Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-28T01:10:35.019Z Has data issue: false hasContentIssue false
  • English
  • Français

CdSe nanoparticles characterized by XRD and HRTEM in function of pH

Published online by Cambridge University Press:  21 January 2020

G. Sánchez-Legorreta ,
P. Rosendo-Francisco ,
J. Sumaya-Martínez ,
O. Olea-Mejia  and
J. L. Rodríguez López
G. Sánchez-Legorreta*
Affiliation:
Facultad de Ciencias, UAEM, Campus “El Cerrillo, Piedras Blancas”. Carretera Toluca – Ixtlahuaca, Km. 15.5, CP. 50200 Toluca de Lerdo, México
P. Rosendo-Francisco*
Affiliation:
Facultad de Ciencias, UAEM, Campus “El Cerrillo, Piedras Blancas”. Carretera Toluca – Ixtlahuaca, Km. 15.5, CP. 50200 Toluca de Lerdo, México
J. Sumaya-Martínez
Affiliation:
Facultad de Ciencias, UAEM, Campus “El Cerrillo, Piedras Blancas”. Carretera Toluca – Ixtlahuaca, Km. 15.5, CP. 50200 Toluca de Lerdo, México
O. Olea-Mejia
Affiliation:
Centro Conjunto de Investigación en Química Sustentable UAEM-UNAM. Carretera Km. 14.5, Unidad San Cayetano, Toluca - Atlacomulco, C. P. 50200 Toluca de Lerdo, México
J. L. Rodríguez López
Affiliation:
Instituto Potosino de Investigación Científica y Tecnológica, Camino a la Presa San José 2055. Col. Lomas 4 sección, CP. 78216. San Luis Potosí S.L.P
*
a[email protected]
b[email protected]
Get access

Abstract

CdSe nanoparticles were grown using a colloidal method, in which the pH was the main parameter that was varied (from 8 to 12) with the objective of knowing the morphological and structural effects after the synthesis process. The samples were characterized with X-ray diffraction and High-Resolution Transmission Electron Microscope to know their crystalline structure. We identified the formation of two crystalline phases in a single sample, as well as the different crystal direction of the material, the crystallites size was calculated from the X-ray diffraction pattern using the Debye- Scherrer equation. The distance between planes was also calculated using the Fast Fourier Transformation (FFT). The results and analysis of the experimental work are reported.

