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Scanning transmission electron microscopy using a SEM: Applications to mineralogy and petrology

Published online by Cambridge University Press:  05 July 2018

M. R. Lee*
Affiliation:
Department of Geographical and Earth Sciences, University of Glasgow, Gregory Building, Lilybank Gardens, Glasgow G12 8QQ, UK
C. L. Smith
Affiliation:
Department of Mineralogy, The Natural History Museum, Cromwell Road, London SW7 5BD, UK
*

Abstract

High-resolution imaging of electron-transparent samples using a scanning electron microscope, here termed low voltage (LV) STEM, is a new and valuable technique for studying Earth and planetary materials. The most effective method of LV-STEM imaging uses a pair of electron detectors positioned side-by-side beneath the thin sample. The detector directly underlying the sample forms bright-field images dominated by mass-thickness contrast. Activation of the detector offset from the sample yields dark-field images with a greater component of atomic number contrast. LV-STEM images with significant diffraction contrast can also be obtained, but require careful positioning of the sample relative to the electron detectors. In this study LV-STEM was used successfully to image sub-μm sized kaolinite crystals and tens of nm-sized etch pits on the gold-coated surfaces of weathered feldspar grains. Dark-field LV-STEM was also especially effective for characterizing very fine-scale intergrowths of Mg- and Fe-rich phyllosilicates within uniformly thin samples of the Murchison meteorite prepared using the focused ion beam (FIB) technique. LV-STEM is a quick and easy method for characterizing the morphology and internal structure of mineral and rock samples and may prove to be especially useful in geomicrobiology research.

Type
Research Article
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 2006

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References

Coyne, E. (2004) Adapting SEMs to produce Scanning Transmission Electron Microscope Images. Microscopy and Analysis, 100, 1316.Google Scholar
Grillon, F. (2006) Low voltage contrast with an SEM Transmission Electron Detector. Microchimica Acta 155, 157161.CrossRefGoogle Scholar
Hanowski, N. P. and Brearley, A. J. (2001) Aqueous alteration of chondrules in the CM carbonaceous chondrite, Allan Hills 81002: Implications for parent body alteration. Geochimica et Cosmochimica acta, 65, 495518.CrossRefGoogle Scholar
Heaney, P. J., Vicenzi, E. P., Giannuzzi, L. A. and Livi, K. J. T. (2001) Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials. American Mineralogist, 86, 10941099.CrossRefGoogle Scholar
Lauretta, D. S., Hua, X. and Buseck, P. R. (2000) Mineralogy of fine-grained rims in the ALH 81002 CM chondrite. Geochimica et Cosmochimica acta, 64, 32633273.CrossRefGoogle Scholar
Lednick, F., Coufalová, E., Hromádková, J., Delong, A. and Kolarik, V. (2000) Low-voltage TEM imaging of polymer blends. Polymer, 41, 49094914.CrossRefGoogle Scholar
Lee, M. R. and Parsons, I. (1997) Compositional and microtextural zoning in alkali feldspars from the Snap granite and its geochemical implications. Journal of the Geological Society of London, 154, 183188.CrossRefGoogle Scholar
Lee, M. R., Bland, P. A. and Graham, G. (2003) Preparation of TEM samples by focused ion beam (FIB) techniques: applications to the study of clays and phyllosilicates in meteorites. Mineralogical Magazine, 67, 581592.CrossRefGoogle Scholar
Metzler, K., Bischoff, A. and Stoffler, D. (1992) Accretionary dust mantles in CM chondrites – evidence for solar nebula processes. Geochimica et Cosmochimica acta, 56, 28732897.CrossRefGoogle Scholar
Nakagawa, M., Dunne, R., Koike, H., Sato, M., Pérez-Camacho, J. J. and Kennedy, B. (2002) Low voltage FE-STEM for characterisation of state-of-the-art silicon SRAM. Journal of Electron Microscopy, 51, 5357.CrossRefGoogle Scholar
Oho, E., Baba, M., Baba, N., Muranaka, Y., Sasaki, T., actachi, K., Osumi, M. and Kanaya, K. (1987) The conversion of a field-emission scanning electron microscope to a high-resolution, high-performance scanning transmission electron microscope, while maintaining original functions. Journal of Electron Microscopy Technique, 6, 1530.CrossRefGoogle Scholar
Shimizu, K., Fujitani, H., Habazaki, H., Skeldon, P. and Thompson, G. E. (2004) Examination of surface films on aluminium and its alloys by low-voltage scanning and scanning transmission electron microscopy. Corrosion Science, 46, 25492561.CrossRefGoogle Scholar
Smith, C., Lee, M. R. and MacKenzie, M. (2006) New opportunities for nanomineralogy using FIB, STEM/ EDX and TEM. Microscopy and Analysis, 111, 1720.Google Scholar
Stroud, R. M., Alexander, C.M.O'D. and MacPherson, G. J. (2000) A precise new method of microsampling chondritic material for transmission electron microscope analysis: preliminary application to calcium-aluminium-rich inclusions and associated matrix material in the Vigarano CV3 meteorite. Meteoritics and Planetary Sciences Supplement, 35, A153154.Google Scholar
Takaoka, A. and Hasegawa, T. (2006) Observations of unstained biological specimens using a low-energy, high-resolution STEM. Journal of Electron Microscopy, 55, 157163.CrossRefGoogle ScholarPubMed
Tracy, B., Albert, K. and Tabrez, S. (2004) Adopting low-voltage STEM and automated sample prep to perform IC failure analysis. Micro, 22, 87–9.Google Scholar
Williams, D. B. and Carter, C. B. (1996) Transmission Electron Microscopy: a Textbook for Materials Science. Plenum Press, New York.CrossRefGoogle Scholar
Wirth, R. (2004) Focused Ion Beam (FIB): A novel technology for advanced application of micro- and nanoanalysis in geosciences and applied mineralogy. European Journal of Mineralogy, 16, 863876.CrossRefGoogle Scholar
Yada, T., Stadermann, F. J., Floss, C., Zinner, E., Pillinger, C. T., Graham, G. A., Bradley, I. P., Dai, Z., Nakamura, T., Noguchi, T. and Bernas, M. (2005) Discovery of abundant presolar silicates in subgroups of Antarctic micrometeorites. Lunar and Planetary Science Conference, 36, Abstract 1277.Google Scholar
Zega, T. J. and Buseck, P. R. (2003) Fine-grained-rim mineralogy of the Cold Bokkeveld CL chondrite. Geochimica et Cosmochimica acta, 67, 17111721.CrossRefGoogle Scholar
Zega, T. J., Garvie, L. A. J., Dodony, I., Friedrich, H., Stroud, R. M. and Buseck, P. R. (2006) Polyhedral serpentine grains in CM chondrites. Meteoritics & Planetary Science, 41, 681688.CrossRefGoogle Scholar