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Time-resolved light scattering by photoexcited V2O3

Published online by Cambridge University Press:  25 January 2017

Nardeep Kumar ,
Armando Rúa ,
Ramón Díaz ,
Iván Castillo ,
Brian Ayala ,
Sandra Cita ,
Félix Fernández  and
Sergiy Lysenko
Nardeep Kumar*
Affiliation:
Department of Physics, University of Puerto Rico, Mayaguez, Puerto Rico 00681, USA
Armando Rúa
Affiliation:
Department of Physics, University of Puerto Rico, Mayaguez, Puerto Rico 00681, USA
Ramón Díaz
Affiliation:
Department of Physics, University of Puerto Rico, Mayaguez, Puerto Rico 00681, USA
Iván Castillo
Affiliation:
Department of Physics, University of Puerto Rico, Mayaguez, Puerto Rico 00681, USA
Brian Ayala
Affiliation:
Department of Physics, University of Puerto Rico, Mayaguez, Puerto Rico 00681, USA
Sandra Cita
Affiliation:
Department of Physics, University of Puerto Rico, Mayaguez, Puerto Rico 00681, USA
Félix Fernández
Affiliation:
Department of Physics, University of Puerto Rico, Mayaguez, Puerto Rico 00681, USA
Sergiy Lysenko
Affiliation:
Department of Physics, University of Puerto Rico, Mayaguez, Puerto Rico 00681, USA
*
*(Email: [email protected])
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Abstract

Using ultrafast angle-resolved light scattering technique, we were able to trigger photoinduced phase transition processes in V2O3 film grown on a glass substrate. The phase transition is caused by photoacoustic wave in the film and appears as coherent oscillations of scattering signal at various time scales. These processes strongly depend on the size of microstructures constituting the V2O3 film. One of the key findings of our study is the presence of a size dependent phase transition threshold for V2O3 microstructures, where small size structures ( $\tilde <$ 0.5μm) have lowest contribution to the phase transition. The presence of this threshold can be well described by considering uneven internal strain in the films which is one of the key parameters controlling phase transition dynamics in various vanadium oxides.

Keywords

metal-insulator transitionoptoelectronicoxide
Type
Articles
Information
MRS Advances , Volume 2 , Issue 23: Electronics, Magnetics and Photonics , 2017 , pp. 1231 - 1236
Copyright
Copyright © Materials Research Society 2017 

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References

REFERENCES

McWhan, D. B. and Rice, T. M., Phys. Rev. Lett. 22, 887 (1969).Google Scholar
McWhan, D. B., Rice, T. M., and Remeika, J. P., Phys. Rev. Lett. 23, 1384 (1969).Google Scholar
Mott, N. F., Rev. Mod. Phys. 40, 677 (1968).Google Scholar
Castellani, C., Natoli, C. R., and Ranninger, J., Phys. Rev. B 18, 5001 (1978).Google Scholar
Foёx, M., C. R. Acad. Sci. (Paris) 223, 1126 (1946).Google Scholar
Foёx, M., Goldsztaub, S., Wey, R., Jaffray, J., Lyand, R., and Wucher, J., J. Rech. Cent. Nat. Rech. Sci. Lab. Bellevue (Paris) 21, 237 (1952).Google Scholar
McWhan, D. B. and Remeika, J. P., Phys. Rev. B 2, 3734– 3750 (1970).CrossRefGoogle Scholar
Abreu, E., Wang, S., Ramírez, J. G., Liu, M., Zhang, J., Geng, K., Schuller, I. K., and Averitt, R. D., Phys. Rev. B 92, 085130 (2015).Google Scholar
Liu, M. K., Pardo, B., Zhang, J., Qazilbash, M. M., Jin Yun, Sun, Fei, Z., Shin, Jun-Hwan, Kim, Hyun-Tak, Basov, D. N., and Averitt, R. D., Phys. Rev. Lett. 107, 066403 (2011).CrossRefGoogle Scholar
Elson, J. M., Phys. Rev. B 30, 5460 (1984).Google Scholar
Elson, J. M., Waves Random Media 7, 303 (1997).Google Scholar
Zerrad, M., Lequime, M., and Amra, C., Appl. Opt. 53, A297–A304 (2014).Google Scholar
Stover, J. C., Optical Scattering: Measurements and Analysis, 3rd ed. (SPIE Optical Engineering, 1995).CrossRefGoogle Scholar
Stover, J. C., Optical Scattering Measurement and Analysis. (McGraw-Hill, 1990).Google Scholar
Lysenko, S., Fernández, F., Rúa, A., Aparicio, J., Sepúlveda, N., Figueroa, J., Vargas, K., and Cordero, J., J. Appl. Phys. 117, 184304 (2015).Google Scholar