Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

15 Years of Focused Ion Beams at M & M

Abstract

Integration of Cryo-FIB-SEM Imaging into Dynamic Thermo-fluidic Experimentation: Applications to Multifunctional Nanoengineered Surface Design

Ga+ Ions and Xe+ Plasma: Complementary FIBs for Resin-Embedded Life Science Sample Analyses

Xenon Focused Ion Beam in the Shape Memory Alloys Investigation - The Case of NiTi and CoNiAl

Focused Helium Ion Beam Nanomachining of Thin Membranes vs. Bulk Substrates

Advantages of Helium and Neon Ion Beams for Intelligent Imaging

Ex situ Lift Out of PFIB Prepared TEM Specimens

In-Situ Quantification of TEM Lamella Thickness and Ga Implantation in the FIB

Site Specific TEM Specimen Preparation for Characterization of Extended Defects in 4H-SiC Epilayers

Ga+ FIB Milling and Measurement of FIB Damage in Sapphire

Blunted Tungsten Tip Cleaning by Nitrogen Gas Etching at Room Temperature without Tip Heating and Cooling

A Focused Ion Beam Specimen Preparation Method to Minimize Gallium Ion Concentration in Copper Atom-Probe Tomography Specimen Tips

FIB Preparation of Bone-Implant Interfaces for Correlative On-Axis Rotation Electron Tomography and Atom Probe Tomography

3D Atom Probe Microscopy Sample Preparation by Using L-Shape FIB-SEM-Ar Triple Beam

Efficient Diffractive Phase Optics for Electrons

Focused Ion Beam Direct Write Nanofabrication of Surface Phonon Polariton Metamaterial Nanostructures

In-Situ Investigations of Individual Nanowires within a FIB/SEM System

3D Analytical TEM Approach to Effectively Characterize 3D-FinFET Device Features in Semiconductor Wafer-foundries

Gas-Mediated Electron Beam Induced Etching - From Fundamental Physics to Device Fabrication

An Improved Specimen Preparation of Porous Powder Materials for Transmission Electron Microscopy

Super Resolution Microscopic Methods

Abstract

Coherent Diffraction Imaging

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

15 Years of Focused Ion Beams at M & M

Abstract

Super Resolution Microscopic Methods

Abstract