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X-ray Nano-Analysis of Sub-100nm Particles Using EDS in Conjunction with SEM

Published online by Cambridge University Press:  03 August 2008

S Burgess ,
J Holland ,
C Collins  and
S Sharp
S Burgess
Affiliation:
Oxford Instruments NanoAnalysis, United Kingdom
J Holland
Affiliation:
Oxford Instruments NanoAnalysis, United Kingdom
C Collins
Affiliation:
Oxford Instruments NanoAnalysis, United Kingdom
S Sharp
Affiliation:
Oxford Instruments NanoAnalysis, United Kingdom
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1098 - 1099
Copyright
© 2008 Microscopy Society of America

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