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Materials Advances through Aberration-Corrected Electron Microscopy

Published online by Cambridge University Press:  31 January 2011

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Abstract

Over the last few years, the performance of electron microscopes has undergone a dramatic improvement, with achievable resolution having more than doubled. It is now possible to probe individual atomic sites in many materials and to determine atomic and electronic structure with single-atom sensitivity. This revolution has been enabled by the successful correction of the dominant aberrations present in electron lenses. In this review, the authors present a brief overview of these instrumental advances, emphasizing the new insights they provide to several areas of materials research.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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