Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2024-12-28T21:00:37.926Z Has data issue: false hasContentIssue false
  • English
  • Français

Organic Materials for Photonic Devices

Published online by Cambridge University Press:  31 January 2011

Thomas Fuhrmann  and
Josef Salbeck
Get access

Abstract

Current issues in the development of organic materials for photonic applications are reviewed. Organic light-emitting diodes, which are a main focus of industrial research at the moment, are given special emphasis. Other applications in optical communications technology, including organic solid-state lasers, optical switching devices, and data storage, are also covered.

Keywords

molecular materialsoptical communicationsorganic light-emitting diodes (OLEDs)photochromicsphotonic materialsstimulated emission
Type
Research Article
Information
MRS Bulletin , Volume 28 , Issue 5: Photonic Materials for Optical Communications , May 2003 , pp. 354 - 359
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Rees, I.D., Robinson, K.L., Holmes, A.B., Towns, C.R., and O'Dell, R., MRS Bull. 27 (2002) p. 451.CrossRefGoogle Scholar
2.Haskal, E.I., Buechel, M., Duineveld, P.C., Sempel, A., and van de Weijer, P., MRS Bull. 27 (2002) p. 864.CrossRefGoogle Scholar
3.Ma, H., Jen, A.K.Y., and Dalton, L.R., Adv. Mater. 14 (2002) p. 1339.3.0.CO;2-O>CrossRefGoogle Scholar
4.Wirth, H.O., Angew. Makromol. Chem. 185/186 (1991) p. 329.CrossRefGoogle Scholar
5.Naito, K. and Miura, A., J. Phys. Chem. 97 (1993) p. 6240.CrossRefGoogle Scholar
6.Smith, P.F., Gerroir, P., Xie, S., Hor, A.M., Popovic, Z., and Hair, M.L., Langmuir 14 (1998) p. 5946.CrossRefGoogle Scholar
7.Fuhrmann, T. and Salbeck, J., in Advances in Photochemistry, Vol. 27, edited by Neckers, D.C., von Bünau, G., and Jenks, W.S. (John Wiley & Sons, Hoboken, 2002) p. 83.Google Scholar
8.Grazulevicius, J.V. and Strohriegl, P., in Handbook of Advanced Electronic and Photonic Materials, Vol. 10, edited by Nalwa, H.S. (Academic Press, San Diego, 2000) p. 233.Google Scholar
9.Ostrowski, J.C., Robinson, M.R., Heeger, A.J., and Bazan, G.C., Chem. Commun. (2002) p. 784.CrossRefGoogle Scholar
10.Noda, T., Ogawa, H., Noma, N., and Shirota, Y., Adv. Mater. 9 (1997) p. 720.CrossRefGoogle Scholar
11.Shirota, Y., J. Mater. Chem. 10 (2000) p. 1.CrossRefGoogle Scholar
12.Sakamoto, Y., Suzuki, T., Miura, A., Fujikawa, H., Tokito, S., and Taga, Y., J. Am. Chem. Soc. 122 (2000) p. 1832.CrossRefGoogle Scholar
13.Wang, S., Oldham, W.J. Jr, Hudack, R.A. Jr, and Bazan, G.C., J. Am. Chem. Soc. 122 (2000) p. 5695.CrossRefGoogle Scholar
14.Braun, D., Keller, C.-C., Roth, M.D., Schartel, B., Voigt, M., and Wendorff, J.H., J. Prakt. Chem. 339 (1997) p. 708.CrossRefGoogle Scholar
15.Weinfurtner, K.-J., Weissörtel, F., Harmgarth, G., and Salbeck, J., in Proc. SPIE, Vol. 3476 (SPIE—The International Society for Optical Engineering, Bellingham, WA, 1998) p. 40.Google Scholar
