Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-28T04:58:24.009Z Has data issue: false hasContentIssue false

Titanium Disulphide (TiS2) Dichalcogenide Thin Films as Inorganic Hole Transport Layer for Perovskite Solar Cells Synthesized from Ionic Liquid Electrodeposition

Published online by Cambridge University Press:  16 November 2020

Omar Asif*
Affiliation:
Electrical and Computer Engineering Department, Binghamton University, SUNY, Binghamton, NY13902USA Center for Autonomous Solar Power (CASP), Binghamton University, SUNY, Binghamton, NY13902USA
Farshad Azadian
Affiliation:
Electrical and Computer Engineering Department, Binghamton University, SUNY, Binghamton, NY13902USA Center for Autonomous Solar Power (CASP), Binghamton University, SUNY, Binghamton, NY13902USA
Alok C. Rastogi
Affiliation:
Electrical and Computer Engineering Department, Binghamton University, SUNY, Binghamton, NY13902USA Center for Autonomous Solar Power (CASP), Binghamton University, SUNY, Binghamton, NY13902USA
Get access

Abstract

In high efficiency organic-inorganic perovskite solar cells formed as a multilayer structure, the hole transporting layer (HTL) at the perovskite absorber layer interface has a critical role. Organic HTLs based on Spiro-OMeTAD and PTAA have led to high efficiencies but displayed poor long-term stability and involves expensive purification processes that hinders universal low-cost commercialization goals for perovskite solar cells. Though as an inorganic alternative, transition metal chalcogenides have been investigated for HTL recently, the hot-injection method often used in synthesis has shown poor reproducibility and difficulty in scaling-up. In this work we demonstrate an ab initio facile inexpensive scalable synthesis of transition metal dichalcogenide (TiS2) by electrodeposition from ionic liquids as a low-cost inorganic HTL for perovskite solar cells. The TiS2 thin films were electrodeposited from choline chloride–urea eutectic based ionic liquid electrolytes at 80°C with Na2S2O3 as sulphur and TiCl4 as titanium source. From cyclic voltammetry studies the deposition potential of TiS2 was optimized at -0.8V vs Pt. The as-deposited TiS2 HTL exhibited polycrystalline structure with preferential growth along (001), (100), (002), (102), (110), (111) planes. The Raman spectroscopy of the films showed peaks around 225 cm−1 and 332 cm−1 attributed to the Eg and A1 g Raman modes respectively. The synthesized thin films demonstrated sharp optical bandgap edge along with bandgap tunability as the bandgap (direct) decreased from 1.53 eV to 1.49 eV, 1.40 eV, and 1.34 eV with gradual change in deposition potential from −0.8 V to −0.9 V, −1.0 V, and −1.1 V vs Pt, respectively. This aspect has potential for alignment of valance band edge in facilitating the hole transport at the perovskite-TiS2 interface. The absorption coefficient in visible-light range of the as-deposited TiS2 thin films likewise has shown a dependence on the synthesis potential which is highly conducive for application as an HTL in multilayer solar cell structure. The TiS2 thin films were observed to be p-type as shown from the Hall effect studies with a carrier mobility up to 14.4 cm2V−1s−1. A detailed study of the effect of the synthesis parameters on the structural, optical, band-edge, and electronic properties of TiS2 thin films suitable for application as HTL in perovskite solar cells is presented.

Type
Articles
Copyright
Copyright © The Author(s), 2020, published on behalf of Materials Research Society by Cambridge University Press

