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Imaging, Manipulation, and Spectroscopic Measurements of Nanomagnets by Magnetic Force Microscopy

Published online by Cambridge University Press:  31 January 2011

Xiaobin Zhu  and
Peter Grütter
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Abstract

Magnetic force microscopy (MFM) is a well-established technique for imaging the magnetic structures of small magnetic particles. In cooperation with external magnetic fields, MFM can be used to study the magnetization switching mechanism of submicrometer-sized magnetic particles. Various MFM techniques allow the measurement of a hysteresis curve of an individual particle, which can then be compared to ensemble measurements. The advantage of using MFM-constructed hysteresis loops is that one can in principle understand the origin of dispersion in switching fields. It is also possible to directly observe the correlation between magnetic particles through careful imaging and control of the external magnetic field. In all of these measurements, attention needs to be paid to avoid artifacts that result from the unavoidable magnetic tip stray field. Control can be achieved by optimizing the MFM operation mode as well as the tip parameters. It is even possible to use the tip stray field to locally and reproducibly manipulate the magnetic-moment state of small particles. In this article, we illustrate these concepts and issues by studying various lithographically patterned magnetic nanoparticles, thus demonstrating the versatility of MFM for imaging, manipulation, and spectroscopic measurements of small particles.

Keywords

magnetic force microscopynanomagnetsscanning probe microscopy.
Type
Research Article
Information
MRS Bulletin , Volume 29 , Issue 7: Scanning Probe Microscopy in Materials Science , July 2004 , pp. 457 - 462
Copyright
Copyright © Materials Research Society 2004

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