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Nanomaterials under stress: A new opportunity for nanomaterials synthesis and engineering

Published online by Cambridge University Press:  09 November 2015

Feng Bai
Affiliation:
Henan University, China; [email protected]
Kaifu Bian
Affiliation:
Sandia National Laboratories, USA; [email protected]
Binsong Li
Affiliation:
Sandia National Laboratories, USA; [email protected]
Huimeng Wu
Affiliation:
Olympus Scientific Solution Americas, USA; [email protected]
Leanne J. Alarid
Affiliation:
Sandia National Laboratories, USA; [email protected]
Hattie C. Schunk
Affiliation:
Sandia National Laboratories, USA; [email protected]
Paul G. Clem
Affiliation:
Sandia National Laboratories, USA; [email protected]
Hongyou Fan
Affiliation:
Sandia National Laboratories and The University of New Mexico, USA; [email protected]
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Abstract

Precise control of structural parameters through nanoscale engineering to continuously tailor optical and electronic properties of functional nanomaterials remains an outstanding challenge. Previous work focused largely on chemical or physical interactions that occur under ambient pressures. In this article, we introduce a new pressure-directed assembly and fabrication method that uses a mechanical compressive force applied to nanoparticles (NPs) to induce structural phase transitions and consolidate new nanomaterials with precisely controlled structures and tunable properties. By manipulating NP coupling through external pressure instead of through chemistry, a reversible change in assembly structure and properties can be demonstrated. In addition, over a certain threshold, the external pressure forces these NPs into contact, allowing the formation and consolidation of one- to three-dimensional nanostructures. Through stress-induced NP assembly, unusual materials engineering and synthesis, in which morphology and architecture can be readily tuned to produce desired optical and electrical properties, appear feasible.

