Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-24T15:02:30.288Z Has data issue: false hasContentIssue false
  • English
  • Français

Surface Composition of TiO2-Zn Nanotubes by NanoSIMS

Published online by Cambridge University Press:  14 June 2016

Indu B Mishra ,
Diana Khusnutdinova  and
William T Petuskey
Indu B Mishra*
Affiliation:
School of Molecular Sciences, Arizona State University
Diana Khusnutdinova
Affiliation:
School of Molecular Sciences, Arizona State University
William T Petuskey
Affiliation:
School of Molecular Sciences, Arizona State University
*
*(Email: [email protected])
Get access

Abstract

Titania nanotubes were prepared by anodic oxidation of Ti. The titania surfaces were partially coated with Zn by reacting zinc acetate with the nanotubes and then annealed. [1] An annealed nanotube cluster was placed carefully on a silicon wafer using tweezers. Secondary electron images were acquired by bombarding with Cs+ and observing the ejected OZn- and OTi- respectively. The SIMS analysis was done in ultra-high vacuum (∼ 10-10 Torr). The location of before and after the SIMS analysis was confirmed by scanning electron microscopy (SEM). Specific areas with various orientations (vertical and horizontal orientations) of the nanotubes were selected for the NanoSIMS 50L analysis. The NanoSIMS 50L is made by Ametek Cameca, Gennevillieres, France and is capable of doing in situ isotopic analysis of surfaces at high spatial resolution (25 nm2). The average ZnO/TiO was ∼1.8%, confirming the actual content of Zn used during synthesis of the nanotubes. Qualitatively, the TiO/ZnO ratio increased with increasing depth implying that ZnO concentration was decreasing as we probed into the nanotubes.

Keywords

sputteringsurface chemistryx-ray photoelectron spectroscopy (XPS)
Type
Articles
Information
MRS Advances , Volume 1 , Issue 46: Energy and Environment , 2016 , pp. 3151 - 3156
Copyright
Copyright © Materials Research Society 2016 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Zwilling, Y., Darque-Cerette, E., Annales de Chimie, Science de Materiaux, 22, 482 (1997).Google Scholar
Kasuga, T., Hiramatsu, M., Hoson, A., Sekino, T., Nihara, K., TiNT by chemical processing, Adv. Materials (1999),11(15), 1307–1311.3.0.CO;2-H>CrossRefGoogle Scholar
Banerjee, S., Mahapatra, S., Misra, M., Mishra, I.B, Nanotechnology 20(2009) 057502 (6pp), doi:10.1088/0957-4484/20/7/075502.Google Scholar
Richter, C., Panaitescu, E., Wu, Zhen, Wiley, R.J. & Menon, L., A Ultrahigh aspect ratio TiNT, Adv. Mater. (2007), 19, 946–948.CrossRefGoogle Scholar
Grimes, C. A., Mor, G.K., “TiNT arrays – Synthesis, properties and application,” Springer Sciences (2009).Google Scholar
Kulish, M.R., Struzhko, V.L., Bryska, V.P., Murashko, A.V., Itin, V.G., Hydrothermal synthesis and properties of TiNT doped with metals, Semiconductor Physics, Quantum Electronics and Optoelectronics (2011), 14(1), 21–30.CrossRefGoogle Scholar
Ray, R.S, Sarma, B, Mohanty, S., Misra, M., Theoretical and experimental study of sensing TATP through nanostructured TiO2 substrate, Talanta (2014), 118, 304–311.CrossRefGoogle ScholarPubMed
Enyashin, A.N., Seifert, G., Structure, stability & electrical properties of TiNT, Phys. Stat. solid (2005), 242, 1361–1370.CrossRefGoogle Scholar
Dubnikova, F., Kosloff, R., Zeiri, Y., Karpas, Z., J. Phys. Chem. A, (2002), 106, 4951–4956 CrossRefGoogle Scholar
Carpenter, M. et al. , Editors, Metal oxide nanomaterials for chemical sensors, (2013) Springer SciencesGoogle Scholar
Benjwal, P., Kar, K.K. (2015) One step synthesis of Zn doped TiNt and their photocatalytic activity, Materials Chemistry and Physics 160, 279–288.CrossRefGoogle Scholar
Roy, P., Kim, D., Lee, K., Spicker, E., Schmuki, P., TiNT and their application in Dye sensitized solar cells, Nanoscale (2010), 2, 45–59.CrossRefGoogle Scholar
Orloff, J. et al. , FIB and its applications (2002) Kulwar Academic / Plenum Publishers.Google Scholar
Li, J. et al. , Ion beam sculpting at nanometer scale, Nature (2001), 42, 166–169.CrossRefGoogle Scholar
Volkert, C.A., Minor, A.M., FIB Microscopy and micromachining, (2002) MRS Bulletin 22.Google Scholar
Williams, P., Bose, M. (2014) A redesigned Cs source for Cameca SIMS instruments, 26th Annual Workshop on SIMS and related techniques.Google Scholar
Pacholski, M.L., Winograd, N.. Imaging with MassSpectrometry, Chem. Rev. (1999), 99, 2977–3005.CrossRefGoogle Scholar
Herrmann, A.M, et al. Nano-scale secondary ion mass spectrometry – A new analytical tool …Soil Biology & Biochemistry, (2007), 39, 1836–1850.CrossRefGoogle Scholar
Adams, F. et al. (2005) Advanced analytical technique: platform for nano materials science, Spectrochimica Acta Part B 60, 13–26.CrossRefGoogle Scholar
Zalm, P.C, Secondary ion mass spectrometry, (1994), 46, 753–752.Google Scholar
Gerquin-Kern, Jean-Lue et al. , Progress in analytical imaging…by dynamic SIMS, Biochimica et Biophysica Acta, (2005), 1724, 228–238.Google Scholar
Supplementary material: PDF

Mishra supplementary material

Mishra supplementary material 1

Download Mishra supplementary material(PDF)
PDF 287.8 KB