Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-12-02T22:09:48.926Z Has data issue: false hasContentIssue false

Advances in Structural Studies of Materials Using Scattering Probes

Published online by Cambridge University Press:  31 January 2011

Get access

Abstract

X-ray and neutron diffraction have been two key techniques for structural characterization of materials since their inception. If single crystals of the materials of interest cannot be synthesized, one has to resort to powder diffraction. This results in the loss of three-dimensional orientation information of the crystal, and one has to contend with the one-dimensional information that is inherent to powder diffraction, making it harder to analyze the data. The structural study of contemporary materials and their remarkable properties is a challenging problem, particularly when properties of interest result from interplay of multiple degrees of freedom. Very often these are associated with structural defects or relate to different length scales in a material. The signature of the defect-related phenomenon is visible as diffuse scattering in the diffraction pattern, and the signals associated with diffuse scattering are orders of magnitude smaller than Bragg scattering. Given these limitations, it is crucial to have high-resolution and high-intensity data along with the ability to carry out theoretical interpretation that goes beyond periodic lattice formalism of crystallography. Great advances have been achieved due to the advent of synchrotron and neutron sources, along with the availability of high-speed computational algorithms allowing materials scientists to work with a very small amount of sample (both single crystal and powder) and analyze vast amounts of data to unravel detailed structural descriptions that were not previously possible. This article presents some of these great advances in using scattering probes for materials characterization.

