Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Physical Science Symposia

Dr. Gareth Thomas Symposium: Materials Solutions through Microscopy

Abstract

Nanomagnetic Materials in Medicine: Recent Developments in Imaging, Diagnostics and Therapy.

A Grain Boundary “TTT” – “Tribute to Thomas”!

Observation of a Metastable Cu Phase Formed at a Crystalline Si / Liquid Al-Alloy Interface in an Al-Cu-Mg-Si Alloy

Impact of Analytical Electron Microscopy in Advancing Materials Technology in the Refining and Petrochemical Industry

Contributions to High-Resolution Electron Microscopy by Gareth Thomas' NCEM

Antiphase Ordered Domains and Optical Diffraction for Copper-Gold and Samarium-doped Ceria: Reflections on Gareth Thomas

In situStudy of the Order-Disorder Transformation in Lithium Ferrite

Molecular Biomimetics vs Materials Science

Pulsed Plasma Surface Modifications (PPSM) from an Industrial Perspective. Pico-Technology, Nano-Structures and Novel Structures with Unique Properties

Observation of Polar Vortices in Oxide Superlattices

Using Energy-Filtered TEM to Solve Practical Materials Problems with Inspirations from Gareth Thomas

Electron Microscopy of Morphed Graphene Nanostructures Synthesized by Mechanical Milling

Low Dose Electron Microscopy of Cobalt Oxide Heterostructures, the Genuine Atomic Structure and Dose Limit

STEM Video of Electronically-Driven Metal-Insulator Transitions in Nanoscale NbO2Devices

TEM Analysis of InGaAs/GaAs Quantum Well-Quantum Dot Structures for Optoelectronics Applications

Understanding of Inverse Coarsening of γ' precipitates in Ni-base Superalloys

Quantitative Dark-Field Transmission Electron Microscopy of the Microstructure Evolution in a 2618A Aluminum Alloy During Ageing

Further Development of an Environmental HVTEM for Reaction Science by a New Non-exposure Transfer Holder

The Role of Grain Boundary Dislocations in the Segregation-Induced Grain Boundary Embrittlement of Copper by Bismuth

Characterizing Atomic Ordering in Intermetallic Compounds Using X-ray Energy Dispersive Spectroscopy in an Aberration-Corrected (S)TEM

Microscopy and Microanalysis

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Volume 22 - February 2016

Physical Science Symposia

Dr. Gareth Thomas Symposium: Materials Solutions through Microscopy

Abstract