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Volume 12 - August 2006

Contents

Page 45 of 50

Tomography in Biological and Materials Sciences

Abstract

  • High Resolution X-Ray UltraMicroscopy and Tomographic Reconstruction of Micro-Craters Preserved in Metallic Foils

  • J Sheffield-Parker, GG Graham, LA Brownlow, AT Kearsley
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1560-1561
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • 3D Imaging with Single Atom Sensitivity using Confocal STEM

  • K van Benthem, N de Jonge, AY Borisevich, MP Oxley, SJ Pennycook
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1562-1563
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Impact of Sample Thickness on Atomic Resolution Tomography by HAADF-STEM

  • DO Klenov, S Stemmer
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1564-1565
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Atomic Resolution Electron Tomography Based on Discrete Mathematics

  • JR Jinschek, KJ Batenburg, HA Calderon, R Kilaas, V Radmilovic, C Kisielowski
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1566-1567
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • 3D Imaging of Nanomaterials by Discrete Tomography

  • KJ Batenburg, U Kaiser, C Kübel
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1568-1569
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Chemical and Structural Investigation of Internal Domains of Needle-Like Ti3AlC Carbide Precipitates in gamma-TiAl with 3-D Atom Probe Tomography

  • SA Gerstl, D Seidman
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1570-1571
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Incorporating Prior Knowledge for Atomic Resolution Tomography

  • KJ Batenburg, JR Jinschek, HA Calderon, C Kisielowski
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1572-1573
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Depth-related Contrast in Aberration-Corrected Confocal STEM

  • N de Jonge, AR Lupini, K van Benthem, AY Borisevich, SJ Pennycook
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1574-1575
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Electron Tomography of ZnO Nanoscale Tetrapods

  • S Mehraeen, J Evans, S Kim, JS Lee, N Browning
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1576-1577
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Tomography of a Polymer/Carbon-Nanotube Matrix Composite

  • GB Thompson, M Abdalla, D Dean
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1578-1579
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • TEM Analysis of Aluminum Anodization Layers – Cryo-EFTEM and Electron Tomography

  • C Kuebel, S Dieckhoff
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1580-1581
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Beam Spreading and Spatial Resolution in Thick Organic Specimens

  • J Hyun, P Ercius, DA Muller
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1582-1583
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Ab initio Structure Determination Using Orthoaxial Single Particle Projections

  • PR Baldwin, PA Penczek
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1584-1585
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Comparative Analysis of Viral Particles Using Different Electron Microscopy Methodologies

  • P Soonsawad, S Ma, DG Morgan, K Hultenby, L Haag, S-R Wu, K Forsell, H Garoff, CE Hsieh, M Marko, RH Cheng
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1586-1587
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Gridless TEM Supports Promise Greater Experimental Throughput

  • PS Hollis, FR Powell
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1590-1591
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • An SEM-based X-ray Microtomography System

  • PR Miller, SC Mayo, T Gureyev, SW Wilkins, J Sheffield-Parker
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1592-1593
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Intermediate Magnification Imaging System for Whole Organs/Organisms.

  • R Cole, J Turner
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1594-1595
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • 3-Dimentional Observation of Lamellar Structure of a High Density Polyethylene Using Transmission Electron Micro-tomography

  • H Matsumoto, H Sano
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1596-1597
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

IMS Henry Clifton Sorby Award and Lecture

Abstract

  • Forty Three Years in Metallography - Changes and Challenges

  • AO Benscoter
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1598-1599
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 45 of 50