Advances in Dual Beam TEM Sample Preparation

M.V. Moore

doi:10.1017/S1431927602101620

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Advances in Dual Beam TEM Sample Preparation

Published online by Cambridge University Press: 01 November 2002

M.V. Moore

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M.V. Moore*: Affiliation:
FEI Company, 7451 NW Evergreen Parkway, Hillsboro, OR 97124

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Information: Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 60 - 61

DOI: https://doi.org/10.1017/S1431927602101620 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2002

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Advances in Dual Beam TEM Sample Preparation

Volume 8, Issue S02
M.V. Moore ^(a1)
DOI: https://doi.org/10.1017/S1431927602101620

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Advances in Dual Beam TEM Sample Preparation

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