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FTIR Ellipsometry Study on RF sputtered Permalloy-Oxide Thin Films

Published online by Cambridge University Press:  13 June 2016

Md Abdul Ahad Talukder ,
Yubo Cui ,
Maclyn Compton ,
Wilhelmus Geerts ,
Luisa Scolfaro  and
Stefan Zollner
Md Abdul Ahad Talukder
Affiliation:
Department of Physics, Texas State University, San Marcos, TX 78666
Yubo Cui
Affiliation:
Department of Physics, Texas State University, San Marcos, TX 78666
Maclyn Compton
Affiliation:
Department of Physics, Texas State University, San Marcos, TX 78666
Wilhelmus Geerts*
Affiliation:
Department of Physics, Texas State University, San Marcos, TX 78666
Luisa Scolfaro
Affiliation:
Department of Physics, Texas State University, San Marcos, TX 78666
Stefan Zollner
Affiliation:
Department of Physics, New Mexico State University, Las Cruces, NM 88003
*
*(Email: [email protected])
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Abstract

The optical properties of RF sputtered polycrystalline permalloy oxide (PyO) thin films were studied in the infrared by variable angle ellipsometry. The dispersion of PyO shows a Lorentzian dispersion peak at 381.5 cm-1. We attribute this peak to the transverse optical phonon of PyO. This peak is consistent with a rocksalt crystal structure for the Ni0.81Fe0.19O1-δ thin films.

Keywords

oxideoptical propertiesmemory
Type
Articles
Information
MRS Advances , Volume 1 , Issue 49: Electronics and Photonics , 2016 , pp. 3361 - 3366
Copyright
Copyright © Materials Research Society 2016 

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References

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