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Fungi-derived xylindein: effect of purity on optical and electronic properties

Published online by Cambridge University Press:  13 June 2019

Gregory Giesbers ,
Taylor Krueger ,
Jonathan Van Schenck ,
Ray Van Court ,
Jeffrey Morré ,
Chong Fang ,
Sara Robinson  and
Oksana Ostroverkhova Open the ORCID record for Oksana Ostroverkhova [Opens in a new window]
Gregory Giesbers
Affiliation:
Oregon State University, Corvallis, OR, United States
Taylor Krueger
Affiliation:
Oregon State University, Corvallis, OR, United States
Jonathan Van Schenck
Affiliation:
Oregon State University, Corvallis, OR, United States
Ray Van Court
Affiliation:
Oregon State University, Corvallis, OR, United States
Jeffrey Morré
Affiliation:
Oregon State University, Corvallis, OR, United States
Chong Fang
Affiliation:
Oregon State University, Corvallis, OR, United States
Sara Robinson
Affiliation:
Oregon State University, Corvallis, OR, United States
Oksana Ostroverkhova*
Affiliation:
Oregon State University, Corvallis, OR, United States
*
*(Email: [email protected])
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Abstract

We present a study of optical and electronic properties of solutions and films based on the fungi-derived pigment xylindein, extracted from decaying wood and processed without and with a simple purification step (“ethanol wash”). The “post-wash” xylindein solutions exhibited considerably lower absorption in the ultraviolet spectral range and dramatically reduced photoluminescence below 600 nm, due to removal of contaminants most likely to be fungal secondary metabolites. The “post-wash” xylindein-based films were characterized by two orders of magnitude higher charge carrier mobilities as compared to “pre-wash” samples. This underlines the importance of minimizing contaminants that disrupt the conductive xylindein network in xylindein-based electronic devices.

Keywords

electrical propertiesoptical propertiesorganicpurificationsustainability
Type
Articles
Information
MRS Advances , Volume 4 , Issue 31-32: Electronics and Photonics , 2019 , pp. 1769 - 1777
Copyright
Copyright © Materials Research Society 2019 

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