16.Murata, H., Merritt, C.D., Matoussi, H., and Kafafi, Z.H., in Proc. SPIE, Vol. 3476 (SPIE—The International Society for Optical Engineering, Bellingham, WA, 1998) p. 88.Google Scholar
17.Hamada, Y., Kanno, H., Tsujioka, T., and Takahashi, H., Appl. Phys. Lett. 75 (1999) p. 1682.CrossRefGoogle Scholar
18.Thomas, K.R.J., Lin, J.T., Tao, Y.T., and Chuen, C.H., Adv. Mater. 14 (2002) p. 822.3.0.CO;2-S>CrossRefGoogle Scholar
19.Wu, W.C., Yeh, H.C., Chan, L.H., and Chen, C.T., Adv. Mater. 14 (2002) p. 1072.3.0.CO;2-Z>CrossRefGoogle Scholar
20.Tamura, S., in Proc. 11th Int. Workshop on Inorganic and Organic Electroluminescence and 2002 Int. Conf. on the Science and Technology of Emissive Displays and Lighting, edited by Neyts, K., DeVisschere, P., and Poelman, D. (Academia Press, Ghent, Belgium, 2002) p. 321.Google Scholar
21.Gillin, W.P. and Curry, R.J., Appl. Phys. Lett. 74 (1999) p. 798.CrossRefGoogle Scholar
22.Suzuki, H., Appl. Phys. Lett. 76 (2000) p. 1543.CrossRefGoogle Scholar
23.Sloof, L.H., Polman, A., Cacialli, F., Friend, R.H., Hebbink, G.A., van Veggel, F.C.J.M., and Reinhoudt, D.N., Appl. Phys. Lett. 78 (2001) p. 2122.CrossRefGoogle Scholar
24.Hide, F., Diaz-Garcia, M.A., Schwartz, B.J., Andersson, M.R., Pei, Q.B., and Heeger, A.J., Science 273 (1996) p. 1833.CrossRefGoogle Scholar
25.McGehee, M.D., Gupta, R., Veenstra, S., Miller, E.K., Diaz-Garcia, M.A., and Heeger, A.J., Phys. Rev. B 58 (1998) p. 7035.CrossRefGoogle Scholar
26.Johansson, N., Salbeck, J., Bauer, J., Weissörtel, F., Broems, P., Andersson, A., and Salaneck, W.R., Adv. Mater. 10 (1998) p. 1136.3.0.CO;2-V>CrossRefGoogle Scholar
27.Holzer, W., Penzkofer, A., and Hörhold, H.H., Synth. Met. 113 (2000) p. 281.CrossRefGoogle Scholar
28.Anni, M., Gigli, G., Cingolani, R., Zavelani-Rossi, M., Gadermaier, C., Lanzani, G., Barbarella, G., and Favaretto, L., Appl. Phys. Lett. 78 (2001) p. 2679.CrossRefGoogle Scholar
29.Salbeck, J., Schörner, M., and Fuhrmann, T., Thin Solid Films 417 (2002) p. 20.CrossRefGoogle Scholar
30.Kozlov, V.G., Bulovic, V., Burrows, P.E., and Forrest, S.R., Nature 389 (1997) p. 362.CrossRefGoogle Scholar
31.Kogelnik, H. and Shank, C.V., Appl. Phys. Lett. 18 (1971) p. 152.CrossRefGoogle Scholar
32.Berggren, M., Dodabalapur, A., Slusher, R.E., Timko, A., and Nalamasu, O., Appl. Phys. Lett. 72 (1998) p. 410.CrossRefGoogle Scholar
33.Riechel, S., Lemmer, U., Benstem, T., Kowalsky, W., Scherf, U., Gombert, A., and Wittwer, V., Appl. Phys. B 71 (2000) p. 897.CrossRefGoogle Scholar
34.McGehee, M.D., Diaz-Garcia, M.A., Hide, F., Gupta, R., Miller, E.K., Moses, D., and Heeger, A.J., Appl. Phys. Lett. 72 (1998) p. 1536.CrossRefGoogle Scholar
35.Kallinger, C., Hilmer, M., Haugeneder, A., Perner, M., Spirkl, W., Lemmer, U., Feldmann, J., Scherf, U., Müllen, K., Gombert, A., and Wittwer, V., Adv. Mater. 10 (1998) p. 920.3.0.CO;2-7>CrossRefGoogle Scholar
36.Meier, M., Mekis, A., Dodabalapur, A., Timko, A., Slusher, R.E., Joannopoulos, J.D., and Nalamasu, O., Appl. Phys. Lett. 74 (1999) p. 7.CrossRefGoogle Scholar
