranishi, R.Matsuda, J.Asada, S.Kaneko, A.Honjo, T.Izumi, T.Shiohara, Y.Yamada, Y.Murata, K.Iijima, Y.Saitoh, T.Goto, T.Yoshinaka, A. and Yajima, A. Physica C (2004) in press.Google Scholar
46Takahashi, Y.Aoki, Y.Hasegawa, T.Iijima, Y.Saito, T.Hirabayashi, I.Honjo, T.Yoshida, Y.Takai, Y. and Shihara, Y.Physica C 378–381 (2002) p.1024.CrossRefGoogle Scholar
47Honjo, T.Nakamura, Y.Teranishi, R.Fuji, H.Shibata, J.Izumi, T. and Shiohara, Y.IEEE Trans. Appl. Supercond. 13 (2003) p.2516.CrossRefGoogle Scholar
48Lee, D.F.List, F.A.Kroeger, D.M.Childs, K.W.O'Neil, D., and Robbins, W.B. in Program and Extended Abstracts of the 5th Intl. Workshop on Superconductivity (ISTEC, Tokyo, 2001) p.73.Google Scholar