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Advances in Scattering Probes for Materials

Published online by Cambridge University Press:  31 January 2011

Paul G. Evans  and
Simon J.L. Billinge
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Abstract

Recent advances in x-ray and neutron sources, optics, and scattering methods are heralding a new age in the study of the structure and properties of complex materials. By providing unprecedented resolution in real space, reciprocal space, and time, new techniques address materials characterization challenges beyond anything possible before, at length scales ranging from the atomic scale to the mesoscale, and at times as short as femtoseconds. The high degree of coherence of third-generation synchrotron sources permits a new level of precision in the quantitative description and analysis of diffraction and scattering and allows beams with sizes probing individual nanostructures to be produced. As a result, in situx-ray and neutron analysis techniques now provide insight into the structure of nanomaterials and yield a more precise set of metrics describing the nanometer-scale structure of materials. Time resolution and in situ studies allow application of these techniques to materials driven far from equilibrium and to the challenging environment associated with materials processing.

Type
Research Article
Information
MRS Bulletin , Volume 35 , Issue 7: Advances in Scattering Probes for Materials , July 2010 , pp. 495 - 503
Copyright
Copyright © Materials Research Society 2010

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References

1.Billinge, S.J.L., Levin, I., Science 316, 561 (2007).CrossRefGoogle Scholar
2.Schlom, D.G., Guha, S., Datta, S., MRS Bull. 33, 1017 (2008).CrossRefGoogle Scholar
3.Topsoe, H., J. Catal. 216, 155 (2003).CrossRefGoogle Scholar
4.Lee, M.L., Fitzgerald, E.A., Bulsara, M.T., Currie, M.T., Lochtefeld, A., J. Appl. Phys. 97, 011101 (2005).CrossRefGoogle Scholar
5.Warusawithana, M.P., Cen, C., Sleasman, C.R., Woicik, J.C., Li, Y., Fitting Kourkoutis, L., Klug, J.A., Li, H., Ryan, P., Wang, L.-P., Bedzyk, M., Muller, D.A., Chen, L.-Q., Levy, J., Schlom, D.G., Science 324, 367 (2009).CrossRefGoogle Scholar
6.Teichert, C., Phys. Rep. 365, 335 (2002).CrossRefGoogle Scholar
7.International Technology Roadmap for Semiconductors, 2009 Edition, Emerging Research Materials; www.itrs.net/Links/2009ITRS/2009Chapters_2009Tables/2009_ERM.pdf.Google Scholar
8.Rinaldi, M., Zuniga, C., Zuo, C., Piazza, G., IEEE Trans. Ultrason. Ferroelectr. Freq. Control 57, 38 (2010).CrossRefGoogle Scholar
9.Acremann, Y., Strachan, J.P., Chembrolu, V., Andrews, S.D., Tyliszczak, T., Katine, J.A., Carey, M.J., Clemens, B.M., Siegmann, H.C., Stohr, J., Phys. Rev. Lett. 96, 217202 (2006).CrossRefGoogle Scholar
10.Davis, T.M., Drews, T.O., Ramanan, H., He, C., Dong, J.S., Schnablegger, H., Katoulakis, M.A., Kokkoli, E., McCormick, A.V., Penn, R.L., Tsapatsis, M., Nat. Mater. 5, 400 (2006).CrossRefGoogle Scholar
