Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-28T18:43:48.506Z Has data issue: false hasContentIssue false
  • English
  • Français

Contributions to High-Resolution Electron Microscopy by Gareth Thomas' NCEM

Published online by Cambridge University Press:  25 July 2016

Michael A. O’Keefe

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1236 - 1237
Copyright
© Microscopy Society of America 2016 

References

References:

[1] O'Keefe, M.A., Buseck, P.R. & Iijima, S. Nature 274 (1978). p. 322–324.CrossRefGoogle Scholar
[2] O'Keefe, M.A. 45th Ann. Proc EMSA. Baltimore, Maryland (1987). p. 364–365.Google Scholar
[3] O'Keefe, Michael A. & Kilaas, Roar (1989). < http://www.osti.gov/scitech/servlets/purl/5966936 >..' href=https://scholar.google.com/scholar?q=[3]+O'Keefe,+Michael+A.+&+Kilaas,+Roar+(1989).+<+http://www.osti.gov/scitech/servlets/purl/5966936+>.>Google Scholar
[4] Rai, R.S., O'Keefe, M.A. & Thomas, G. 43rd Ann. Proc. EMSA. Louisville, KY (1985). p. 372–373.Google Scholar
[5] Epicier, T., O'Keefe, M.A. & Thomas, G. Acta Cryst A46 (1990). p. 948–962.Google Scholar
[6] Radmilovic, V., O'Keefe, M. A. & Thomas, G. Electron Microscopy 2 (1992). p. 449–450.Google Scholar
[7] Downing, K.H., Meisheng, Hu, Wenk, Hans-Rudolf & O'Keefe, M.A. Nature 348 (1990). p. 525–528.Google Scholar
[8] Wenk, H.-R., Downing, K.H., Meisheng, Hu & O'Keefe, M.A. Acta Cryst A48 (1992). p. 700–716.Google Scholar
[9] O'Keefe, Michael A. (1992). < http://www.osti.gov/scitech/servlets/purl/6709988>..' href=https://scholar.google.com/scholar?q=[9]+O'Keefe,+Michael+A.+(1992).+<+http://www.osti.gov/scitech/servlets/purl/6709988>.>Google Scholar
[10] O’Keefe, M.A., et al., Ultramicroscopy 89 (2001) 4, p. 215–241.Google Scholar
[11] Wang, Y.C., et al., Microscopy & Microanalysis 5 (1999) 2, 822–823.CrossRefGoogle Scholar
[12] O’Keefe, M.A., Allard, L.F. & Blom, D.A. J. Electron Microscopy 54(3 (2005) 169–180.Google Scholar
[13] O’Keefe, M.A., Nelson, E.C., Wang, Y.C. & Thust, A. Phil. Mag. B 81 (2001) 11, p. 1861–1878.Google Scholar
[14] O’Keefe, Michael A. Ultramicroscopy 108 (2008). p. 196–209. doi:101016/j.ultramic.2007.07.009.Google Scholar
[15] Shao-Horn, Yang, et al., Nature Materials 2 (2003). p. 464–467.Google Scholar