Type
Research Article
Copyright
Copyright © Materials Research Society 2010

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Rietveld, H.M., J. Appl. Crystallogr. 2, 65 (1969).CrossRefGoogle Scholar
2.Jorgensen, J.D., Beno, M.A., Hinks, D.G., Soderholm, L., Hitterman, R.L., Grace, J.D., Schuller, I.K., Segre, C.U., Zhang, K., Kleefisch, M.S., Phys. Rev. B 36, 3608 (1987).CrossRefGoogle Scholar
3.Jorgensen, J.D., Veal, B.W., Paulikas, A.P., Nowicki, L.J., Crabtree, G.W., Claus, H., Kwok, W.K., Phys. Rev. B 41, 1863 (1990).CrossRefGoogle Scholar
4.Jorgensen, J.D., Schuttler, H.B., Hinks, D.G., Capone, D.W., Zhang, K., Brodsky, M.B., Scalapino, D.J., Phys. Rev. B 58, 1024 (1987).Google Scholar
5.Day, C., Physics Today 62, 36 (2009).CrossRefGoogle Scholar
6.Zimmer, B.I., Jeitschko, W., Albering, J.H., Glaum, R., Reehuis, M., J. Alloys Compd. 229, 238 (1995).CrossRefGoogle Scholar
7.Kamihara, Y., Hiramatsu, H., Hirano, M., Kawamura, R., Yanagi, H., Kamiya, T., Hosono, H., J. Am. Chem. Soc. 128, 10012 (2008).CrossRefGoogle Scholar
8.Kamihara, Y., Watanabe, T., Hirano, M., Hosono, H., J. Am. Chem. Soc. 130, 3296 (2008).CrossRefGoogle Scholar
9.de la Cruz, C., Huang, Q., Lynn, J.W., Li, J., Ratcliff, W. II, Zarestky, J.L., Mook, H.A., Chen, G.F., Luo, J.L., Wang, N.L., Dai, P., Nature 453, 899 (2008).CrossRefGoogle Scholar
10.Marrows, C.H., Chapon, L.C., Langridge, S., Mater. Today 12, 70 (2009).CrossRefGoogle Scholar
11.Wills, A.S., Phys. B 276, 680 (2000).CrossRefGoogle Scholar
12.Poole, A., Lelievre-Berna, E., Wills, A.S., Phys. B 404, 2535 (2009).CrossRefGoogle Scholar
13.Radaelli, P.G., Chapon, L.C., J. Phys.: Condens. Matter 20, 434213 (2008).Google Scholar
14.Chapon, L.C., Radaelli, P.G., Blake, G.R., Park, S., Cheong, W.-W., Phys. Rev. Lett. 96, 097601 (2006).CrossRefGoogle Scholar
15.Rodriguez-Carvajal, J., Phys. B 192, 55 (1993).CrossRefGoogle Scholar
16.Christensen, A.N., Lehmann, M.S., Pannetier, J., J. Appl. Crystallogr. 18, 170 (1985).CrossRefGoogle Scholar
17.Readman, J.E., Lister, S.E., Peters, L., Wright, J., Evans, J.S.O., J. Am. Chem. Soc. 131, 17560 (2009).CrossRefGoogle Scholar
18.Nishimura, S., Kobayashi, G., Ohoyama, K., Kanno, R., Yashima, M., Yamada, A., Nat. Mater. 7, 707 (2008).CrossRefGoogle Scholar
19.Brinks, H.W., Hauback, B.C., Norby, P., Fjellvag, H., J. Alloys Compd. 351, 222 (2003).CrossRefGoogle Scholar
20.Bosenberg, U., Doppiu, S., Mosegaard, L., Barkhordarian, G., Eigen, N., Borgschulte, A., Jensen, T.R., Cerenius, Y., Gutfleisch, O., Klassen, T., Dornheim, M., Bormann, R., Acta Mater. 55, 3951 (2007).CrossRefGoogle Scholar
21.Rissenbeek, J., Gao, Y., Hanson, J., Huang, Q., Jones, C., Toby, B., J. Alloys Compd. 454, 233 (2008).CrossRefGoogle Scholar
22.Xiong, Z.T., Yong, C.K., Wu, G.T., Chen, P., Shaw, W., Karkamkar, A., Jones, M.O., Johnson, S.R., Edwards, P.P., David, W.I.F., Nat. Mater. 7, 138 (2008).CrossRefGoogle Scholar
23.Huq, A., Richardson, J.W., Maxey, E.R., Chandra, D., Chien, W.M., J. Alloys Compd. 436, 256 (2007).CrossRefGoogle Scholar
24.Weidner, E., Bull, D.J., Shabalin, I.L., Keens, S.G., Telling, M.T.F., Ross, D.K., Chem. Phys. Lett. 444, 76 (2007).CrossRefGoogle Scholar
25.McIntosh, S., Vente, J.F., Haije, W.G., Blank, D.H.A., Bouwmeester, H.J.M, Chem. Mater. 18, 2187 (2006).CrossRefGoogle Scholar