11.Buonassisi, T., Istratov, A.A., Marcus, M.A., Lai, B., Cai, Z.H., Heald, S.M., Weber, E.R., Nat. Mater. 4, 676 (2005).CrossRefGoogle Scholar
12. A list of operating and planned synchrotron light sources applicable to hard x-ray scattering techniques: www.lightsources.org.Google Scholar
13.Sutton, M., Mochrie, S.G.J., Greytak, T., Nagler, S.E., Berman, L.E., Held, G.A., Stephenson, G.B., Nature 352, 608 (1991).CrossRefGoogle Scholar
14.Lai, B., Yun, W.B., Legnini, D., Xiao, Y., Chrzas, J., Viccaro, P.J., White, V., Bajikar, S., Denton, D., Cerrina, F., DiFabrizio, E., Gentili, M., Grella, L., Baciocchi, M., Appl. Phys. Lett. 61, 1877 (1992).CrossRefGoogle Scholar
15.Robinson, I.K., Phys. Rev. B 33, 3830 (1986).CrossRefGoogle Scholar
16.Mimura, H., Yumoto, H., Matsuyama, S., Sano, Y., Yamamura, K., Mori, Y., Yabashi, M., Nishino, Y., Tamasaku, K., Ishikawa, T., Yamamoto, K., Appl. Phys. Lett. 90, 051903 (2007).CrossRefGoogle Scholar
17.Ice, G.E., Pang, J.W.L., Larson, B.C., Budai, J.D., Tischler, J.Z., Choi, J.-Y., Liu, W., Liu, C., Assoufid, L., Shu, D., Khounsary, A., Mater. Sci. Eng. A 524, 3 (2009).CrossRefGoogle Scholar
18.Feng, Y., Feser, M., Lyon, A., Rishton, S., Chen, S., Sassolini, S., Yun, W., J. Vac. Sci. Technol. 25, 2004 (2007).CrossRefGoogle Scholar
19.Mimura, H., Yumoto, H., Matuyama, S., Sano, Y., Yamamyura, K., Mori, Y., Yabashi, M., Nishino, Y., Tamasaku, K., Ishikawa, T., Appl. Phys. Lett. 90, 051903 (2007).CrossRefGoogle Scholar
20.Kang, H.C., Yan, H., Winarski, R.P., Holt, M.V., Maser, J., Liu, C., Conley, R., Vogt, S., Macrander, A.T., Stephenson, G.B., Appl. Phys. Lett. 92, 221114 (2008).CrossRefGoogle Scholar
21.Ice, G.E., Pang, J.W.L., Tulk, C., Molaison, J., Choi, J.-Y., Vaughn, C., Lytle, L., Takacs, P.Z., Andersen, K.H., Bigault, T., Khounsary, A., J. Appl. Cryst. 42, 1004 (2009).CrossRefGoogle Scholar
22.McBride, J.R., Kippeny, T.C., Pennycook, S.J., Rosenthal, S.J., Nano Lett. 4, 1279 (2004).CrossRefGoogle Scholar
23.Hanaguri, T., Kohsaka, Y., Davis, J.C., Lupien, C., Yamada, I., Azuma, M., Takano, M., Ohishi, K., Ono, M., Takagi, H., Nat. Phys. 3, 865 (2007).CrossRefGoogle Scholar
24.Sayre, D., Acta Crystallogr. 5, 843 (1952).CrossRefGoogle Scholar
25.Qiu, X., Proffen, T., Mitchell, J.F., Billinge, S.J.L., Phys. Rev. Lett. 94, 177203 (2005).CrossRefGoogle Scholar
26.Mochrie, S.G.J., Mayes, A.M., Sutton, M., Brauer, S., Stephenson, G.B., Abernathy, D.L., Grubel, G., Phys. Rev. Lett. 78, 1275 (1997).CrossRefGoogle Scholar
27.Schoenlein, R.W., Chattopadhyay, S., Chong, H.H.W., Glover, T.E., Heimann, P.A., Shank, C.V., Zholents, A.A., Zolotorev, M.S., Science 287, 2237 (2000).CrossRefGoogle Scholar
28.Fruhling, U., Wieland, M., Gensch, M., Gebert, T., Schutte, B., Krikunova, M., Kalms, R., Budzyn, F., Grimm, O., Rossbach, J., Plonjes, E., Drescher, M., Nat. Photonics 3, 523 (2009).CrossRefGoogle Scholar
