Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-28T02:01:23.022Z Has data issue: false hasContentIssue false

Radio-Frequency Power Transistors Based on 6H- and 4H-SiC

Published online by Cambridge University Press:  29 November 2013

Get access

Extract

In recent years, SiC has received a great deal of attention as a nearly ideal material for the fabrication of high-speed, high-power transistors. The high electric breakdown field of 3.8 × 106 V/cm, high saturated electron drift velocity of 2 × 107 cm/s, and high thermal conductivity of 4.9 W/cm K indicate SiC's potential for high-power, high-frequency operation. A wide bandgap should also allow SiC field-effect transistors (FETs) to have high radio-frequency (rf) output power at high temperatures.

These material qualities have been verified through outstanding device performance. Recent results for SiC metal-semiconductor field-effect transistors (MESFETs) have included superior frequency and power performance, with power gain at frequencies as high as 40 GHz and power densities as high as 3.3 W/mm. This represents significantly higher operating frequencies and power densities than current Si rf power FET technology, and nearly three times the power density of GaAs MESFETs, which are currently used in many commercial rf power applications. Similarly, SiC static induction transistors (SITs) have much higher power densities than their Si counterparts and have recently been demonstrated in modules with as much as 470-W total pulsed output power. This article describes microwave device operation, discusses material properties needed for rf power generation, and summarizes state-of-the-art SiC high-frequency device performance. Emphasis is placed on MESFETs and SITs since they are currently the most mature SiC-based device technologies.

Type
Silicon Carbide Electronic Materials and Devices
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Shin, M., Bilbro, G., and Trew, R., “High Temperature Operation of N-Type 6H-SiC and P-Type Diamond MESFET's,” IEEE Cornell Conf. on Advanced Concepts in High Speed Semiconductor Devices and Circuits (The Institute of Electrical and Electronics Engineers, Ithaca, 1993) p. 421.Google Scholar
2.Weitzel, C., Palmour, J., Carter, C. Jr., Nordquist, K., Moore, K., and Allen, S., “SiC Microwave Power MESFET's and JFET's,” in Compound Semiconductors 1994, edited by Goronkin, H. and Mishra, U. (Institute of Physics Publishing, Bristol, 1994) p. 389.Google Scholar
3.Sriram, S., Augustine, G., Burk, A., Glass, R., Hobgood, H., Orphanos, P., Rowland, L., Smith, T., Brandt, C., Driver, M., and Hopkins, R., “4H-SiC MESFET's with 42 GHz fmax,” IEEE Electron Device Lett. 17 (7) (1996) p. 369.CrossRefGoogle Scholar
4.Moore, K., Weitzel, C., Nordquist, K., Pond, L. III, Palmour, J., Allen, S., and Carter, C. Jr., “Bias Dependence of RF Power Characteristics of 4H-SiC MESFET's,” IEEE Cornell Conf. on Advanced Concepts in High Speed Semiconductor Devices and Circuits (The Institute of Electrical and Electronics Engineers, Ithaca, 1995) p. 40.Google Scholar
5.Morse, A., Esker, P., Clarke, R., Brandt, C., Siergiej, R., and Agarwal, A., “Application of High Power Silicon Carbide Transistors at Radar Frequencies,” IEEE MTT-S Digest (1996) p. 677.Google Scholar
6.Bahl, I. and Bhartia, P., eds., Microwave Solid State Circuit Design (John Wiley and Sons, Inc., New York, 1988) p. 483.Google Scholar
7.Liao, S., Microwave Circuit Analysis and Amplifier Design (Prentice-Hall, Inc., Englewood Cliffs, NJ, 1987) pp. 78 and 236.Google Scholar
8.Mead, C.A., “Schottky Barrier Gate Field-Effect Transistor,” Proc. IEEE 54 (1966) p. 307.CrossRefGoogle Scholar
9.Hooper, W.W. and Lehrer, W.I., “An Epitaxial GaAs Field-Effect Transistor,” Proc. IEEE 55 (1967) p. 1237.CrossRefGoogle Scholar
10.Sze, S., Physics of Semiconductor Devices (John Wiley and Sons, New York, 1981) p. 312.Google Scholar
11.Trew, R., Yan, J., and Mock, P., “The Potential of Diamond and SiC Electronic Devices for Microwave and Millimeter-Wave Power Applications,” Proc. IEEE 79 (5) (1991) p. 598.CrossRefGoogle Scholar
12.Davis, R., “Thin Films and Devices of Diamond, Silicon Carbide, and Gallium Nitride,” Physica B 185 (1993) p. 1.CrossRefGoogle Scholar
13.Sriram, S., Clarke, R., Burk, A., Hobgood, H., McMullin, P., Orphanos, P., Siergiej, R., Smith, T., Brandt, C., Driver, M., and Hopkins, R., “RF Performance of SiC MESFET's on High Resistivity Substrates,” IEEE Electron Device Lett. 15 (11) (1994) p. 458.CrossRefGoogle Scholar
14.Sriram, S., Barron, R., Morse, A., Smith, T., Augustine, G., Burk, A., Clarke, R., Glass, R., Hobgood, H., Orphanos, P., Siergiej, R., Brandt, C., Driver, M., and Hopkins, R., “High Efficiency Operation of 6-H SiC MESFET's at 6 GHz,” 1995 Device Research Conf. (University of Virginia, Charlottesville, 1995).Google Scholar
15.Allen, S., Palmour, J., Carter, C. Jr., Weitzel, C., Moore, K., Nordquist, K., and Pond, L. III, “Silicon Carbide MESFET's with 2 W/mm and 50% P.A.E. at 1.8 GHz,” IEEE MTT-S Digest (1996) p. 681.Google Scholar
16.Weitzel, C., “Comparison of SiC, GaAs, and Si RF MESFET Power Densities,” IEEE Electron Device Lett. 16 (10) (1995) p. 451.CrossRefGoogle Scholar
17.Clarke, R., Siergiej, R., Agarwal, A., Brandt, C., Burk, A., Morse, A., and Orphanos, P., “30W VHF 6H-SiC Power Static Induction Transistor,” IEEE Cornell Conf. Adv. Concepts in High Speed Semicond. Devices and Circuits (The Institute of Electrical and Electronics Engineers, Ithaca, 1995) p. 47.Google Scholar
18.Siergiej, R., Clarke, R., Agarwal, A., Brandt, C., Burk, A., Morse, A., and Orphanos, P., “High Power 4H-SiC Static Induction Transistors,” IEEE IEDM Digest (1995) p. 353.Google Scholar
19.A First for Silicon Carbide,” Compound Semicond. (July/August 1996) p. 4.Google Scholar
20.Khatibzadeh, M.A. and Trew, R.J., “A Large-Signal, Analytic Model for the GaAs MESFET,” IEEE Trans. Microwave Theory and Tech. (Special CAD Issue), 36 (1988) p. 231.CrossRefGoogle Scholar