26.Li, Y., Maxey, E.R., Richardson, J.W., J. Am. Ceram. Soc. 88, 1244 (2005).CrossRefGoogle Scholar
27.Ali, R., Yashima, M., J. Solid State Chem. 178, 2867 (2005).CrossRefGoogle Scholar
28.Stinton, G.W., Evans, J.S.O., J. Appl. Crystallogr. 40, 87 (2007).CrossRefGoogle Scholar
29.David, W.I.F., Evans, J.S.O., Sleight, A.W., Europhys. Lett. 46, 661 (1999).CrossRefGoogle Scholar
30.Ahart, M., Somayazulu, M., Cohen, R.E., Ganesh, P., Dera, P., Mao, H., Hemley, R.J., Ren, Y., Liermann, P., Wu, Z., Nature 451, 31 (2008).CrossRefGoogle Scholar
31.Salzman, C.G., Radaelli, P.G., Hallbrucker, A., Mayer, E., Finney, J.L., Science 311, 1758 (2006).CrossRefGoogle Scholar
32.Ding, Y., Haskel, D., Tseng, Y., Kaneshita, E., Veenendaal, M., Mitchell, J.F., Sinogeikin, S.V., Prakapenka, V., Mao, H., Phys. Rev. Lett. 102, 237201 (2009).CrossRefGoogle Scholar
33.Kenzelmann, M., Harris, A.B., Aharony, A., Entin-Wohlman, O., Yildirim, T., Huang, Q., Park, S., Lawes, G., Broholm, C., Rogado, N., Cava, R.J., Kim, K.H., Jorge, G., Ramirez, A.P., Phys. Rev. B 74, 014429 (2006).CrossRefGoogle Scholar
34.Koyama, K., Watanabe, K., Kanomata, T., Kainuma, R., Oikawa, K., Ishida, K., Appl. Phys. Lett. 88, 132505 (2006).CrossRefGoogle Scholar
35.Pecharsky, V.K., Mudryk, Y., Gschneidner, K.A. Jr, Z. Kristallogr. 26, 139 (2007).CrossRefGoogle Scholar
36.Eckold, G., Gibhardt, H., Caspary, D., Elter, P., Elisbihani, K., Z. Kristallogr. 218, 144 (2003).CrossRefGoogle Scholar
37.Jones, J.L., Hoffman, M., Daniels, J.E., Studer, A.J., Appl. Phys. Lett. 89, 092901 (2006).CrossRefGoogle Scholar
38.Le Bail, A., Cranswick, L.M.D., Adil, K., Altomare, A., Avdeev, M., Cerny, R., Cuocci, C., Giacovazzo, C., Halasz, I., Lapidus, S.H., Louwen, J.N., Moliterni, A., Palatinus, L., Rizzi, R., Schilder, E.C., Stephens, P.W., Stone, K.H., van Mechelen, J., Powder Diffr. 24, 254 (2009).CrossRefGoogle Scholar
39.David, W.I.F., Shankland, K., McCusker, L.L., Baerlocher, Ch., Structure Determination from Powder Diffraction Data (Oxford University Press, Oxford, UK, 2002).Google Scholar
40.Clearfield, A., Reibenspies, J.H., Bhuvanesh, N., Principles and Applications of Powder Diffraction (Blackwell, Oxford, UK, 2008).Google Scholar
41.Dinnebier, R.E., Billinge, S.J.L., Powder Diffraction—Theory and Practice (RSC, Cambridge, 2008).CrossRefGoogle Scholar
42.Oszlányi, G., Sütö, A., Acta Crystallogr., Sect. A: Found. Crystallogr. 60, 134 (2004).CrossRefGoogle Scholar
43.Baerlocher, Ch., McCusker, L.B., Palatinus, L., Z. Kristallogr. 222, 47 (2007).CrossRefGoogle Scholar
44.Baerlocher, Ch., Xie, D., McCusker, L.B., Hwang, S.-J., Chan, I.Y., Ong, K., Burton, A.W., Zones, S.I., Nat. Mater. 7, 631 (2008).CrossRefGoogle Scholar
45.Pagola, S., Stephens, P.W., Bohle, D.S., Kosar, A.D., Madsen, S.K., Nature 404, 307 (2000).CrossRefGoogle Scholar
46.Von Dreele, R.B., Stephens, P.W., Smith, G.D., Blessing, R.H., Acta Crystallogr., Sect. D: Biol. Crystallogr. 56, 1549 (2000).Google Scholar
47.Margiolaki, I., Wright, J.P., Acta Crystallogr., Sect. A: Found. Crystallogr. 64, 169 (2007).CrossRefGoogle Scholar
48.Billinge, S.J.L., Levin, I., Science 316, 561 (2007).CrossRefGoogle Scholar
49.Egami, T., Billinge, S.J.L., Underneath the Bragg Peaks: Structural Analysis of Complex Materials (Pergamon Press Elsevier, Oxford, UK, 2003).CrossRefGoogle Scholar
