Microscopy and Microanalysis: Volume 14 -

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Volume 14 - August 2008

Contents

Page 35 of 48

Advances in Electron Tomography for the Physical and Biological Sciences

Research Article

Bright-Field STEM tomography of thick stained plastic sections
AA Sousa, M Hohmann-Marriott, G Zhang, RD Leapman
Published online by Cambridge University Press:

03 August 2008, pp. 1066-1067
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Identifying Individual Scaffolding Molecules in the Postsynaptic Density
X Chen, C Winters, R Azzam, V Crocker, X Li, J Galbraith, RD Leapman, TS Reese
Published online by Cambridge University Press:

03 August 2008, pp. 1068-1069
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Localizing Kinetochores in Condensin Deficient DT40 Cells Using Same Cell Correlative Confocal Light Microscopy/Electron Tomography
Y Dong, P Vagnarelli, X Meng, S Ribeiro, WC Earnshaw, BF McEwen
Published online by Cambridge University Press:

03 August 2008, pp. 1070-1071
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

New Frontiers in Cryo-electron Tomography with Zernike Phase Contrast Imaging for Transmission Electron Microscopy
B Armbruster, J Brink, H Furukawa, TC Isabell, M Kawasaki, M Kersker
Published online by Cambridge University Press:

03 August 2008, pp. 1072-1073
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Tomography for Analysis of Catalysts
R Cieslinski, C Kuebel, S Rozeveld, R Bowman
Published online by Cambridge University Press:

03 August 2008, pp. 1074-1075
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Problem Solving Using Microanalytical Techniques

Research Article

Using the Microscopy Lab As A Clearinghouse For Problem Solving In An Industrial Service Laboratory
V Woodward
Published online by Cambridge University Press:

03 August 2008, pp. 1076-1077
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Multi-Technique Approach to Understanding Phase Transformations in a Precious Metal Alloy
DF Susan, JR Michael, JT Bond, RG Stone, JM Rodelas
Published online by Cambridge University Press:

03 August 2008, pp. 1078-1079
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

What do we know about fundamental parameters for microanalysis?
DC Joy
Published online by Cambridge University Press:

03 August 2008, pp. 1080-1081
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Problem Solving in Electron-probe Microanalysis: Application of Software Tools
PK Carpenter
Published online by Cambridge University Press:

03 August 2008, pp. 1082-1083
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Milli-X-ray Fluorescence X-Ray Spectrum Imaging: Problem Solving Through Mapping on the Centimeter Scale
JM Davis, DE Newbury
Published online by Cambridge University Press:

03 August 2008, pp. 1084-1085
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Meeting microanalysis challenges using a flexible X-ray Fluorescence Microscope
Y Yokota, S Ohzawa, D Matsunaga, Y Sato, S Komatani, A Whitley
Published online by Cambridge University Press:

03 August 2008, pp. 1086-1087
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Confocal Micro X-ray Fluorescence A New Paradigm in 3D Elemental Imaging for Materials Characterization
BM Patterson, GJ Havrilla
Published online by Cambridge University Press:

03 August 2008, pp. 1088-1089
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Characterization of the Interfacial Regions of Copper-Carbon Steel Explosive Welds Using a Combination of Analytical Techniques
JP Chandler, A Manerbino, S Liu, M Kaufman
Published online by Cambridge University Press:

03 August 2008, pp. 1090-1091
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

SIMS Analysis of Xe and Kr in a High Burn-up UO2 Nuclear Fuel
CT Walker, S Brémier, S Portier, R Hasnaoui
Published online by Cambridge University Press:

03 August 2008, pp. 1092-1093
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Analysis of Pu by Virtual-standard WDS-EPMA. Results of an Interlaboratory Round-robin Test
C Merlet, X Llovet, L Aufore, S Brémier, X Deschanels, O Dugne, J Lamontagne, R Restani, C Roche, M Tribet, W Van Renterghem
Published online by Cambridge University Press:

03 August 2008, pp. 1094-1095
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Evaluation of the Significance of Secondary Fluorescence of Aluminum in a Coated Nickel Superalloy
GW Kagel, J Foroughi
Published online by Cambridge University Press:

03 August 2008, pp. 1096-1097
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

X-ray Nano-Analysis of Sub-100nm Particles Using EDS in Conjunction with SEM
S Burgess, J Holland, C Collins, S Sharp
Published online by Cambridge University Press:

03 August 2008, pp. 1098-1099
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

On the Precision of EDS Analysis with Sample Tilted at 70°
P T.-Pinard, P Hovington, H Demers, M Lagace, R Gauvin
Published online by Cambridge University Press:

03 August 2008, pp. 1100-1101
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

X-Ray Mapping of Rough Surfaces with Multiple Silicon Drift Detectors
R Anderhalt, D Redfern, A Sandborg
Published online by Cambridge University Press:

03 August 2008, pp. 1102-1103
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Practical Analysis of Micron-scale Boride and Carbide Inclusions Using an Analytical SDD Detector
C Collins, S Burgess, F Bauer, J Holland
Published online by Cambridge University Press:

03 August 2008, pp. 1104-1105
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 35 of 48

Microscopy and Microanalysis

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Volume 14 - August 2008

Advances in Electron Tomography for the Physical and Biological Sciences

Research Article

Bright-Field STEM tomography of thick stained plastic sections

Identifying Individual Scaffolding Molecules in the Postsynaptic Density

Localizing Kinetochores in Condensin Deficient DT40 Cells Using Same Cell Correlative Confocal Light Microscopy/Electron Tomography

New Frontiers in Cryo-electron Tomography with Zernike Phase Contrast Imaging for Transmission Electron Microscopy

Electron Tomography for Analysis of Catalysts

Problem Solving Using Microanalytical Techniques

Research Article

Using the Microscopy Lab As A Clearinghouse For Problem Solving In An Industrial Service Laboratory

Multi-Technique Approach to Understanding Phase Transformations in a Precious Metal Alloy

What do we know about fundamental parameters for microanalysis?

Problem Solving in Electron-probe Microanalysis: Application of Software Tools

Milli-X-ray Fluorescence X-Ray Spectrum Imaging: Problem Solving Through Mapping on the Centimeter Scale

Meeting microanalysis challenges using a flexible X-ray Fluorescence Microscope

Confocal Micro X-ray Fluorescence A New Paradigm in 3D Elemental Imaging for Materials Characterization

Characterization of the Interfacial Regions of Copper-Carbon Steel Explosive Welds Using a Combination of Analytical Techniques

SIMS Analysis of Xe and Kr in a High Burn-up UO2 Nuclear Fuel

Analysis of Pu by Virtual-standard WDS-EPMA. Results of an Interlaboratory Round-robin Test

Evaluation of the Significance of Secondary Fluorescence of Aluminum in a Coated Nickel Superalloy

X-ray Nano-Analysis of Sub-100nm Particles Using EDS in Conjunction with SEM

On the Precision of EDS Analysis with Sample Tilted at 70°

X-Ray Mapping of Rough Surfaces with Multiple Silicon Drift Detectors

Practical Analysis of Micron-scale Boride and Carbide Inclusions Using an Analytical SDD Detector

Microscopy and Microanalysis

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Volume 14 - August 2008

Advances in Electron Tomography for the Physical and Biological Sciences

Research Article

Problem Solving Using Microanalytical Techniques

Research Article