Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Ke, San-Huang
Baranger, Harold U.
and
Yang, Weitao
2005.
Models of electrodes and contacts in molecular electronics.
The Journal of Chemical Physics,
Vol. 123,
Issue. 11,
Wang, Wei
Lu, Fushen
Veca, Lucia Monica
Meziani, Mohammed J.
Wang, Xin
Cao, Li
Gu, Lingrong
and
Sun, Ya‐Ping
2005.
Encyclopedia of Inorganic Chemistry.
Mahan, G
2005.
Thermoelectrics Handbook.
p.
17-1.
Koo, Sang-Mo
Li, Qiliang
Edelstein, Monica D.
Richter, Curt A.
and
Vogel, Eric M.
2005.
Enhanced Channel Modulation in Dual-Gated Silicon Nanowire Transistors.
Nano Letters,
Vol. 5,
Issue. 12,
p.
2519.
Sang-Mo Koo
Qiliang Li
Edelstein, M.D.
Richter, C.A.
and
Vogel, E.M.
2005.
Silicon Nanowire Field Effect Transistor Test Structures Fabricated by Top-down Approaches.
p.
171.
Zhang, Zhi-Bin
Liu, Xian-Jie
Campbell, Eleanor E. B.
and
Zhang, Shi-Li
2005.
Alternating current dielectrophoresis of carbon nanotubes.
Journal of Applied Physics,
Vol. 98,
Issue. 5,
Onoa, G Bibiana
O’Reilly, Thomas B
Walsh, Michael E
and
Smith, Henry I
2005.
Bulk production of singly dispersed carbon nanotubes with prescribed lengths.
Nanotechnology,
Vol. 16,
Issue. 12,
p.
2799.
Ahn, Yeonghwan
Dunning, James
and
Park, Jiwoong
2005.
Scanning Photocurrent Imaging and Electronic Band Studies in Silicon Nanowire Field Effect Transistors.
Nano Letters,
Vol. 5,
Issue. 7,
p.
1367.
Massoud, Y.
and
Nieuwoudt, A.
2006.
Scalable Modeling of Magnetic Inductance in Carbon Nanotube Bundles for VLSI Interconnect.
p.
254.
Lu, Chenguang
An, Lei
Fu, Qiang
Liu, Jie
Zhang, Hong
and
Murduck, James
2006.
Schottky diodes from asymmetric metal-nanotube contacts.
Applied Physics Letters,
Vol. 88,
Issue. 13,
Choi, Yongho
Johnson, Jason
Moreau, Ryan
Perozziello, Eric
and
Ural, Ant
2006.
Micromachined silicon transmission electron microscopy grids for direct characterization of as-grown nanotubes.
Nanotechnology,
Vol. 17,
Issue. 18,
p.
4635.
Nieuwoudt, A.
and
Massoud, Y.
2006.
Expression of Concern: Evaluating the impact of resistance in carbon nanotube bundles for VLSI interconnect using diameter-dependent modeling techniques.
IEEE Transactions on Electron Devices,
Vol. 53,
Issue. 10,
p.
2460.
Massoud, Y.
and
Nieuwoudt, A.
2006.
Expression of Concern: Accurate Resistance Modeling for Carbon Nanotube Bundles in VLSI Interconnect.
p.
288.
Sarto, M.S.
and
Tamburrano, A.
2006.
Multiconductor transmission line modeling of SWCNT bundles in common-mode excitation.
p.
466.
Nieuwoudt, Arthur
and
Massoud, Yehia
2006.
Expression of Concern: Understanding the Impact of Inductance in Carbon Nanotube Bundles for VLSI Interconnect Using Scalable Modeling Techniques.
IEEE Transactions on Nanotechnology,
Vol. 5,
Issue. 6,
p.
758.
Wang, Zhenjia
Pedrosa, Hermen
Krauss, Todd
and
Rothberg, Lewis
2006.
Determination of the Exciton Binding Energy in Single-Walled Carbon Nanotubes.
Physical Review Letters,
Vol. 96,
Issue. 4,
Banerjee, Kaustav
Im, Sungjun
and
Srivastava, Navin
2006.
Can Carbon Nanotubes Extend the Lifetime of On-Chip Electrical Interconnections?.
p.
1.
Ke, San-Huang
Yang, Weitao
and
Baranger, Harold U.
2006.
Nanotube-metal junctions: 2- and 3-terminal electrical transport.
The Journal of Chemical Physics,
Vol. 124,
Issue. 18,
Banerjee, Kaustav
and
Srivastava, Navin
2006.
Are carbon nanotubes the future of VLSI interconnections?.
p.
809.
Sarto, M.S.
and
Tamburrano, A.
2006.
Electromagnetic Analysis of Radio-Frequency Signal Propagation Along SWCN Bundles.
p.
201.