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Winter, R. and Heitjans, P., J. Phys. Chem. B 105, 6108 (2001).CrossRefGoogle Scholar
Whittingham, M.S., Science 192, 1126 (1976).CrossRefGoogle Scholar
Parvaz, M., Ahmed, S., Khan, M.B., Rahul, S. Ahmad, and Z.H. Khan, , AIP Conf. Proc. 1953, 030121 (2018).CrossRefGoogle Scholar
Gupta, U., Rao, B.G., Maitra, U., Prasad, B.E., and Rao, C.N.R., Chem. - An Asian J. 9, 1311 (2014).CrossRefGoogle Scholar
Xu, Y. and Schoonen, M.A.A., Am. Mineral. 85, 543 (2000).CrossRefGoogle Scholar
Conroy, L.E. and Park, K.C., Inorg. Chem. 7, 459 (1968).CrossRefGoogle Scholar
Rakstys, K., Saliba, M., Gao, P., Gratia, P., Kamarauskas, E., Paek, S., Jankauskas, V., and Nazeeruddin, M.K., Angew. Chemie - Int. Ed. 55, 7464 (2016).CrossRefGoogle Scholar
Saliba, M., Orlandi, S., Matsui, T., et al. , Nat. Energy 1, 1 (2016).CrossRefGoogle Scholar
Huckaba, A. J., Gharibzadeh, S., Ralaiarisoa, M., et al. , Small Methods 1, 1700250 (2017).CrossRefGoogle Scholar
Nam, H., Yang, H., Kim, E., Bae, C., and Shin, H., J. Vac. Sci. Technol. A 37, 020916 (2019).CrossRefGoogle Scholar
Pore, V., Ritala, M., and Leskelä, M., Chem. Vap. Depos. 13, 163 (2007).CrossRefGoogle Scholar
Carmalt, C.J., Parkin, I.P., and Peters, E.S., Polyhedron 22, 1263 (2003).CrossRefGoogle Scholar
Chang, H.S.W. and Schleich, D.M., J. Solid State Chem. 100, 62 (1992).CrossRefGoogle Scholar
Yuwen, L., Yu, H., Yang, X., Zhou, J., Zhang, Q., Zhang, Y., Luo, Z., Su, S., and Wang, L., Chem. Commun. 52, 529 (2016).CrossRefGoogle Scholar
Jeong, S., Yoo, D., Jang, J., Kim, M., and Cheon, J., J. Am. Chem. Soc. 134, 18233 (2012).CrossRefGoogle Scholar
Vehkamäki, M., Hatanpää, T., Ritala, M., and Leskelä, M., J. Mater. Chem. 14, 3191 (2004).CrossRefGoogle Scholar
Rastogi, A.C. and Janardhana, N.R., Thin Solid Films 565, 285 (2014).CrossRefGoogle Scholar
Rami, M., Benamar, E., Fahoume, M., and Ennaoui, A., Phys. Status Solidi Appl. Res. 172, 137 (1999).3.0.CO;2-V>CrossRefGoogle Scholar
Endres, F. and Schweizer, A., Phys. Chem. Chem. Phys. 2, 5455 (2000).CrossRefGoogle Scholar
Monk, P.M.S., Fundamentals of Electroanalytical Chemistry (Wiley, 2008).Google Scholar
Shivagan, D.D., Dale, P.J., Samantilleke, A.P., and Peter, L.M., Thin Solid Films 515, 5899 (2007).CrossRefGoogle Scholar
Chen, P.Y. and Sun, I.W., Electrochim. Acta 45, 3163 (2000).CrossRefGoogle Scholar
Creaser, C.S. and Creighton, J.A., J. Chem. Soc. Dalt. Trans. 1402 (1974).Google Scholar
Denholme, S.J., Dobson, P.S., Weaver, J.M.R., MacLaren, I., and Gregory, D.H., Int. J. Nanotechnol. 9, 23 (2012).CrossRefGoogle Scholar
Liu, Y., Liang, C., Wu, J., et al. , Adv. Mater. Interfaces 5, 1700895 (2018).CrossRefGoogle Scholar
Wu, K., Torun, E., Sahin, H., Chen, B., Fan, X., Pant, A., Wright, D.P., Aoki, T., Peeters, F.M., Soignard, E., and Tongay, S., Nat. Commun. 7, 1 (2016).Google Scholar
Lipatov, A., Loes, M. J., Lu, H., et al. , ACS Nano 12, 12713 (2018).CrossRefGoogle Scholar
Ranalli, J., Dimensionality Effect of Titanium Disulphide Nanosheets on Its Vibrational Properties Measured via Raman Spectroscopy, Politecnico di Milano, 2016.Google Scholar
Carmalt, C.J., O'Neill, S.A., Parkin, I.P., and Peters, E.S., J. Mater. Chem. 14, 830 (2004).CrossRefGoogle Scholar
Liu, Y.H., Porter, S.H., and Goldberger, J.E., J. Am. Chem. Soc. 134, 5044 (2012).CrossRefGoogle Scholar
Klipstein, P.C. and Friend, R.H., J. Phys. C Solid State Phys. 17, 2713 (1984).CrossRefGoogle Scholar
Friend, R.H., Jérome, D., Liang, W.Y., Mikkelsen, C., and Yoffe, A.D., J. Phys. C Solid State Phys. 10, L705 (1977).CrossRefGoogle Scholar
Hawkins, C.G. and Whittaker-Brooks, L., ACS Appl. Nano Mater. 1, 851 (2018).CrossRefGoogle Scholar
Bourgès, C., Barbier, T., Guélou, G., Vaqueiro, P., Powell, A. V., Lebedev, O.I., Barrier, N., Kinemuchi, Y., and Guilmeau, E., J. Eur. Ceram. Soc. 36, 1183 (2016).CrossRefGoogle Scholar