Keywords

crystallographic structuretransmission electron microscopy (TEM)x-ray diffraction (XRD)
Type
Articles
Information
MRS Advances , Volume 4 , Issue 53: International Materials Research Congress XXVIII , 2019 , pp. 2921 - 2929
Copyright
Copyright © Materials Research Society 2020 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Romano-Trujillo, R., Rosendo, E., Ortega, M., Morales-Sánchez, A., Gracia, J. M., Diaz, T., Nieto, G., García, G., Luna-López, J. A., and Pacio, M.. Nanotechnology. 23 (18), 185602 (2012).CrossRefGoogle Scholar
AcharyaS. Sahu, S. Balamurgan S. Sahu, S. Balamurgan, and Sankar Roy, G.. Lat. Am. J. Phys. Educ. 5 (1), 134 (2011).Google Scholar
Pombo Barros, V. and Goyanes, V. Villaescusa. Revista Complutense de Ciencias Veterinarias. 5 (1), 69 (2011).Google Scholar
Mohammadimasoudi, M., Penninck, L., Aubert, T., Gomes, R., Hens, Z., Strubbe, F., and Neyts, K.. Optical Materials Express. 3 (12), 2045–2054 (2013).CrossRefGoogle Scholar
Gonzáles, J. C. and Chung, A.. Revista de investigación de Física. 8 (1), 5–10 (2005).Google Scholar
Farrow, and Kamat, P. V.. Journal of the American Chemical Society. 131 (31), 11124–11131 (2009).CrossRefGoogle Scholar
Capek, R. K., Moreels, I., Lambert, K., De Muynck, D., Zhao, Q., Van Tomme, A., Vanhaecke, F., and Hens, Z.. J. Phys. Chem. C. 114, 6371–6376 (2010).CrossRefGoogle Scholar
Amiri, G. R., Fatahian, S., Mahmoudi, S.. Materials Sciences and Applications. 4, 134-137 (2013).CrossRefGoogle Scholar
Mohamed, M. B., Tonti, D., Al-Salman, A., Chemseddine, A., and Chergui, M.. The Journal of Physical Chemistry B. 109 (21), 10533–10537 (2005).CrossRefGoogle Scholar
Jasieniak, J., Bullen, C., Van Embden, J., Mulvaney, P.. J. Phys. Chem. B. 109, 20665-20668 (2005).CrossRefGoogle Scholar
Rong, H., Xiaogang, Y., Hongye, T., Feng, G., Daxiang, C., and Hongchen, G.. Frontiers of Chemistry in China. 1 (4), 378–383 (2006).Google Scholar
Adachi, S.. Properties of Group-IV, III-V and II-VI semiconductors. (John Wiley & Sons Ltd, 2005) p. 106.CrossRefGoogle Scholar
Schmid, G.. Nanoparticles: from theory to application. (John Wiley & Sons, 2011) p. 50.Google Scholar
Bobrow, L. S.. Fundamentals of Electrical Engineering. (New York: Oxford UP, 1996)Google Scholar
Chetan, P. S., Madhabchandra, R., Manmohan, K. and Parma, N.. Beilstein J. Nanotechnology. 1, 119–127 (2010).Google Scholar
Bullen, R. and Mulvaney, P.. Nano Lett. 4 (12), 2303-2307, 2004.CrossRefGoogle Scholar
Avramescu, M. L., Rasmussen, P. E., Chénier, M. & Gardner, H. D.. Environmental Science and Pollution Research. 24 (2), 1553-1564 (2016).CrossRefGoogle Scholar
Alqadi, M., Abo Noqtah, O., Alzoubi, F., Alzouby, J. & Aljarrah, K.. Materials Science-Poland. 32 (1), 107-111 (2014).CrossRefGoogle Scholar
Sánchez Legorreta, G., Rosendo Francisco, P., Vargas Sanabria, R. and Olea Mejia, O.. Journal of Materials Science and Engineering A 9 (7-8) 153-161 (2019).Google Scholar
Manthiram, K., Beberwyck, B. J., Talapin, D. V., Alivisatos, A. P.. Journal of Visualized Experiments . 82, e50731 (2013).Google Scholar
Xing, X., Zuli, L., Guihuan, D., Yuebin, L., Ming, M.. Journal of Luminescence. 130, 1285–1291 (2010).Google Scholar
Zhengtao, C. Li, Fangqiong, T. and Bingsuo, Z.. J. Phys. Chem. B. 109, 16671-16675 (2005).Google Scholar
Ansari, Muhammad, Saeed, Madiha, Taj, Ayesha. Journal of Nanoscience and Nanotechnology. 19, 1–6, (2019).Google Scholar
Lu, K., Zhang, Haoyue, Zhong, Y., Fecht, H.-J.. Journal of Materials Research. 12 (4) (1997).Google Scholar
Oluwafemi, Oluwatobi S. and Songca, Sandile P.. Products and Applications of Biopolymers. (InTech, 2012).Google Scholar
Mehraa, M. C., Gubeli, N. D., Canadian Journal of Chemistry. 48 (1970).CrossRefGoogle Scholar
Warren, B. E.. X-ray Diffraction. (Dover Publications, 1990) p. 251.Google Scholar
Giacovazzo, C.. Fundamentals of crystallography. 3erd edition. (Oxford University Press, 2002).Google Scholar
Truong, N., Ngoc Nguyen, T. P., and Park, C.. International Journal of Photoenergy. Volume 2013.Google Scholar
Padiyan, Pathinettam, Marikani, A. Cryst. Res. Technol. 37 (11), 1241–1248 (2002).3.0.CO;2-C>CrossRefGoogle Scholar
Buseck, P., Cowley, J. and Eyring, L.. High-resolution transmission electron microscopy (Oxford University Press, 1988).Google Scholar
Kim, Hyung-Bae and Jang, Du-Jeon. CrystEngComm. 14, 6946–6951 (2012).CrossRefGoogle Scholar
Sun, H., Li, X., Chen, Y., Li, W., Li, F., Liu, B. and Zhang, X.. Nanotechnology. 19, 225601 (2008).CrossRefGoogle Scholar
Sun, H., Li, X., Chen, Y., Guo, D., Xie, Y., Li, W., Liu, B. and Zhang, X.. Nanotechnology. 20, 425603 (2009).CrossRefGoogle Scholar
Fultz, B., Howe, J.. Transmission Electron Microscopy and diffractometry of materials. Fourth Edition (Springer, 2013) p. 59.121.CrossRefGoogle Scholar