Hostname: page-component-788cddb947-2s2w2 Total loading time: 0 Render date: 2024-10-17T15:24:35.292Z Has data issue: false hasContentIssue false
  • English
  • Français

Site-specific Lift Out Sample Preparation Technique for Atom Probe Analysis

Published online by Cambridge University Press:  31 July 2006

D Lawrence ,
K Thompson ,
DJ Larson  and
B Gorman
D Lawrence
Affiliation:
Imago Scientific Instruments
K Thompson
Affiliation:
Imago Scientific Instruments
DJ Larson
Affiliation:
Imago Scientific Instruments
B Gorman
Affiliation:
University of North Texas

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1742 - 1743
Copyright
© 2006 Microscopy Society of America