Type
Research Article
Copyright
Copyright © Materials Research Society 2015 

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References

DeVries, G.A., Brunnbauer, M., Hu, Y., Jackson, A.M., Long, B., Neltner, B.T., Uzun, O., Wunsch, B.H., Stellacci, F., Science 315, 358 (2007).CrossRefGoogle Scholar
Sun, S.H., Murray, C.B., Weller, D., Folks, L., Moser, A., Science 287, 1989 (2000).CrossRefGoogle Scholar
Murray, C.B., Kagan, C.R., Bawendi, M.G., Science 270, 1335 (1995).CrossRefGoogle Scholar
Park, S.Y., Lytton-Jean, A.K.R., Lee, B., Weigand, S., Schatz, G.C., Mirkin, C.A., Nature 451, 553 (2008).CrossRefGoogle Scholar
Fan, H., Yang, K., Boye, D.M., Sigmon, T., Malloy, K.J., Xu, H., Lopez, G.P., Brinker, C.J., Science 304, 567 (2004).CrossRefGoogle Scholar
Alivisatos, A.P., Science 271, 933 (1996).CrossRefGoogle Scholar
Zeng, H., Li, J., Liu, J.P., Wang, Z.L., Sun, S., Nature 420, 395 (2002).CrossRefGoogle Scholar
Collier, C.P., Saykally, R.J., Shiang, J.J., Henrichs, S.E., Heath, J.R., Science 277, 1978 (1997).CrossRefGoogle Scholar
Tang, Z., Kotov, N.A., Giersig, M., Science 297, 237 (2002).CrossRefGoogle Scholar
Sung, K.-M., Mosley, D.W., Peelle, B.R., Zhang, S., Jacobson, J.M., J. Am. Chem. Soc. 126, 5064 (2004).CrossRefGoogle Scholar
Worden, J.G., Shaffer, A.W., Huo, Q., Chem. Commun. 5, 518 (2004) doi: 10.1039/B312819A.CrossRefGoogle Scholar
Yan, H., Park, S.H., Finkelstein, G., Reif, J.H., LaBean, T.H., Science 301, 1882 (2003).CrossRefGoogle Scholar
Sharma, J., Chhabra, R., Cheng, A., Brownell, J., Liu, Y., Yan, H., Science 323, 112 (2009).CrossRefGoogle Scholar
Wang, H., Brandl, D.W., Nordlander, P., Halas, N.J., Acc. Chem. Res. 40, 53 (2007).CrossRefGoogle Scholar
Ozbay, E., Science 311, 189 (2006).CrossRefGoogle Scholar
Lin, M.-H., Chen, H.-Y., Gwo, S., J. Am. Chem. Soc. 132, 11259 (2010).CrossRefGoogle Scholar
Choi, C.L., Alivisatos, A.P., Annu. Rev. Phys. Chem. 61, 369 (2010).CrossRefGoogle Scholar
Valentine, J., Zhang, S., Zentgraf, T., Ulin-Avila, E., Genov, D.A., Bartal, G., Zhang, X., Nature 455, 376 (2008).CrossRefGoogle Scholar
Liu, N., Guo, H., Fu, L., Kaiser, S., Schweizer, H., Giessen, H., Nat. Mater. 7, 31 (2008).CrossRefGoogle Scholar
Atwater, H.A., Polman, A., Nat. Mater. 9, 205 (2010).CrossRefGoogle Scholar
Verellen, N., Sonnefraud, Y., Sobhani, H., Hao, F., Moshchalkov, V.V., Dorpe, P.V., Nordlander, P., Maier, S.A., Nano Lett. 9, 1663 (2009).CrossRefGoogle Scholar
Jain, P.K., El-Sayed, M.A., J. Phys. Chem. C 112, 4954 (2008).CrossRefGoogle Scholar
Hu, M., Chen, J., Li, Z.Y., Au, L., Hartland, G.V., Li, X., Marquez, M., Xia, Y., Chem. Soc. Rev. 35 (11), 1084 (2006).CrossRefGoogle Scholar
Burda, C., Chen, X., Narayanan, R., El-Sayed, M.A., Chem. Rev. 105, 1025 (2005).CrossRefGoogle Scholar
Fan, H., Chen, Z., Brinker, C.J., Clawson, J., Alam, T., J. Am. Chem. Soc. 127, 13746 (2005).CrossRefGoogle Scholar
Fan, H., Leve, E., Gabaldon, J., Wright, A., Haddad, R., Brinker, C., Adv. Mater. 17, 2587 (2005).CrossRefGoogle Scholar
Fan, H., Lopez, G.P., Langmuir 13, 119 (1997).CrossRefGoogle Scholar
Fan, H., Wright, A., Gabaldon, J., Rodriguez, A., Brinker, C., Jiang, Y.B., Adv. Funct. Mater. 16, 891 (2006).CrossRefGoogle Scholar
Fan, H.Y., Gabaldon, J., Brinker, C.J., Jiang, Y.B., Chem. Commun. 22, 2323 (2006).CrossRefGoogle Scholar
Dunphy, D., Fan, H., Li, X., Wang, J., Brinker, C.J., Langmuir 24, 10575 (2008).CrossRefGoogle Scholar
Wright, A., Gabaldon, J., Burckel, D.B., Jiang, Y.-B., Tian, Z.R., Liu, J., Brinker, C.J., Fan, H., Chem. Mater. 18, 3034 (2006).CrossRefGoogle Scholar
Tao, A., Sinsermsuksakul, P., Yang, P., Nat. Nanotechnol. 2, 435 (2007).CrossRefGoogle Scholar
Heath, J.R., Knobler, C.M., Leff, D.V., J. Phys. Chem. B 101, 189 (1997).CrossRefGoogle Scholar
Jain, P.K., Huang, W., El-Sayed, M.A., Nano Lett. 7, 2080 (2007).CrossRefGoogle Scholar
Wu, H., Wang, Z., Fan, H., J. Am. Chem. Soc. 136, 7634 (2014).CrossRefGoogle Scholar
Wu, H., Bai, F., Sun, Z., Haddad, R.E., Boye, D.M., Wang, Z., Huang, J.Y., Fan, H., J. Am. Chem. Soc. 132, 12826 (2010).CrossRefGoogle Scholar
Wu, H., Bai, F., Sun, Z., Haddad, R.E., Boye, D.M., Wang, Z., Fan, H., Angew. Chem. Int. Ed. 122, 8609 (2010).CrossRefGoogle Scholar
Li, W., Fan, H., Li, J., Nano Lett. 14, 4951 (2014).CrossRefGoogle Scholar
Li, B., Wen, X., Li, R., Wang, Z., Clem, P.G., Fan, H., Nat. Commun. 5, 4179 (2014) doi: 10.1038/ncomms5179.CrossRefGoogle Scholar
Wang, Z., Schliehe, C., Wang, T., Nagaoka, Y., Cao, Y.C., Bassett, W.A., Wu, H., Fan, H., Weller, H., J. Am. Chem. Soc. 133, 14484 (2011).CrossRefGoogle Scholar
Mao, H.K., Bell, P.M., Science 200 1145 (1978).CrossRefGoogle Scholar
Jacobs, K., Alivisatos, A.P., Rev. Mineral. Geochem. 44, 59 (2001).CrossRefGoogle Scholar
Tolbert, S., Alivisatos, A.P., Annu. Rev. Phys. Chem. 46, 595 (1995).CrossRefGoogle Scholar
Grünwald, M., Lutker, K., Alivisatos, A.P., Rabani, E., Geissler, P.L., Nano Lett. 13, 1367 (2013).CrossRefGoogle Scholar
Zheng, N., Fan, J., Stucky, G.D., J. Am. Chem. Soc. 128, 6550 (2006).CrossRefGoogle Scholar
Beckman, R., Johnston-Halperin, E., Luo, Y., Green, J.E., Heath, J.R., Science 310, 465 (2005).CrossRefGoogle Scholar
Huo, Z., Tsung, C.-K., Huang, W., Zhang, X., Yang, P., Nano Lett. 8, 2041 (2008).CrossRefGoogle Scholar
Lu, X., Yavuz, M.S., Tuan, H.-Y., Korgel, B.A., Xia, Y., J. Am. Chem. Soc. 130, 8900 (2008).CrossRefGoogle Scholar
Wang, C., Hu, Y., Lieber, C.M., Sun, S., J. Am. Chem. Soc. 130, 8902 (2008).CrossRefGoogle Scholar
Worden, J.G., Dai, Q., Huo, Q., Chem. Commun. 14, 1536 (2006) doi: 10.1039/B600641H.CrossRefGoogle Scholar
Lu, Y., Liu, G.L., Lee, L.P., Nano Lett. 5, 5 (2004).CrossRefGoogle Scholar
Xia, Y., Xiong, Y., Lim, B., Skrabalak, S.E., Angew. Chem. Int. Ed. 48, 60 (2009).CrossRefGoogle Scholar
Sun, S., Adv. Mater. 18, 393 (2006).CrossRefGoogle Scholar
Quake, S.R., Scherer, A., Science 290, 1536 (2000).CrossRefGoogle Scholar