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Insights into fundamental deformation processes from advanced in situ transmission electron microscopy

Published online by Cambridge University Press:  11 June 2019

Erdmann Spiecker ,
Sang Ho Oh ,
Zhi-Wei Shan ,
Yuichi Ikuhara  and
Scott X. Mao
Erdmann Spiecker
Affiliation:
Institute of Micro- and Nanostructure Research, and Center for Nanoanalysis and Electron Microscopy, Department of Materials Science and Engineering, Friedrich-Alexander-Universität Erlangen-Nürnberg, Germany; [email protected]
Sang Ho Oh
Affiliation:
Department of Energy Science, Sungkyunkwan University, Republic of Korea; [email protected]
Zhi-Wei Shan
Affiliation:
Center for Advancing Materials Performance from the Nanoscale, and Hysitron Applied Research Center in China, State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University, China; [email protected]
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Japan; [email protected]
Scott X. Mao
Affiliation:
Department of Mechanical Engineering and Materials Science, University of Pittsburgh, USA; [email protected]
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Abstract

In situ nanomechanical testing in (scanning) transmission electron microscopy provides unique opportunities for studying fundamental deformation processes in materials. New insights have been gained by combining advanced imaging techniques with novel preparation methods and controlled loading scenarios. For instance, by applying in situ high-resolution imaging during tensile deformation of metallic nanostructures, the interplay of dislocation slip and surface diffusion has been identified as the key enabler of superplasticity. Evidence for dislocation pinning by hydrogen defect complexes has been provided by in situ imaging under cyclic pillar compression in a tunable gas environment. And, for the very first time, individual dislocations have been moved around in situ in two-dimensional materials by combining micromanipulation and imaging in a scanning electron microscope.

Keywords

dislocationsdefectstransmission electron microscopy (TEM)scanning transmission electron microscopy (STEM)
Type
Advances in In situ Nanomechanical Testing
Information
MRS Bulletin , Volume 44 , Issue 6: Advances in In situ Nanomechanical Testing , June 2019 , pp. 443 - 449
Copyright
Copyright © Materials Research Society 2019 

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