Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - August 2002

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Microbeam Analysis Society

Abstract

Focused Ion Beam: Much More Than a Sample Preparation Tool

Dual-beam Focused Ion Beam: A Multifunctional Tool for Nanotechnology

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Microscopical Society of Canada Soci�t� De Microscopie Du Canada

Abstract

The DualBeam FIB in a Materials Science Laboratory

Analysis of Bone Utilizing Infrared and Raman Chemical Imaging

Advances in Dual Beam TEM Sample Preparation

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Microscopy and Microanalysis 2002: Program Committee

Committee Members and Session Chairs

Abstract

Probing the Electronic Structure of Transition Metal Oxides using Electron Energy-Loss Spectroscopy

Structures and Energetics of Interfaces in Materials – Ab-initio Local-Density-Functional Theory –

Electron Energy-Loss Spectroscopy of Alternative Gate Dielectric Stacks

Development of An 0.2eV Energy Resolution Analytical Electron Microscope

Monochromized 200kV (S)TEM

EFTEM at High Magnification: Principles and Practical Applications

Understanding DNA Organization in the Nucleus By Fluorescence Microscopy and Energy Filtered Transmission Electron Microscopy

X-ray Spectrometry In The Fast Lane: An Introduction To High Speed Digital Processing Techniques And Their Application To Emerging EDS Technologies

The Development of Microcalorimeter EDS Arrays

The Latest Experiences Using A Cryogen Free Microcalorimeter Energy Dispersive X-Ray Spectrometer

A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems

Microscopy and Microanalysis

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Volume 8 - August 2002

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