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Volume 12 - August 2006

Contents

Page 49 of 50

Atom Probe Field Ion Microscopy

Abstract

  • Temporal Evolution of GP Zones in an Al-Ag Alloy

  • EA Marquis, NB Bartelt, F Leonard
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1724-1725
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • The New Laser assisted Wide Angle Tomographic Atom Probe

  • L Renaud, P Monsallut, P Benard, P Saliot, G Da Costa, F Vurpillot, B Deconihout
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1726-1727
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Atomic-scale Chemical Analyses of Niobium for Superconducting Radio-Frequency Cavities

  • KE Yoon, DN Seidman, P Bauer, C Boffo, J Norem
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1728-1729
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Instrumentation Developments in Atom Probe Tomography: Applications in Semiconductor Research

  • J Bunton, D Lenz, J Olson, K Thompson, R Ulfig, D Larson, T Kelly
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1730-1731
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Techniques for the Analysis of Clusters and Aggregations within Atom Probe Tomography

  • L Stephenson, M Moody, S Ringer
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1732-1733
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Investigations of Dopant Clustering in Si via Radial Distribution Function

  • K Thompson, G Brian, SS A Gerstl, J Sebastian
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1734-1735
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Minimization of Ga Induced FIB Damage Using Low Energy Clean-up

  • K Thompson, B Gorman, D Larson, B van Leer, L Hong
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1736-1737
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Site-specific Specimen Preparation Technique for Atom Probe Analysis of Grain Boundaries

  • D Lawrence, K Thompson, DJ Larson
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1740-1741
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Site-specific Lift Out Sample Preparation Technique for Atom Probe Analysis

  • D Lawrence, K Thompson, DJ Larson, B Gorman
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1742-1743
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Atom-Probe Analyses of Carbide-Containing Steels—Comparison of Laser- and Voltage-Pulsed Results

  • J Sebastian, D Isheim, D Seidman
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1744-1745
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Measuring the Roughness of Buried Interfaces in Nanostructures by Local Electrode Atom Probe (LEAP®) Analysis

  • RW O'Neill, DJ Larson, K Thompson, TC Kunicki, B Geiser
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1746-1747
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • An Automatic Electropolishing System for Needle-Shaped Specimens

  • S Kostrna, J Peterman, T Prosa, S Wiener, D Larson, T Kelly
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1750-1751
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Atom Probe Tomography of Al-Cu Precipitation in an Al-5 at.%Cu Thin Film

  • C Srivastava, G Thompson, D Reinhard, J Sebastian, T Prosa, D Larson, Z Reddy, S Gupta, W Butler, M Weaver
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1752-1753
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Main Platform Session: Optical Methods

Abstract

  • Introduction to Optical Microscopy-Objectives

  • J Mansbach
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1754-1755
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Introduction to Confocal Microscopy

  • J Drazba
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1756-1757
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Optical Instrumentation

Abstract

  • Double Optical Tweezers for 3D Photonic Force Measurements

  • AA R Neves, A Fontes, WL Moreira, AA de Thomaz, DB Almeida, LC Barbosa, CL Cesar
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1760-1761
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Exact Partial Wave Expansion for an Arbitrary Optical Beams

  • AA R Neves, A Fontes, WL Moreira, AA de Thomaz, DB Almeida, LC Barbosa, CL Cesar
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1762-1763
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 49 of 50