Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Hubbard, William A.
Joshi, Toyanath
Mecklenburg, Matthew
Zutter, Brian
Borisov, Pavel
Lederman, David
and
Regan, B. C.
2017.
STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2.
Microscopy and Microanalysis,
Vol. 23,
Issue. S1,
p.
1428.
Joshi, Toyanath
Borisov, Pavel
and
Lederman, David
2018.
Structural and electrical characterization of polycrystalline NbO2 thin film vertical devices grown on TiN-coated SiO2/Si substrates.
Journal of Applied Physics,
Vol. 124,
Issue. 11,