29.Friedrich, W., Knipping, P., von Laue, M., Ann. Phys. Berlin 41, 971 (1913), reprinted from Sitzungsber. K. Bayer. Akad. Wiss. (1912), pp. 303–322.CrossRefGoogle Scholar
30.Bragg, W.H., Bragg, W.L., Proc. R. Soc. London, Ser. A 88, 428 (1913).Google Scholar
31.Kendrew, J.B., Dickerson, R.E., Strandberg, B.E., Hart, R.G., Davies, D.R., Phillips, D.C., Shore, V.C., Nature 185, 422 (1960).CrossRefGoogle Scholar
32.Perutz, M.F., Rossmann, M.G., Cullis, A.F., Muirhead, H., Will, G., North, A.C.T., Nature 185, 416 (1960).CrossRefGoogle Scholar
33.Schluenzen, F., Tocilj, A., Zarivach, R., Harms, J., Gluehmann, M., Janell, D., Bashan, A., Bartels, H., Agmon, I., Franceschi, F., Yonath, A., Cell 102, 615 (2000).CrossRefGoogle Scholar
34.Ban, N., Nissen, P., Hansen, J., Moore, P., Steitz, T., Science 289, 905 (2000).CrossRefGoogle Scholar
35.Wimberly, B.T., Brodersen, D.E., Clemons, W.M., Morgan-Warren, R.J., Carter, A.P., Vonrhein, C., Hartsch, T., Ramakrishnan, V., Nature 407, 327 (2000).CrossRefGoogle Scholar
36. Nobel Foundation, 2009 Nobel Prize in Chemistry: http://nobelprize.org/nobel_prizes/chemistry/laureates/2009.Google Scholar
37. International Union of Crystallography, list of Nobel prizes associated with crystallography: www.iucr.org/people/nobel-prize.Google Scholar
38.Blume, M., Gibbs, D., Phys. Rev. B 37, 1779 (1988).CrossRefGoogle Scholar
39.Jelsch, C., Teeter, M.M., Lamzin, V., Pichon-Pesme, V., Blessing, R.H., Lecomte, C., Proc. Nat. Acad. Sci. USA 97, 3171 (2000).CrossRefGoogle Scholar
40.Murakami, Y., Hill, J.P., Gibbs, D., Blume, M., Koyama, I., Tanaka, M., Kawata, H., Arima, T., Tokura, Y., Hirota, K., Endoh, Y., Phys. Rev. Lett. 81, 582 (1998).CrossRefGoogle Scholar
41.Juhas, P., Cherba, D.M., Duxbury, P.M., Punch, W.F., Billinge, S.J.L., Nature 440, 655 (2006).CrossRefGoogle Scholar
42.Jadzinsky, P.D., Calero, G., Ackerson, C.J., Bushnell, D.A., Kornberg, R.D., Science 318, 430 (2007).CrossRefGoogle Scholar
43.Zuo, J.M., Vartanyants, I., Gao, M., Zhang, R., Nagahara, L.A., Science 300, 1419 (2003).CrossRefGoogle Scholar
44.Billinge, S.J.L., J. Solid State Chem. 181, 1698 (2008).CrossRefGoogle Scholar
45.Dagotto, E., Science 309, 257 (2005).CrossRefGoogle Scholar
46.Slezak, J.A., Lee, J., Wang, M., McElroy, K., Fujita, K., Andersen, B.M., Hirschfeld, P.J., Eisaki, H., Uchida, S., Davis, J.C., Proc. Nat. Acad. Sci. U.S.A. 105, 3203 (2008).CrossRefGoogle Scholar
47.Hsu, K., Loo, S., Guo, F., Chen, W., Dyck, J.S., Uher, C., Hogan, T., Polychroniadis, E.K., Kanatzidis, M.G., Science 303, 818 (2004).CrossRefGoogle Scholar
48.Juul Jensen, D., Lauridsen, E.M., Margulies, L., Poulsen, H.F., Schmidt, S., Sørensen, H.O., Vaughan, G.B.M., Mater. Today 9, 18 (2006).CrossRefGoogle Scholar
49.Schmidt, K.E., Spence, J.C.H., Weierstall, U., Kirian, R., Wang, X., Starodub, D., Chapman, H.N., Howells, M.R., Doak, R.B., Phys. Rev. Lett. 101, 115507 (2008).CrossRefGoogle Scholar
