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In-Situ Investigations of Individual Nanowires within a FIB/SEM System

Published online by Cambridge University Press:  27 August 2014

Markus Löffler ,
Sayanti Banerjee ,
Jens Trommer ,
Andre Heinzig ,
Walter Weber  and
Ehrenfried Zschech
Markus Löffler
Affiliation:
Technical University Dresden, Dresden Center for Nanoanalysis, Dresden, Germany
Sayanti Banerjee
Affiliation:
Technical University Dresden, Dresden Center for Nanoanalysis, Dresden, Germany
Jens Trommer
Affiliation:
NaMLab gGmbH, Dresden, Germany
Andre Heinzig
Affiliation:
Technical University Dresden, Chair for Nanoelectronic Materials, Center for Advancing Electronics Dresden, Dresden, Germany
Walter Weber
Affiliation:
NaMLab gGmbH, Dresden, Germany
Ehrenfried Zschech
Affiliation:
Technical University Dresden, Dresden Center for Nanoanalysis, Dresden, Germany Fraunhofer Institute for Ceramic Technologies and Systems – Material Diagnostics, Dresden, Germany

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 360 - 361
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Heinzig, A., et al., Nano Lett. 13 (2013), p. 4176.Google Scholar
[2] Banerjee, S., et al., Electron Microscopy Conference, Krakow, Sept (2014.Google Scholar
[3] Heinzig, A., et al., Nano Lett, 12 (2012). p. 119.Google Scholar
[4] Two of the authors (M. L., E. Z.) acknowledge funding from the German Federal Ministry for Education and Research (BMBF). This work is partly supported by the German Research Foundation (DFG) within the Cluster of Excellence ‘Center for Advancing Electronics Dresden’.Google Scholar