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A Comparison of a Direct Electron Detector and a High-Speed Video Camera for a Scanning Precession Electron Diffraction Phase and Orientation Mapping

Published online by Cambridge University Press:  01 September 2020

Ian MacLaren Open the ORCID record for Ian MacLaren [Opens in a new window] ,
Enrique Frutos-Myro ,
Damien McGrouther ,
Sam McFadzean ,
Jon Karl Weiss ,
Doug Cosart ,
Joaquim Portillo ,
Alan Robins ,
Stavros Nicolopoulos  and
Eduardo Nebot del Busto
...Show all authors
Ian MacLaren*
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK
Enrique Frutos-Myro
Affiliation:
School of Engineering, University of Glasgow, Glasgow G12 8QQ, UK
Damien McGrouther
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK
Sam McFadzean
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK
Jon Karl Weiss
Affiliation:
NanoMEGAS USA, 1095 W Rio Salado Parkway, Suite 110, Tempe, AZ 85281, USA
Doug Cosart
Affiliation:
NanoMEGAS USA, 1095 W Rio Salado Parkway, Suite 110, Tempe, AZ 85281, USA
Joaquim Portillo
Affiliation:
NanoMEGAS SPRL, Bd.Edmond Machtens 79 bte 22, 1080 Brussels, Belgium Centres Cientifics i Tecnologics, Universitat de Barcelona, Sole i Sabaris, 1-3, Barcelona 08028, Spain
Alan Robins
Affiliation:
NanoMEGAS SPRL, Bd.Edmond Machtens 79 bte 22, 1080 Brussels, Belgium
Stavros Nicolopoulos
Affiliation:
NanoMEGAS SPRL, Bd.Edmond Machtens 79 bte 22, 1080 Brussels, Belgium
Eduardo Nebot del Busto
Affiliation:
Quantum Detectors Ltd., R104, RAL, Harwell, Oxford OX11 0QX, UK
Richard Skogeby
Affiliation:
Quantum Detectors Ltd., R104, RAL, Harwell, Oxford OX11 0QX, UK
*
*Author for correspondence: Ian MacLaren, E-mail: [email protected]
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Abstract

A scanning precession electron diffraction system has been integrated with a direct electron detector to allow the collection of improved quality diffraction patterns. This has been used on a two-phase α–β titanium alloy (Timetal® 575) for phase and orientation mapping using an existing pattern-matching algorithm and has been compared to the commonly used detector system, which consisted of a high-speed video-camera imaging the small phosphor focusing screen. Noise is appreciably lower with the direct electron detector, and this is especially noticeable further from the diffraction pattern center where the real electron scattering is reduced and both diffraction spots and inelastic scattering between spots are weaker. The results for orientation mapping are a significant improvement in phase and orientation indexing reliability, especially of fine nanoscale laths of α-Ti, where the weak diffracted signal is rather lost in the noise for the optically coupled camera. This was done at a dose of ~19 e−/Å2, and there is clearly a prospect for reducing the current further while still producing indexable patterns. This opens the way for precession diffraction phase and orientation mapping of radiation-sensitive crystalline materials.

Keywords

electron crystallographyelectron microscopydirect electron detectorscrystallographic orientation mappingprecession electron diffraction
Type
Software and Instrumentation
Information
Microscopy and Microanalysis , Volume 26 , Issue 6 , December 2020 , pp. 1110 - 1116
Copyright
Copyright © Microscopy Society of America 2020

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