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Focused Ion Beam: Much More Than a Sample Preparation Tool

Published online by Cambridge University Press:  01 August 2002

P.E. Russell ,
T.J. Stark ,
J.P. Viterelli ,
A.R. Guichard ,
J. Wang ,
K. L. Bunker ,
J.C. Gonzalez  and
D.P. Griffis
P.E. Russell
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27502-7531
T.J. Stark
Affiliation:
Materials Analytical Services, Raleigh, NC 27606
J.P. Viterelli
Affiliation:
Materials Analytical Services, Raleigh, NC 27606
A.R. Guichard
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27502-7531
J. Wang
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27502-7531
K. L. Bunker
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27502-7531
J.C. Gonzalez
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27502-7531
D.P. Griffis
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27502-7531

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 54 - 55
Copyright
Copyright © Microscopy Society of America 2002