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Control of Magnetic Coercivity in epitaxial Ni/VO2/YSZ/Si(001) heterostructures by manipulation of Ni thin film growth modes

Published online by Cambridge University Press:  23 May 2016

Gabrielle M. Foley ,
Srinivasa Rao Singamaneni ,
John Prater  and
Jay Narayan
Gabrielle M. Foley*
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA
Srinivasa Rao Singamaneni
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA Materials Science Division, Army Research Office, Research Triangle Park, North Carolina 27709, USA
John Prater
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA Materials Science Division, Army Research Office, Research Triangle Park, North Carolina 27709, USA
Jay Narayan
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, North Carolina 27695, USA
*
*(Email: [email protected])
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Abstract

The control of ferromagnetic properties by external stimuli is of great interest in the electronics community. One method of producing such a control is through proximity of a ferromagnetic film with a material that has a semiconductor-to-metal transition (SMT). In order for these magnetic heterostructures to be beneficial, they must consist of high-quality, crystalline films. Epitaxial films increase the reproducibility of both devices and properties. We have investigated the trend in magnetic coercivity in epitaxial nickel films on VO2. We show that not only does the interaction between the Ni and VO2 change the normal coercivity trend found in Ni M-H curves with no proximity to VO2, but that the crystalline growth mode of the Ni film also impacts the magnetic coercivity as a function of temperature.

Keywords

epitaxymagnetic propertiesNi
Type
Articles
Information
MRS Advances , Volume 1 , Issue 50: Electronics and Photonics , 2016 , pp. 3409 - 3414
Copyright
Copyright © Materials Research Society 2016 

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References

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