50.Zhang, P., Tevaarwerk, E., Park, B.-N., Savage, D.E., Celler, G.K., Knezevic, I., Evans, P.G., Eriksson, M.A., Lagally, M.G., Nature 439, 703 (2006).CrossRefGoogle Scholar
51.Reyren, N., Thiel, S., Caviglia, A., Fitting-Kourkoutis, L., Hammerl, G., Richter, C., Schneider, C.W., Kopp, T., Rüetschi, A.-S., Jaccard, D., Gabay, M., Muller, D.A., Triscone, J.-M., Mannhart, J., Science 317, 1196 (2007).CrossRefGoogle Scholar
52.Haasen, P., Physical Metallurgy (Cambridge University Press, UK, 1996).CrossRefGoogle Scholar
53.Herman, G.T., Fundamentals of Computerized Tomography: Image Reconstruction from Projection, 2nd Edition (Springer, New York, 2009).CrossRefGoogle Scholar
54.Miao, J., Charalambous, P., Kirz, J., Sayre, D., Nature 400, 342 (1999).CrossRefGoogle Scholar
55.Pfeifer, M.A., Williams, G.J., Vartanyants, I.A., Harder, R., Robinson, I.K., Nature 442, 63 (2006).CrossRefGoogle Scholar
56.Nishino, Y., Takahashi, Y., Imamoto, N., Ishikawa, T., Maeshima, K., Phys. Rev. Lett. 102, 018101 (2009).CrossRefGoogle Scholar
57.Stickler, D., Frömter, R., Stillrich, H., Menk, C., Tieg, C., Streit-Nierobisch, S., Sprung, M., Gutt, C., Stadler, L.-M., Leupold, O., Grübel, G., Oepen, H.P., Appl. Phys. Lett. 96, 042501 (2010).CrossRefGoogle Scholar
58.Vine, D.J., Williams, G.J., Abbey, B., Pfeifer, M.A., Clark, J.N., de Jonge, M.D., McNulty, I., Peele, A.G., Nugent, K.A., Phys. Rev. A 80, 063823 (2009).CrossRefGoogle Scholar
59.Newton, M.C., Leake, S.J., Harder, R., Robinson, I.K., Nat. Mater. 9, 120 (2010).CrossRefGoogle Scholar
60.Fenter, P., Park, C., Zhang, Z., Wang, S., Nat. Phys. 2, 700 (2006).CrossRefGoogle Scholar
61.Shpyrko, O.G., Isaacs, E.D., Logan, J.M., Feng, Y., Aeppli, G., Jaramillo, R., Kim, H.C., Rosenbaum, T.F., Zschack, P., Sprung, M., Narayanan, S., Sandy, A.R., Nature 447, 68 (2007).CrossRefGoogle Scholar
62.Evans, P.G., Isaacs, E.D., J. Phys. D: Appl. Phys. 39, R245 (2006).CrossRefGoogle Scholar
63.Evans, P.G., Isaacs, E.D., Aeppli, G., Cai, Z., Lai, B., Science 295, 1042 (2002).CrossRefGoogle Scholar
64.Schmidt, S., Olsen, U.L., Poulsen, H.F., Sorensen, H.O., Lauridsen, E.M., Margulies, L., Maurice, C., Juul Jensen, D., Scripta Mater. 59, 491 (2008).CrossRefGoogle Scholar
65.Tao, J., Niebieskikwiat, D., Varela, M., Luo, W., Schofield, M.A., Zhu, Y., Salamon, M.B., Zuo, J.M., Pantelides, S.T., Pennycook, S.J., Phys. Rev. Lett. 103, 097202 (2009).CrossRefGoogle Scholar
66.Pfeiffer, F., Leiner, V., Hoghoj, P., Anderson, I., Phys. Rev. Lett. 88, 055507 (2002).CrossRefGoogle Scholar
67.Chen, L.X., Zhang, X.Y., Wasinger, E.C., Attenkofer, K., Jennings, G., Muresan, A.Z., Lindsey, J.S., J. Am. Chem. Soc. 129, 9616 (2007).CrossRefGoogle Scholar
68.Ihee, H., Lorenc, M., Kim, T.K., Kong, Q.Y., Cammarata, M., Lee, J.H., Bratos, S., Wulff, M., Science 309, 1223 (2005).CrossRefGoogle Scholar
