Microscopy and Microanalysis: Volume 20 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Electron Holography at the Atomic Scale and the Nanoscale

Abstract

Characterization of Metallic and Bimetallic Nanoparticles by Off-Axis Electron Holography

Propagation of Free Electrons Carrying Orbital Angular Momentum Through Magnetic Lenses

15 Years of Focused Ion Beams at M & M

Abstract

FIB Applications: A Historical Perspective

Optimization of High Current Xenon Plasma Ion Beams for Applications in Semiconductor Failure Analysis and Development

High Speed TEM Sample Preparation by Xe FIB

He+ Ions for 3D Imaging

Monte Carlo Modeling of Ion Beam Induced Secondary Electrons

1970-2014: From Space Ion Thrusters to Nano-Tools

Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS

Optimized Detection Limits in FIB-SIMS by Using Reactive Gas Flooding and High Performance Mass Spectrometers

Ion-induced Auger Electron Spectroscopy as a Potential Route to Chemical Focused-Ion Beam Tomography

Advanced Ion Source Technology for High Resolution and Stable FIB Nanofabrication employing Gallium and new Ion Species

Application of a FIB/SEM to Study the Occlusion of Dentine Tubules from a Calcium Sodium Phosphosilicate Bioactive Glass (Novamin)

From Oil Field to Ptychography: Applications of FIB SEM in NanoGeoScience

3D Nanoscale Analysis Using Focused Ion Beam Tomography of Carbonaceous Nanoglobules in Matrix Materials from the Tagish Lake Meterorite

In situ FIB-SEM Experimentation: from Nanoscale Wetting to Nanofabrication of Gallium-based Liquid Metals

15 Years of Characterizing Titanium Alloys' Microstructure by DBFIB

FIB Lift Out of Columnar Carbon Structures

Advancing Materials Characterization in the FIB-SEM with Transmission Kikuchi Diffraction

Cryo-FIB Minimizes Ga+ Milling Artifacts in Sn

Microscopy and Microanalysis

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Volume 20 - August 2014

Advances in Instrumentation Symposia

Electron Holography at the Atomic Scale and the Nanoscale

Abstract

15 Years of Focused Ion Beams at M & M

Abstract