Characterization of Semiconductor Materials (Principles and Methods, Volume 1) Edited by Gary E. McGuire (Noyes Publications, 1989), approximately 328 pages. ISBN: 0-8155-1200-7

Ronald E. Pyle

doi:10.1017/S0883769400062515

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Characterization of Semiconductor Materials (Principles and Methods, Volume 1) Edited by Gary E. McGuire (Noyes Publications, 1989), approximately 328 pages. ISBN: 0-8155-1200-7

Published online by Cambridge University Press: 29 November 2013

Ronald E. Pyle

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Type: Departments
Information: MRS Bulletin , Volume 15 , Issue 9 , September 1990 , pp. 71 - 72

DOI: https://doi.org/10.1017/S0883769400062515 [Opens in a new window]
Copyright: Copyright © Materials Research Society 1990

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Characterization of Semiconductor Materials (Principles and Methods, Volume 1) Edited by Gary E. McGuire (Noyes Publications, 1989), approximately 328 pages. ISBN: 0-8155-1200-7

Volume 15, Issue 9
Ronald E. Pyle
DOI: https://doi.org/10.1017/S0883769400062515

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Article contents

Characterization of Semiconductor Materials (Principles and Methods, Volume 1) Edited by Gary E. McGuire (Noyes Publications, 1989), approximately 328 pages. ISBN: 0-8155-1200-7

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