Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Wendt, U.
and
Nolze, Gert
2007.
FIB Milling and Canneling.
Imaging & Microscopy,
Vol. 9,
Issue. 3,
p.
34.
MoberlyChan, Warren John
and
Schalek, Richard
2007.
Ion Beam Induced Surface Modulations from Nano to Pico: Optimizing Deposition During Erosion and Erosion During Deposition.
MRS Proceedings,
Vol. 1059,
Issue. ,
Weis, C. D.
Schuh, A.
Batra, A.
Persaud, A.
Rangelow, I. W.
Bokor, J.
Lo, C. C.
Cabrini, S.
Sideras-Haddad, E.
Fuchs, G. D.
Hanson, R.
Awschalom, D. D.
and
Schenkel, T.
2008.
Single atom doping for quantum device development in diamond and silicon.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Vol. 26,
Issue. 6,
p.
2596.
Greer, Julia R.
Espinosa, Horacio
Ramesh, K. T.
and
Nadgorny, Edward
2008.
Comment on “Effects of focused ion beam milling on the nanomechanical behavior of a molybdenum-alloy single crystal” Appl. Phys. Lett. 91, 111915 (2007).
Applied Physics Letters,
Vol. 92,
Issue. 9,
Gnaser, Hubert
Reuscher, Bernhard
and
Brodyanski, Alexander
2008.
Focused ion beam implantation of Ga in nanocrystalline diamond: Fluence-dependent retention and sputtering.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,
Vol. 266,
Issue. 8,
p.
1666.
Gnaser, Hubert
Brodyanski, Alexander
and
Reuscher, Bernhard
2008.
Focused ion beam implantation of Ga in Si and Ge: fluence‐dependent retention and surface morphology.
Surface and Interface Analysis,
Vol. 40,
Issue. 11,
p.
1415.
Utke, Ivo
Hoffmann, Patrik
and
Melngailis, John
2008.
Gas-assisted focused electron beam and ion beam processing and fabrication.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Vol. 26,
Issue. 4,
p.
1197.
Patterson, N
Adams, D P
Hodges, V C
Vasile, M J
Michael, J R
and
Kotula, P G
2008.
Controlled fabrication of nanopores using a direct focused ion beam approach with back face particle detection.
Nanotechnology,
Vol. 19,
Issue. 23,
p.
235304.
Matovic, J.
Kettle, J.
Brousseau, E.
and
Adamovic, N.
2008.
Patterning of nanomembranes with a focused-ion-beam.
p.
103.
Bernardi, M.
Sgarlata, A.
Fanfoni, M.
Persichetti, L.
Motta, N.
and
Balzarotti, A.
2009.
Self-assembly of Ge quantum dots on Silicon: An example of controlled nanomanufacturing.
Superlattices and Microstructures,
Vol. 46,
Issue. 1-2,
p.
318.
Stark, Yuliya
Frömter, Robert
Stickler, Daniel
and
Oepen, Hans Peter
2009.
Sputter yields of single- and polycrystalline metals for application in focused ion beam technology.
Journal of Applied Physics,
Vol. 105,
Issue. 1,
Sosa, Norma E.
Liu, Jun
Chen, Christopher
Marks, Tobin J.
and
Hersam, Mark C.
2009.
Nanoscale Writing of Transparent Conducting Oxide Features with a Focused Ion Beam.
Advanced Materials,
Vol. 21,
Issue. 6,
p.
721.
Norris, Scott A
Brenner, Michael P
and
Aziz, Michael J
2009.
From crater functions to partial differential equations: a new approach to ion bombardment induced nonequilibrium pattern formation.
Journal of Physics: Condensed Matter,
Vol. 21,
Issue. 22,
p.
224017.
MoberlyChan, Warren J
2009.
Dual-beam focused ion beam/electron microscopy processing and metrology of redeposition during ion–surface 3D interactions, from micromachining to self-organized picostructures.
Journal of Physics: Condensed Matter,
Vol. 21,
Issue. 22,
p.
224013.
Čechal, Jan
Tomanec, Ondřej
Škoda, David
Koňáková, Kateřina
Hrnčíř, Tomáš
Mach, Jindřich
Kolíbal, Miroslav
and
Šikola, Tomáš
2009.
Selective growth of Co islands on ion beam induced nucleation centers in a native SiO2 film.
Journal of Applied Physics,
Vol. 105,
Issue. 8,
Ran, Guang
Zhang, Jiaming
Wei, Qiangmin
Xi, Shengqi
Zu, Xiaotao
and
Wang, Lumin
2009.
The effects of carbon coating on nanoripples induced by focused ion beam.
Applied Physics Letters,
Vol. 94,
Issue. 7,
Liu, W.
Ramirez, H.
Schauer, S.
and
Theodore, N. D.
2009.
Scanning Auger of a specific via interface in an integrated circuit using a novel focused ion beam sample preparation technique.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films,
Vol. 27,
Issue. 4,
p.
738.
Imre, Alexandra
Ocola, Leonidas E.
Rich, Lauren
and
Klingfus, Joseph
2010.
Large area direct-write focused ion-beam lithography with a dual-beam microscope.
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,
Vol. 28,
Issue. 2,
p.
304.
Singh, D.R.P.
Chawla, N.
and
Shen, Y.-L.
2010.
Focused Ion Beam (FIB) tomography of nanoindentation damage in nanoscale metal/ceramic multilayers.
Materials Characterization,
Vol. 61,
Issue. 4,
p.
481.
Jeon, Jangbae
Floresca, Herman Carlo
and
Kim, M. J.
2010.
Fabrication of complex three-dimensional nanostructures using focused ion beam and nanomanipulation.
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,
Vol. 28,
Issue. 3,
p.
549.