50.Kodama, K., Iikubo, S., Taguchi, T., Shamoto, S.-I., Acta Crystallogr., Sect. A: Found. Crystallogr. 62, 444 (2006).CrossRefGoogle Scholar
51.Korsunskiy, V.I., Neder, R.B., Hofmann, A., Dembski, S., Grafb, C., Rühlb, E., J. Appl. Crystallogr. 40, 975 (2007).CrossRefGoogle Scholar
52.Juhás, P., Cherba, D.M., Duxbury, P.M., Punch, W.F., Billinge, S.J.L., Nature 440, 655 (2006).CrossRefGoogle Scholar
53.Farrow, C.L., Juhas, P., Liu, J.W., Bryndin, D., Bozin, E.S., Bloch, J., Proffen, Th., Billinge, S.J.L., J. Phys: Condens. Mater. 19, 335219 (2007).Google Scholar
54.Farrow, C.L., Billinge, S.J.L., Acta Crystallogr., Sect. A: Found. Crystallogr. 65, 232, (2009).CrossRefGoogle Scholar
55.Masadeh, A.S., Bozin, E.S., Farrow, C.L., Paglia, G., Juhas, P., Billinge, S.J.L., Karkamkar, A., Kanatzidis, M.G., Phys. Rev. B 76, 115413 (2007).CrossRefGoogle Scholar
56.Chupas, P.J., Qiu, X., Hanson, J.C., Lee, P.L., Grey, C.P., Billinge, S.J.L., J. Appl. Crystallogr. 36, 1342 (2003).CrossRefGoogle Scholar
57.Chupas, P.J., Chapman, K.W., Lee, P.L., J. Appl. Crystallogr. 40, 463 (2007).CrossRefGoogle Scholar
58.Ehm, L., Antao, S.M., Chen, J., Locke, D.R., Michel, F.M., Martin, C.D., Yu, T., Parise, J.B., Lee, P.L., Chupas, P.J., Shastri, S.D., Guo, Q., Powder Diffr. 22, 108 (2007).CrossRefGoogle Scholar
59.Armand, P., Saboungi, M.-L., Price, D.L., Iton, L., Cramer, C., Grimsditch, M., Phys. Rev. Lett. 79, 2061 (1997).CrossRefGoogle Scholar
60.Shatnawi, M., Paglia, G., Dye, J.L., Cram, K.C., Lefenfeld, M., Billinge, S.J.L., J. Am. Chem. Soc. 129, 1386 (2007).CrossRefGoogle Scholar
61.Chapman, K.W., Chupas, P.J., Maxey, E.R., Richardson, J.W., Chem. Commun. 4013 (2006).CrossRefGoogle Scholar
62.Bozin, E.S., Schmidt, M., DeConinck, A.J., Paglia, G., Mitchell, J.F., Chatterji, T., Radaelli, P.G., Proffen, Th., Billinge, S.J.L., Phys. Rev. Lett. 98, 137203 (2007).CrossRefGoogle Scholar
63.Welberry, T.R., Goossens, D.J., Heerdegen, A.P., Lee, P.L., Z. Kristallogr. 222, 1052 (2005).CrossRefGoogle Scholar
64.Chan, E.J., Welberry, T.R., Goossens, D.J., Heerdegen, A.P., Beasley, A.G., Chupas, P.J., Acta Crystallogr., Sect. B: Struct. Sci. 65, 382 (2009).CrossRefGoogle Scholar
65.Welberry, T.R., Butler, B.D., J. Appl. Crystallogr. 27, 205 (1994).CrossRefGoogle Scholar
66.Welberry, T.R., Diffuse X-ray Scattering and Models of Disorder, IUCr Monographs on Crystallography (Oxford University Press, Oxford, UK, 2004).Google Scholar
67.Weber, T., Bürgi, H.-B., Acta Crystallogr., Sect. A: Found. Crystallogr. 58, 526 (2002).CrossRefGoogle Scholar
68.Weber, T., Estermann, M.A., Bürgi, H.-B., Acta Crystallogr., Sect. B: Struct. Sci. 57, 579 (2001).CrossRefGoogle Scholar
69.Welberry, T.R., Acta Crystallogr., Sect. A: Found. Crystallogr. 57, 244 (2001).CrossRefGoogle Scholar
70.Welberry, T.R., Goossens, D.J., Edwards, A.J., David, W.I.F., Acta Crystallogr., Sect. A: Found. Crystallogr. 57, 101, (2001).CrossRefGoogle Scholar
71.Withers, R.L., Welberry, T.R., Brink, F.J., Norén, L., J. Solid State Chem. 170, 211 (2003).CrossRefGoogle Scholar
72.Welberry, T.R., Christy, A.G., Phys. Chem. Miner. 24, 24 (1997).CrossRefGoogle Scholar
73.Thomas, L.H., Welberry, T.R., Goossens, D.J., Heerdegen, A.P., Gutmann, M.J., Teat, S.J., Lee, P.L., Wilson, C.C., Cole, J.M., Acta Crystallogr., Sect. B: Struct. Sci. 63, 663 (2007).CrossRefGoogle Scholar