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The variation of the 01 reflection in plagioclases

Published online by Cambridge University Press:  05 July 2018

D. L. Hamilton  and
A. D. Edgar
D. L. Hamilton
Affiliation:
Department of Geology, The University, Manchester, England
A. D. Edgar
Affiliation:
Department of Geology, University of Western Ontario, London, Ontario, Canada
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Summary

The position of the 01 X-ray reflection in albite varies with the degree of Al/Si ordering. This is also true for binary plagioclases but the 01 reflection for high-temperature plagioclases is constant and therefore independent of anorthite content. For plagioclases of ternary composition grown in a hydrous silicate melt, the position of the 01 reflection gives a good estimate of the orthoclase content when a determinative curve is used that was originally drawn from data on high-temperature synthetic binary alkali feldspars.

Type
Research Article
Information
Mineralogical Magazine , Volume 37 , Issue 285 , March 1969 , pp. 16 - 25
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1969

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References

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