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Model-free precision control of 808 nm laser pulses

Published online by Cambridge University Press:  01 February 2019

Brady T. Simon
Affiliation:
Mercer University, Mercer University Drive, Macon, GA 31207, U.S.A
Joshua Dupaty
Affiliation:
Mercer University, Mercer University Drive, Macon, GA 31207, U.S.A
Ei Ei Brown
Affiliation:
Army Research Laboratory, Powder Mill Rd, Adelphi, MD20783, U.S.A
Makhin Thitsa*
Affiliation:
Mercer University, Mercer University Drive, Macon, GA 31207, U.S.A
*
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Abstract

We propose a method for precision control of the temporal pulse shape in 808 nm emission from Er-doped fluoroindate glasses. Previously, authors have reported the model based controller design, in which the controller varies and controls the pump rate in real time through the pump power. In model-based design, the performance of the resultant controller depends on the accuracy of the mathematical model used to represent the device in the design process. In this paper a more robust control scheme using model-free approach is presented. Specifically, the controller design is independent of the mathematical model and hence any modeling error has no effect on the device performance. This robustness against modeling error is critical for control purposes in optical materials where various up-conversion parameters are unknown or hard to determine with certainty.

Type
Articles
Copyright
Copyright © Materials Research Society 2019 

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References

REFERENCES

Goodman, A. et al. , Proceedings of the National Academy of Sciences (PNAS), 47, 12419 (2017).CrossRefGoogle Scholar
Goodman, A. et al. , ACS Nano, 8, 3222 (2014).CrossRefGoogle Scholar
Zhang, H. et al. , J. Mater. Chem. B , 3, 6310 (2015).CrossRefGoogle Scholar
Zhang, Z. et al. , J. Am. Chem. Soc. , 20, 7317 (2014).CrossRefGoogle Scholar
König, K., Becker, T. W., Fischer, P., Riemann, I., and Halbhuber, K.-J., Optics Letters , 24, 113 (1999).CrossRefGoogle Scholar
König, K., Riemann, I., and Fritzsche, W., Opt. Lett. , 26, 819 (2001).CrossRefGoogle Scholar
Watson, S., Opt. Lett., 38, 3792 (2013).CrossRefGoogle Scholar
Lee, C. et al. , Optics Express , 23, 16232 (2015).CrossRefGoogle Scholar
Abbasi, A. et al. , IEEE Optical Interconnects Conference (OI)Santa Fe, NM, USA, 2017.Google Scholar
Thitsa, M., Rice, Z., Nve-Nsi, M., and Xue, X., ECS Transactions , 75, 59, 2016.CrossRefGoogle Scholar
Thitsa, M. and Steven Gray, W., ECS Transactions , 53, 151 (2013).CrossRefGoogle Scholar
Cai, R., Thitsa, M., Bluiett, A., Brown, E., and Hommerich, U., Optical Materials, 68, 19 (2017).CrossRefGoogle Scholar
Maciel, G. S., Araujo, C. B., Messaddeq, Y. and Aegerter, M. A., Phys. Rev. B , 55, 6335 (1997).CrossRefGoogle Scholar
Fliess, M. and Join, C., International Journal of Control, Taylor Francis, 86, 2228 (2013).Google Scholar