37.Bauer, C., Giessen, H., Schnabel, B., Kley, E.B., Schmitt, C., Scherf, U., and Mahrt, R.F., Adv. Mater. 13 (2001) p. 1161.3.0.CO;2-9>CrossRefGoogle Scholar
38.Nakayama, T., Itoh, Y., and Kakuta, A., Appl. Phys. Lett. 63 (1993) p. 594.CrossRefGoogle Scholar
39.Tsutsui, T., Takada, N., Saito, S., and Ogino, E., Appl. Phys. Lett. 65 (1994) p. 1868.CrossRefGoogle Scholar
40.Tokito, S., Noda, K., and Taga, Y., Appl. Phys. Lett. 68 (1996) p. 2633.CrossRefGoogle Scholar
41.Kozlov, V.G., Bulovic, V., Burrows, P.E., Baldo, M., Khalfin, V.B., Parthasarathy, G., Forrest, S.R., You, Y., and Thompson, M.E., J. Appl. Phys. 84 (1998) p. 4096.CrossRefGoogle Scholar
42.Tessler, N., Denton, G.J., and Friend, R.H., Nature 382 (1996) p. 695.CrossRefGoogle Scholar
43.Berggren, M., Dodabalapur, A., Slusher, R.E., and Bao, Z., Synth. Met. 91 (1997) p. 65.CrossRefGoogle Scholar
44.Tang, C.W. and Van Slyke, S.A., Appl. Phys. Lett. 51 (1987) p. 913.CrossRefGoogle Scholar
45.Adachi, C., Tsutsui, T., and Saito, S., Appl. Phys. Lett. 55 (1989) p. 1489.CrossRefGoogle Scholar
46.Murata, H., Merritt, C.D., and Kafafi, Z.H., IEEE J. Sel. Top. Quantum Electron. 4 (1998) p. 119.CrossRefGoogle Scholar
47.Anderson, J.D., McDonald, E.M., Lee, P.A., Anderson, M.L., Ritchie, E.L., Hall, H.K., Hopkins, T., Mash, E.A., Wang, J., Padias, A., Thayumanavan, S., Barlow, S., Marder, S.R., Jabbour, G.E., Shaheen, S., Kippelen, B., Peyghambarian, N., Wightman, R.M., and Armstrong, N.R., J. Am. Chem. Soc. 120 (37) (1998) p. 9646.CrossRefGoogle Scholar
48.Salaneck, W.R. and Bredas, J.R., Adv. Mater. 8 (1996) p. 48.CrossRefGoogle Scholar
49.Hung, L.S., Tang, C.W., and Mason, M.G., Appl. Phys. Lett. 71 (1997) p. 1762.CrossRefGoogle Scholar
50.Jabbour, G.E., Kawabe, Y., Shaheen, S.E., Wang, J.F., Morrell, M.M., Kippelen, B., and Peyghambarian, N., Appl. Phys. Lett. 71 (13) (1997) p. 1762.CrossRefGoogle Scholar
51.Krasnov, A.N., Wood, R.P., Johnson, D.J., and Kim, W.Y., in Proc. 11th Int. Workshop on Inorganic and Organic Electroluminescence and 2002 Int. Conf. on the Science and Technology of Emissive Displays and Lighting, edited by Neyts, K., DeVisschere, P., and Poelman, D. (Academia Press, Ghent, Belgium, 2002) p. 549.Google Scholar
52.Van Slyke, S.A., Chen, C.H., and Tang, C.W., Appl. Phys. Lett. 69 (1996) p. 2160.CrossRefGoogle Scholar
53.Carter, S.A. and Angelopoulos, M., Appl. Phys. Lett. 70 (1997) p. 2067.CrossRefGoogle Scholar
54.Zhou, X., Blochwitz, J., Pfeiffer, M., Nollau, A., Fritz, T., and Leo, K., Adv. Funct. Mater. 11 (2001) p. 310.3.0.CO;2-D>CrossRefGoogle Scholar
55.Kido, J., Hayase, H., Hongawa, K., Nagai, K., and Okuyama, K., Appl. Phys. Lett. 65 (1994) p. 2124.CrossRefGoogle Scholar
56.Sano, T., Fujita, M., Fujii, T., Hamada, Y., Shibata, K., and Kuroki, K., Jpn. J. Appl. Phys., Part 1 34 (1995) p. 1883.CrossRefGoogle Scholar
57.Baldo, M.A., O'Brien, D.F., You, Y., Shoustikov, A., Sibley, S., Thompson, M.E., and Forrest, S.R., Nature 395 (1998) p. 151.CrossRefGoogle Scholar
