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Volume 12 - August 2006

Contents

Page 24 of 50

Microscopy in Nanoscience and Nanotechnology

Abstract

  • Analytical XTEM Study of Ir/InAlAs Interfacial Reaction for InP-based High Electron Mobility Transistors (HEMTs) Gate Technology

  • L Wang, W Zhao, I Adesida
  • Published online by Cambridge University Press:
    31 July 2006, pp. 718-719
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Self-hardening of Nanocrystalline Ti-B-N Thin Films

  • JG Wen, PH Mayrhofer, C Mitterer, JE Greene, I Petrov
  • Published online by Cambridge University Press:
    31 July 2006, pp. 720-721
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • The reaction interface between MgO and Al2O3

  • C Lei
  • Published online by Cambridge University Press:
    31 July 2006, pp. 722-723
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • TEM Studies of Oxides Formed on Nickel-Based Alloys in Secondary Side Water

  • C Andrei, S Ramamurthy, J Yu, M Phaneuf, G Botton
  • Published online by Cambridge University Press:
    31 July 2006, pp. 724-725
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Elemental Quantification of Hafnium–Silicates by Electron Energy Loss Spectroscopy

  • M Clark, B Foran, C Gondran, P Lysaght
  • Published online by Cambridge University Press:
    31 July 2006, pp. 726-727
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • A TEM Study on the Doping Behavior of Calcium in LaCoO3

  • M Chi, S Pathak, N Browning, N Orlovskaya
  • Published online by Cambridge University Press:
    31 July 2006, pp. 728-729
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Electron Microscopy Study of Zinc Silicate Coated Diatom Frustules

  • T Gutu, D-H Lee, C Jeffryes, GL Rorrer, C-H Chang, J Jiao
  • Published online by Cambridge University Press:
    31 July 2006, pp. 730-731
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Microstructure Investigation of Hydrous Ruthenium Oxides Coatings with Carbon-Nanotube Additive by Cathodic Deposition Method

  • Y Lin, H-S Hwang
  • Published online by Cambridge University Press:
    31 July 2006, pp. 732-733
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Analysis of Contamination in Nanoscaled Film Structures with TEM & XPS

  • QJ Huang, KM Paing, CM Lilley
  • Published online by Cambridge University Press:
    31 July 2006, pp. 734-735
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Nanostructure Obtained by Sol-gel Acrylamide Polymerization in Y-V-O System

  • G Herrera Pérez, E Chavira, J Jiménez-Mier, L Baños, J Guzmán, C Flores
  • Published online by Cambridge University Press:
    31 July 2006, pp. 736-737
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Formation of Nanocrystalline Zeolites in Geopolymer Gels

  • JL Bell, P Sarin, WM Kriven
  • Published online by Cambridge University Press:
    31 July 2006, pp. 738-739
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Microstructural Study of Metastable ZrO2-Al2O3 and ZrO2-Y2O3-Al2O3 Coatings Deposited Using Solution-Precursor Plasma Spray (SPPS) Process

  • AL Vasiliev, NP Padture
  • Published online by Cambridge University Press:
    31 July 2006, pp. 742-743
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Characterization of Porous GaN-Nanostructured Rods by TEM Techniques

  • J-G Zheng, S Ding, M Wu
  • Published online by Cambridge University Press:
    31 July 2006, pp. 746-747
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Electronic Structure and Luminescence Properties of Er Doped ZnO Nanowires

  • J Wang, SK Hark, Q Li
  • Published online by Cambridge University Press:
    31 July 2006, pp. 748-749
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Semiconductors

Abstract

  • A Study on Phase Separation in InGaN/GaN Multi-quantum Wells

  • MY Kim, HJ Lee, YJ Yoon, Y Yoon, SH Park, BK Kim, JW Han
  • Published online by Cambridge University Press:
    31 July 2006, pp. 750-751
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Application of an Improved Mathematical Model to the Analysis of Cross-Sectional EBIC of GaN-Based LEDs

  • CM Parish, CL Progl, AD Batchelor, PE Russell
  • Published online by Cambridge University Press:
    31 July 2006, pp. 752-753
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Effect of the Growth Temperature in the Composition Fluctuation of GaInNAs/GaAs Quantum Wells

  • M Herrera, Q Ramasse, D González, R García, N Browning, M Hopkinson, HY Liu
  • Published online by Cambridge University Press:
    31 July 2006, pp. 754-755
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Transverse Bragg Gratings and Lasers Fabricated by Electron Beam Lithography and Reactive Ion Etching

  • G DeRose, L Zhu, A Scherer
  • Published online by Cambridge University Press:
    31 July 2006, pp. 756-757
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Page 24 of 50