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Polarization switching in ferroelectric thin film induced by a single-period terahertz pulse

Published online by Cambridge University Press:  26 February 2018

Elena Mishina*
Affiliation:
Moscow Technological University (MIREA), Vernadsky Ave. 78, 119454, Moscow, Russia.
Kirill Grishunin
Affiliation:
Moscow Technological University (MIREA), Vernadsky Ave. 78, 119454, Moscow, Russia.
Vladislav Bilyk
Affiliation:
Moscow Technological University (MIREA), Vernadsky Ave. 78, 119454, Moscow, Russia.
Natalia Sherstyuk
Affiliation:
Moscow Technological University (MIREA), Vernadsky Ave. 78, 119454, Moscow, Russia.
Alexander Sigov
Affiliation:
Moscow Technological University (MIREA), Vernadsky Ave. 78, 119454, Moscow, Russia.
Vladimir Mukhortov
Affiliation:
Southern Scientific Center of Russian Academy of Sciences, Chehova st. 41, Rostov-on-Don, 344006, Russia.
Andrey Ovchinnikov
Affiliation:
Joint Institute for High Temperatures of Russian Academy of Sciences (JIHT) Izhorskaya st. 13 Bd.2, 125412, Moscow, Russia.
Alexey Kimel
Affiliation:
Moscow Technological University (MIREA), Vernadsky Ave. 78, 119454, Moscow, Russia. Radboud University Nijmegen, Institute for Molecules and Materials, 6525 AJ, Nijmegen, The Netherlands
*
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Abstract

We report here an experimental study of ultrafast response of the dielectric polarization in (Ba0.8Sr0.2)TiO3 thin films to a strong electric field of a nearly single-cycle THz pulse. The phenomenon of Second Harmonic Generation (SHG) is used as a probe of the polarization in the terahertz pump-optical probe experiment. SHG loops for THz pulses of different amplitudes were obtained. The SHG response is modelled assuming that the ferroelectric material is split into 180-degree domains. It is shown that intuitive model based on forced harmonic oscillator does not fully describe to the observed ultrafast ferroelectric response

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Articles
Copyright
Copyright © Materials Research Society 2018 

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References

Tagantsev, A. K., Stolichnov, I., Setter, N., Cross, J. S., and Tsukada, M., Phys. Rev. B 66, 214109 (2002).Google Scholar
Li, J., Nagaraj, B., Liang, H., Cao, W., Lee, C. H., and Ramesh, R., Appl. Phys. Lett. 84, 1174 (2004).Google Scholar
Baierl, S., Hohenleutner, M., Kampfrath, T., Zvezdin, A. K., Kimel, A. V., Huber, R., and Mikhaylovskiy, R. V., Nat. Photonics 10, 715 (2016).Google Scholar
Grishunin, K. A., Ilyin, N. A., Sherstyuk, N. E., Mishina, E. D., Kimel, A., Mukhortov, V. M., Ovchinnikov, A. V., Chefonov, O. V., and Agranat, M. B., Sci. Rep. 7, 687 (2017).Google Scholar
Mishina, E. D., Sherstyuk, N. E., Barskiy, D. R., Sigov, A. S., Golovko, Y. I., Mukhorotov, V. M., De Santo, M., and Rasing, T., J. Appl. Phys. 93, 6216 (2003).Google Scholar
Fiebig, M., Pavlov, V. V., and Pisarev, R. V., J. Opt. Soc. Am. B 22, 96 (2005).Google Scholar
Mishina, E. D., Misuryaev, T. V., Sherstyuk, N. E., Lemanov, V. V., Morozov, A. I., Sigov, A. S., and Rasing, T., Phys. Rev. Lett. 85, 3664 (2000).Google Scholar
Mishina, E. D., Morozov, A. I., Sigov, A. S., Sherstyuk, N. E., Aktsipetrov, O. A., Lemanov, V. V, and Rasing, T., J. Exp. Theor. Phys. 94, 552 (2002).Google Scholar
Sheu, Y. M., Trugman, S. A., Yan, L., Jia, Q. X., Taylor, A. J., and Prasankumar, R. P., Nat. Commun. 5, 5832 (2014).Google Scholar
Miyamoto, T., Yada, H., Yamakawa, H., and Okamoto, H., Nat. Commun. 4, 2586 (2013).Google Scholar
Yamakawa, H., Miyamoto, T., Morimoto, T., Yada, H., Kinoshita, Y., Sotome, M., Kida, N., Yamamoto, K., Iwano, K., Matsumoto, Y., Watanabe, S., Shimoi, Y., Suda, M., Yamamoto, H. M., Mori, H., and Okamoto, H., Sci. Rep. 6, 20571 (2016).Google Scholar
Mankowsky, R., Von Hoegen, A., Först, M., and Cavalleri, A., Phys. Rev. Lett. 118, (2017).Google Scholar
Sigov, A. S., Mishina, E. D., and Mukhortov, V. M., Phys. Solid State 52, 762 (2010).Google Scholar
Vicario, C., Jazbinsek, M., Ovchinnikov, A. V, Chefonov, O. V, Ashitkov, S. I., Agranat, M. B., and Hauri, C. P., Opt. Express 23, 4573 (2015).Google Scholar
Shirokov, V. B., Biryukov, S. V., Mukhortov, V. M., and Yuzyuk, Y. I., Tech. Phys. 56, 1175 (2011).Google Scholar
Kazantseva, E. V and Maimistov, A. I., Quantum Electron. 30, 623 (2000).Google Scholar
Kazantseva, E. V., Maimistov, A. I., and Caputo, J.-G., Phys. Rev. E 71, 56622 (2005).Google Scholar
Grübel, S., Johnson, J. A., Beaud, P., Dornes, C., Ferrer, A., Haborets, V., Huber, L., Huber, T., Kohutych, A., Kubacka, T., Kubli, M., Mariager, S. O., Rittmann, J., Saari, J. I., Vysochanskii, Y., Ingold, G., and Johnson, S. L., arXiv 1 (2016).Google Scholar
Shirokov, V. B., Yuzyuk, Y. I., Kalinchuk, V. V., and Lemanov, V. V., Phys. Solid State 55, 773 (2013).Google Scholar
Shirokov, V. B., Shakhovoy, R. A., Razumnaya, A. G., and Yuzyuk, Y. I., J. Appl. Phys. 118, 24101 (2015).Google Scholar
Mishina, E. D., Sherstyuk, N. E., Barskiy, D. R., Sigov, A. S., Golovko, Y. I., Mukhorotov, V. M., De Santo, M., and Rasing, T., J. Appl. Phys. 93, 6216 (2003).Google Scholar
Jiang, A. Q., Lee, H. J., Hwang, C. S., and Scott, J. F., Adv. Funct. Mater. 22, 192 (2012).Google Scholar
Dolino, G., Lajzerowicz, J., and Vallade, M., Phys. Rev. B 2, 2194 (1970).Google Scholar
Mishina, E., Sherstyuk, N., Golovko, Y., Muhortov, V., and Sigov, A., Integr. Ferroelectr. 92, 65 (2007).Google Scholar