Microscopy and Microanalysis: Volume 10 -

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Volume 10 - August 2004

Contents

Page 24 of 48

Characterization and Performance of Advanced Coatings and Thin Films

Research Article

Nanoindentation and X-ray Diffraction Study of Sputtered TiCN Coatings
Surendra Gupta, David Glocker, Mark Romach
Published online by Cambridge University Press:

01 August 2004, pp. 602-603
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Microstructural Characterization of Transparent Conducting Film CdO on MgO (100) by TEM
Jian-Guo Zheng, Andrew Metz, Vinayak P Dravid, Tobin Marks
Published online by Cambridge University Press:

01 August 2004, pp. 604-605
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Spatially-resolved EELS and EDS Analysis of HfOxNy Gate Dielectrics Deposited by MOCVD using [(C2H5)2N]4Hf with NO and O2
X Wu, M. Couillard, M.-S. Lee, J.-H. Chen, G.A. Botton, D. Landheer, Z.-H. Lu, W.-T. Ng, T.-S. Chao
Published online by Cambridge University Press:

01 August 2004, pp. 606-607
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Cathodoluminescence Imaging and Spectroscopy of Tellurium Doped Group IIA Sulfide Thin Films for Solid State Ultraviolet Emitters
Robert Lee, Jeff Hoekstra, James M Fitz-Gerald, Jason D Fowlkes, Philip D Rack
Published online by Cambridge University Press:

01 August 2004, pp. 608-609
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization and Application of Semiconductor Thin Films Deposited by Chemical Bath Deposition
Chih-hung Chang, Yu-Jen Chang, Doo-Hyoung Lee, Si-Ok Ryu, Tae-Jin Lee
Published online by Cambridge University Press:

01 August 2004, pp. 610-611
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization of Boron Segregation in CoCrPtB Longitudinal Magnetic Recording Media
James Wittig, James Bentley, Neal D Evans
Published online by Cambridge University Press:

01 August 2004, pp. 612-613
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Mechanisms for the Behaviour of Amorphous Carbon Films During Annealing
D.G. McCulloch, J.L. Peng, D.R. McKenzie, S.P. Lau, D. Sheeja, B.K. Tay
Published online by Cambridge University Press:

01 August 2004, pp. 614-615
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Microstructural Evaluation of Degradation Mechanisms in Thermally Treated TaSiN Diffusion Barriers for Cu Interconnects
Hans-Juergen Engelmann, RenË Huebner, Michael Hecker, Norbert Mattern, Christian Wenzel, Ehrenfried Zschech, Klaus Wetzig
Published online by Cambridge University Press:

01 August 2004, pp. 616-617
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization of Coatings for Hydrogen Permeation Resistance
Paul Korinko
Published online by Cambridge University Press:

01 August 2004, pp. 618-619
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Fabrication And Characterization Of Diffusion Barriers For CuSiC Metal Matrix Composites: The Thermal Management Materials for Next Generation Power Electronics
Pradeep Paul, Changmo Sung, Glenn Sundberg
Published online by Cambridge University Press:

01 August 2004, pp. 620-621
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization of an Oxidized Heat Shield
Paul Korinko
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01 August 2004, pp. 622-623
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Organic Surface Monolayer Imaging and Quantification in Mineral Systems: A Multitechnique Approach
G.C. Van Leerdam, F.A. Buijtenhuijs, J.W.G. Mahy
Published online by Cambridge University Press:

01 August 2004, pp. 624-625
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Surface Structural Characterization of Antiblock Films Containing Erucamide
John Catino, John Gardiner
Published online by Cambridge University Press:

01 August 2004, pp. 626-627
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Welding Strength of Tin Coated Optical Fibers
Yuli Lin, Kung-Yu Fan
Published online by Cambridge University Press:

01 August 2004, pp. 628-629
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Welding Strength of Silver Coated Fibers
Yuli Lin, Chu-Hua Shen
Published online by Cambridge University Press:

01 August 2004, pp. 630-631
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Study of Manganese Doped Tin Oxide Films Deposited by Spray Pyrolysis
Karla Ochoa-Rojo, Francisco Paraguay-Delgado, Mario Miki-Yoshida
Published online by Cambridge University Press:

01 August 2004, pp. 632-633
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Morphology of Silica Coatings on Pigmentary Titania
Mark Watson
Published online by Cambridge University Press:

01 August 2004, pp. 634-635
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Changes in Fe L23 White Lines Intensities in Ti Doped Hematite Thin Fims
Veronica Gallegos-Orozco , Francisco Paraguay-Delgado, Roberto Martinez-Sanchez, Francisco Espinosa-Magana
Published online by Cambridge University Press:

01 August 2004, pp. 636-637
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Influence of the N2 on TiN Thin Film Grown by PLD
Cesar Gonzalez-Valenzuela, Jose Alberto Duarte-Moller, Wencel De la Cruz, Felipe Castillon Barraza, J. Antonio Diaz, Leonel Cota Araiza
Published online by Cambridge University Press:

01 August 2004, pp. 638-639
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

TEM and EXELFS Characterization of Gold Nanoparticles Produced by Salt Reduction, Deposited on Si Substrates by the Spray Pyrolysis Technique
Jose Alberto Duarte-Moller, Iraomar García-Herrera
Published online by Cambridge University Press:

01 August 2004, pp. 640-641
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 24 of 48

Microscopy and Microanalysis

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Volume 10 - August 2004

Characterization and Performance of Advanced Coatings and Thin Films

Research Article

Nanoindentation and X-ray Diffraction Study of Sputtered TiCN Coatings

Microstructural Characterization of Transparent Conducting Film CdO on MgO (100) by TEM

Spatially-resolved EELS and EDS Analysis of HfOxNy Gate Dielectrics Deposited by MOCVD using [(C2H5)2N]4Hf with NO and O2

Cathodoluminescence Imaging and Spectroscopy of Tellurium Doped Group IIA Sulfide Thin Films for Solid State Ultraviolet Emitters

Characterization and Application of Semiconductor Thin Films Deposited by Chemical Bath Deposition

Characterization of Boron Segregation in CoCrPtB Longitudinal Magnetic Recording Media

Mechanisms for the Behaviour of Amorphous Carbon Films During Annealing

Microstructural Evaluation of Degradation Mechanisms in Thermally Treated TaSiN Diffusion Barriers for Cu Interconnects

Characterization of Coatings for Hydrogen Permeation Resistance

Fabrication And Characterization Of Diffusion Barriers For CuSiC Metal Matrix Composites: The Thermal Management Materials for Next Generation Power Electronics

Characterization of an Oxidized Heat Shield

Organic Surface Monolayer Imaging and Quantification in Mineral Systems: A Multitechnique Approach

Surface Structural Characterization of Antiblock Films Containing Erucamide

Welding Strength of Tin Coated Optical Fibers

Welding Strength of Silver Coated Fibers

Study of Manganese Doped Tin Oxide Films Deposited by Spray Pyrolysis

Morphology of Silica Coatings on Pigmentary Titania

Changes in Fe L23 White Lines Intensities in Ti Doped Hematite Thin Fims

Influence of the N2 on TiN Thin Film Grown by PLD

TEM and EXELFS Characterization of Gold Nanoparticles Produced by Salt Reduction, Deposited on Si Substrates by the Spray Pyrolysis Technique

Microscopy and Microanalysis

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Volume 10 - August 2004

Characterization and Performance of Advanced Coatings and Thin Films

Research Article