Materials Science Applications
On Interfacial Microstructure Evolution in an Isothermally Exposed SiC Fiber-Reinforced Ti-17 Matrix Composite
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- 14 November 2019, pp. 18-28
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Enhancement of the Temporal Resolution of Fluorescent Signals Acquired by the Confocal Microscope
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- 02 March 2020, pp. 204-210
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Materials Science Applications
Nanoscale Visualization of Phase Transition in Melting of Sn–Bi Particles by In situ Hard X-ray Ptychographic Coherent Diffraction Imaging
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- 28 August 2020, pp. 878-885
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15th Interamerican Microscopy Congress CIASEM - SAMIC; October 1–4, 2019, Buenos Aires, Argentina
Abstract
A SEM Study Of the Electro-Reduction Of Strontium Ion On Cu Electrodes
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- 28 April 2020, pp. 5-6
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Direct Observation of the Surface Topography at High Temperature with SEM
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- 03 April 2020, pp. 397-402
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Materials Science Applications
Effect of Heat Treatment Temperature on the Spinning Structure and Properties of a Cu–Sn Alloy
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- 22 November 2019, pp. 29-35
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Software and Instrumentation
A Comparison of a Direct Electron Detector and a High-Speed Video Camera for a Scanning Precession Electron Diffraction Phase and Orientation Mapping
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- 01 September 2020, pp. 1110-1116
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Locally Condensed Water as a Solution for In Situ Wet Corrosion Electron Microscopy
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- 13 February 2020, pp. 211-219
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Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Machine Learning for Phase Retrieval from 4D-STEM Data
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- 28 July 2020, pp. 8-9
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Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part I: Data Acquisition, Live Processing, and Storage
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- 06 July 2020, pp. 653-666
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Materials Science Applications
Dynamic Precipitation, Dynamic Recrystallization, and Texture Evolution of Mg–5Zn Alloy Sheets with Trace Ca and Sr Additions
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- 12 October 2020, pp. 886-894
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15th Interamerican Microscopy Congress CIASEM - SAMIC; October 1–4, 2019, Buenos Aires, Argentina
Abstract
Accuracy and Precision in the EDS-TEM Matrix and Precipitate Quantification in Zr-0.85Nb-0.20Ta Alloy
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- 28 April 2020, pp. 7-8
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Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
High Throughput Crystal Structure Classification
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- 28 July 2020, pp. 10-12
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Software and Instrumentation
Sparse Scanning Electron Microscopy Data Acquisition and Deep Neural Networks for Automated Segmentation in Connectomics
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- 07 April 2020, pp. 403-412
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Materials Science Applications
Atom Probe Tomography Characterization of Dopant Distributions in Si FinFET: Challenges and Solutions
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- 22 November 2019, pp. 36-45
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Ultra-Fast Electron Microscopic Imaging of Single Molecules With a Direct Electron Detection Camera and Noise Reduction
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- 20 July 2020, pp. 667-675
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Versatile Homebuilt Gas Feed and Analysis System for Operando TEM of Catalysts at Work
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- 02 March 2020, pp. 220-228
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15th Interamerican Microscopy Congress CIASEM - SAMIC; October 1–4, 2019, Buenos Aires, Argentina
Abstract
Adaptive Optical System for Photothermal Microscopy
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- 28 April 2020, pp. 9-10
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Materials Science Applications
Correction of Secondary Fluorescence Across Phase Boundaries in Electron Probe Microanalysis of Mineral Inclusions
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- 03 September 2020, pp. 895-905
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Properties of Dipole-Mode Vibrational Energy Losses Recorded From a TEM Specimen
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- 01 September 2020, pp. 1117-1123
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