58.Baldo, M.A., Lamansky, S., Burrows, P.E., Thompson, M.E., and Forrest, S.R., Appl. Phys. Lett. 75 (1999) p. 4.CrossRefGoogle Scholar
59.Steuber, F., Staudigel, J., Stössel, M., Simmerer, J., Winnacker, A., Spreitzer, H., Weissörtel, F., and Salbeck, J., Adv. Mater. 12 (2000) p. 130.3.0.CO;2-P>CrossRefGoogle Scholar
60.Kido, J., Kimura, M., and Nagai, K., Science 267 (1995) p. 1332.CrossRefGoogle Scholar
61.Shen, Z., Burrows, P.E., Bulovic, V., Forrest, S.R., and Thompson, M.E., Science 276 (1997) p. 2009.CrossRefGoogle Scholar
62.Hosokawa, C., Matsuura, M., Eida, M., Fukuoka, K., Nakamura, N., and Kusumoto, T., J. SID 5 (1997) p. 331.Google Scholar
63.Yamasaki, T., Sumioka, K., and Tsutsui, T., Appl. Phys. Lett. 76 (2000) p. 1243.CrossRefGoogle Scholar
64.Madigan, C.F., Lu, M.-H., and Sturm, J.C., Appl. Phys. Lett. 76 (13) (2000) p. 1650.CrossRefGoogle Scholar
65.Lupton, J.M., Matterson, B.J., Samuel, I.D.W., Jory, M.J., and Barnes, W.L., Appl. Phys. Lett. 77 (2000) p. 3340.CrossRefGoogle Scholar
66.Tsutsui, T., Yahiro, M., Yokogawa, H., Kawano, K., and Yokoyama, M., Adv. Mater. 13 (2001) p. 1149.3.0.CO;2-2>CrossRefGoogle Scholar
67. For example, by manufacturers such as Kodak/Sanyo, NEC/Samsung, eMagin, Sony, Toshiba, Philips, Ritek, and Chi Mei/IBM.Google Scholar
68.Kawai, T., Fukuda, N., Groeschl, D., Kobatake, S., and Irie, M., Jpn. J. Appl. Phys., Part 2: Lett. 38 (1999) p. L1194.CrossRefGoogle Scholar
69.Utsumi, H., Nagahama, D., Nakano, H., and Shirota, Y., J. Mater. Chem. 10 (2000) p. 2436.CrossRefGoogle Scholar
70.Eich, M., Wendorff, J.H., Reck, B., and Ringsdorf, H., Makromol. Chem., Rapid Commun. 8 (1987) p. 59.CrossRefGoogle Scholar
71.Natansohn, A., Rochon, P., Gosselin, J., and Xie, S., Macromolecules 25 (1992) p. 2268.CrossRefGoogle Scholar
72.Fuhrmann, T., Kunze, M., and Wendorff, J.H., Macromol. Theory Simul. 7 (1998) p. 421.Google Scholar
73.Rochon, P., Batalla, E., and Natansohn, A., Appl. Phys. Lett. 66 (1995) p. 136.CrossRefGoogle Scholar
74.Kim, D.Y., Li, L., Kumar, J., and Tripathy, S.K., Appl. Phys. Lett. 66 (1995) p. 1166.CrossRefGoogle Scholar
75.Fuhrmann, T. and Tsutsui, T., Chem. Mater. 11 (1999) p. 2226.CrossRefGoogle Scholar
76.Perschke, A. and Fuhrmann, T., Adv. Mater. 14 (2002) p. 841.3.0.CO;2-O>CrossRefGoogle Scholar
77.Meerholz, K., Angew. Chem. 109 (1997) p. 981.CrossRefGoogle Scholar
78.Lundquist, P.M., Wortmann, R., Geletneky, C., Twieg, R.J., Jurich, M., Lee, V.Y., Moylan, C.R., and Burland, D.M., Science 274 (1996) p. 1182.CrossRefGoogle Scholar
79.Zhang, Y., Wada, T., and Sasabe, H., J. Mater. Chem. 8 (1998) p. 797.Google Scholar
80.Würthner, F., Yao, S., Schilling, J., Wortmann, R., Redi-Abshiro, M., Mecher, E., Gallego-Gomez, F., and Meerholz, K., J. Am. Chem. Soc. 123 (2001) p. 2810.CrossRefGoogle Scholar
81.Wang, L., Ng, M.K., and Yu, L., Appl. Phys. Lett. 78 (2001) p. 700.CrossRefGoogle Scholar