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Analytical electron tomography

Published online by Cambridge University Press:  07 July 2016

Rowan K. Leary  and
Paul A. Midgley
Rowan K. Leary
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, UK; [email protected]
Paul A. Midgley
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, UK; [email protected]
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Abstract

This article highlights recent advances in analytical electron tomography (AET), the three-dimensional (3D) extension of conventional nanoanalytical techniques, in which electron energy loss, x-ray spectroscopy, and electron diffraction are combined with tomographic acquisition and reconstruction. Examples from the literature illustrate how new 3D information, gleaned from AET, provides insights into not just morphology and composition, but also the electronic, chemical, and optical properties of materials at the nanoscale. We describe how the “multidimensional” nature of AET leads to “big data” sets, how these can be analyzed optimally, and how AET may develop further.

Keywords

scanning transmission electron microscopy (STEM)nanoscaleelectron energy-loss spectroscopy (EELS)x-ray tomographycrystallographic structure
Type
Research Article
Information
MRS Bulletin , Volume 41 , Issue 7: Advanced Tomography Techniques for Materials Applications , July 2016 , pp. 531 - 536
Copyright
Copyright © Materials Research Society 2016 

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References

Leary, R., Midgley, P.A., Thomas, J.M., Acc. Chem. Res. 45, 1782 (2012).CrossRefGoogle Scholar
Midgley, P.A., Dunin-Borkowski, R.E., Nat. Mater. 8, 271 (2009).Google Scholar
Ercius, P., Alaidi, O., Rames, M.J., Ren, G., Adv. Mater. 27, 5638 (2015).Google Scholar
Ersen, O., Florea, I., Hirlimann, C., Pham-Huu, C., Mater. Today 18, 395 (2015).Google Scholar
Wolf, D., Lubk, A., Röder, F., Lichte, H., Curr. Opin. Solid State Mater. Sci. 17, 126 (2013).Google Scholar
Jin-Phillipp, N.Y., Koch, C.T., van Aken, P.A., Ultramicroscopy 111, 1255 (2011).Google Scholar
Möbus, G., Inkson, B.J., Appl. Phys. Lett. 79, 1369 (2001).Google Scholar
Weyland, M., Midgley, P.A., Inst. Phys. Conf. Ser. (EMAG 2001) 161, 239 (2001).Google Scholar
Jarausch, K., Thomas, P., Leonard, D.N., Twesten, R., Booth, C.R., Ultramicroscopy 109, 326 (2009).Google Scholar
Yurtsever, A., Weyland, M., Muller, D.A., Appl. Phys. Lett. 89, 151920 (2006).Google Scholar
Goris, B., Turner, S., Bals, S., Van Tendeloo, G., ACS Nano 8, 10878 (2014).Google Scholar
Egerton, R.F., Electron Energy-Loss Spectroscopy in the Electron Microscope (Springer, New York, 2011).Google Scholar
Scott, J., Thomas, P.J., MacKenzie, M., McFadzean, S., Wilbrink, J., Craven, A.J., Nicholson, W.A.P., Ultramicroscopy 108, 1586 (2008).Google Scholar
Möbus, G., Doole, R.C., Inkson, B.J., Ultramicroscopy 96, 433 (2003).Google Scholar
Saghi, Z., Xu, X., Peng, Y., Inkson, B., Mobus, G., Appl. Phys. Lett. 91, 251906 (2007).Google Scholar
Slater, T.J.A., Macedo, A., Schroeder, S.L.M., Burke, M.G., O’Brien, P., Camargo, P.H.C., Haigh, S.J., Nano Lett. 14, 1921 (2014).Google Scholar
Burdet, P., Saghi, Z., Filippin, A.N., Borrás, A., Midgley, P.A., Ultramicroscopy 160, 118 (2016).Google Scholar
Watanabe, M., Williams, D.B., J. Microsc. 221, 89 (2006).Google Scholar
Haberfehlner, G., Orthacker, A., Albu, M., Li, J., Kothleitner, G., Nanoscale 6, 14563 (2014).Google Scholar
Kolb, U., Mugnaioli, E., Gorelik, T.E., Cryst. Res. Technol. 46, 542 (2011).CrossRefGoogle Scholar
Liu, H.H., Schmidt, S., Poulsen, H.F., Godfrey, A., Liu, Z.Q., Sharon, J.A., Huang, X., Science 332, 833 (2011).Google Scholar
Eggeman, A.S., Krakow, R., Midgley, P.A., Nat. Commun. 6, 7267 (2015).CrossRefGoogle Scholar
Nicoletti, O., de la Pena, F., Leary, R.K., Holland, D.J., Ducati, C., Midgley, P.A., Nature 502, 80 (2013).Google Scholar
Atre, A.C., Brenny, B.J.M., Coenen, T., García-Etxarri, A., Polman, A., Dionne, J.A., Nat. Nanotechnol. 10, 429 (2015).Google Scholar
Collins, S.M., Ringe, E., Duchamp, M., Saghi, Z., Dunin-Borkowski, R.E., Midgley, P.A., ACS Photonics 2, 1628 (2015).Google Scholar
Saghi, Z., Benning, M., Leary, R., Macias-Montero, M., Borras, A., Midgley, P.A., Adv. Struct. Chem. Imaging 1, 1 (2015).Google Scholar
Leary, R., Saghi, Z., Midgley, P.A., Holland, D.J., Ultramicroscopy 131, 70 (2013).Google Scholar