69.Cammarata, M., Levantino, M., Schotte, F., Anfinrud, P.A., Ewald, F., Choi, J., Cupane, A., Wulff, M., Ihee, H., Nat. Methods 5, 881 (2008).CrossRefGoogle Scholar
70.Tiede, D.M., Mardis, K.L., Zuo, X.B., Photosynth. Res. 102, 267 (2009).CrossRefGoogle Scholar
71.Hallmann, J., Morgenroth, W., Paulmann, C., Davaasambuu, J., Kong, Q., Wulff, M., Techert, S., J. Am. Soc. 131, 15018 (2009).CrossRefGoogle Scholar
72.Ejdrup, T., Lemke, H.T., Haldrup, K., Nielsen, T.N., Arms, D.A., Walko, D.A., Miceli, A., Landahl, E.C., Dufresne, E.M., Nielsen, M.M., J. Synchrotron Radiat. 16, 387 (2009).CrossRefGoogle Scholar
73.DeCamp, M.F., Reis, D.A., Bucksbaum, P.H., Merlin, R., Phys. Rev. B 64, 092301 (2001).CrossRefGoogle Scholar
74.Highland, M., Gundrum, B.C., Koh, Y.K., Averback, R.S., Cahill, D.G., Phys. Rev. B 76, 075337 (2007).CrossRefGoogle Scholar
75.Sondhauss, P., Larsson, J., Harbst, M., Naylor, G.A., Plech, A., Scheidt, K., Synnergren, O., Wulff, M., Wark, J.S., Phys. Rev. Lett. 94, 125509 (2005).CrossRefGoogle Scholar
76.Trigo, M., Sheu, Y.M., Arms, D.A., Chen, J., Ghimire, S., Goldman, R.S., Landahl, E., Merlin, R., Peterson, E., Reason, M., Reis, D.A., Phys. Rev. Lett. 101, 025505 (2008).CrossRefGoogle Scholar
77.Lindenberg, A.M., Kang, I., Johnson, S.L., Missalla, T., Heimann, P.A., Chang, Z., Larsson, J., Bucksbaum, P.H., Kapteyn, H.C., Padmore, H.A., Lee, R.W., Wark, J.S., Falcone, R.W., Phys. Rev. Lett. 84, 111 (2000).CrossRefGoogle Scholar
78.Fong, D.D., Stephenson, G.B., Streiffer, S.K., Eastman, J.A., Auciello, O., Fuoss, P.H., Thompson, C., Science 304, 5677 (2004).CrossRefGoogle Scholar
79.Ferguson, J.D., Arikan, G., Dale, D.S., Woll, A.R., Brock, J.D., Phys. Rev. Lett. 103, 256103 (2009).CrossRefGoogle Scholar
80.Kiselev, S.I., Sankey, J.C., Krivorotov, I.N., Emley, N.C., Schoelkopf, R.J., Burhman, R.A., Ralph, D.C., Nature 425, 380 (2003).CrossRefGoogle Scholar
81.Grigoriev, A., Do, D.-H., Kim, D.M., Eom, C.-B., Adams, B., Dufresne, E.M., Evans, P.G., Phys. Rev. Lett. 96, 187601 (2006).CrossRefGoogle Scholar
82.Navirian, H., Enquist, H., Nuske, R., Jurgilaitis, A., Korff Schmising, C.v., Sonhauss, P., Larsson, J., Phys. Rev. B 81, 024113 (2010).CrossRefGoogle Scholar
83.Tai, R.Z., Namikawa, K., Sawada, A., Kishimoto, M., Tanaka, M., Lu, P., Nagashima, K., Maruyama, H., Ando, M., Phys. Rev. Lett. 93, 087601 (2004).CrossRefGoogle Scholar
84.Pierce, M.S., Moore, R.G., Sorensen, L.B., Kevan, S.D., Hellwig, O., Fullerton, E.E., Kortright, J.B., Phys. Rev. Lett. 90, 175502 (2003).CrossRefGoogle Scholar
85.Barty, A., Boutet, S., Bogan, M.J., HauRiege, S., Marchesini, S., Sokolowski-Tinten, K., Stojanovic, N., Tobey, R., Ehrke, H., Cavalleri, A., Dusterer, S., Frank, M., Bajt, S.A., Woods, B.W., Seibert, M.M., Hajdu, J., Treusch, R., Chapman, H., Nat. Photonics 2, 415 (2008).CrossRefGoogle Scholar
86.Zholents, A., Heimann, P., Zolotorev, M., Byrd, J., Nucl. Instrum. Methods A 425, 385 (1999).CrossRefGoogle Scholar