Article contents
Fabrication of Si1-xGex layer on Si substrate by Screen-Printing
Published online by Cambridge University Press: 01 February 2019
Abstract
The impact of the Al and Ge ratio in the Al-Ge pastes are investigated for fabricating the single crystalline Si1-xGex thick layers on large area Si substrates by screen-printing metallization process. From X-ray reciprocal space maps, Ge fraction in the fabricated Si1-xGex thick layers are found to increase up to 40% with increasing the Ge ratio in the Al-Ge pastes. On the other hand, the interface of the Si and Si1-xGex layers are getting winding with increasing the Ge ratio in the Al-Ge pastes. The Al-Si-Ge phase diagram indicated that uniform SiGe layer can be fabricated by adjusting the Al-Ge ratio in the pastes within the liquid phase region.
- Type
- Articles
- Information
- Copyright
- Copyright © Materials Research Society 2019
References
REFERENCES
- 7
- Cited by