Microscopy and Microanalysis: Volume 14 -

< Back to all issues

Volume 14 - August 2008

Contents

Page 37 of 48

Problem Solving Using Microanalytical Techniques

Research Article

Analytical TEM of Nb3Sn Multifilament Superconductor Wires
M Cantoni, V Abächerli, D Uglietti, B Seeber, R Flükiger
Published online by Cambridge University Press:

03 August 2008, pp. 1146-1147
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

EMCD in the TEM – Optimization of signal acquisition and data evaluation
H Lidbaum, J Rusz, A Liebig, B Hjörvarsson, PM Oppeneer, E Coronel, O Eriksson, K Leifer
Published online by Cambridge University Press:

03 August 2008, pp. 1148-1149
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts

Research Article

Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts
PK Carpenter
Published online by Cambridge University Press:

03 August 2008, pp. 1150-1151
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

40 Years of Energy Dispersive X-ray Spectrometry

Research Article

Celebrating 40 years of energy dispersive X-ray spectrometry in electron probe microanalysis (EPMA)
K Keil, R Fitzgerald, KFJ Heinrich
Published online by Cambridge University Press:

03 August 2008, pp. 1152-1153
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

35 Years of EDS Software: the more things change, the more they stay the same
F Schamber
Published online by Cambridge University Press:

03 August 2008, pp. 1154-1155
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

SDDs - Silicon Detectors for EDS with a Performance at the Theoretical Limit
H Soltau, A Bechtele, O Jaratschin, A Liebl, A Niculae, A Simsek, R Eckhard, K Hermenau, P Lechner, G Lutz, G Schaller, F Schopper, L Strüder
Published online by Cambridge University Press:

03 August 2008, pp. 1156-1157
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Calibration of the detection efficiency of energy dispersive X-ray spectrometers for absolute intensity measurements and for establishing a basis for a more rigorous quantitation procedure
M Procop, F Scholze
Published online by Cambridge University Press:

03 August 2008, pp. 1158-1159
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A New Solid-State Detector and Counting System for Wavelength Dispersive Spectrometers
D Lesher, Y Diawara, S Medved, R Durst
Published online by Cambridge University Press:

03 August 2008, pp. 1160-1161
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

The Spatial Resolution of X-Ray Microanalysis with EDS in the Transmission Electron Microscope
R Gauvin
Published online by Cambridge University Press:

03 August 2008, pp. 1162-1163
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Compositional Mapping by X-ray Spectrum Imaging at 1 MHz Output Count Rate with the Silicon Drift Detector
D Newbury, J Davis, D Bright, N Ritchie, J Michael, P Kotula
Published online by Cambridge University Press:

03 August 2008, pp. 1164-1165
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Advances in the technology of silicon drift detectors (SDD) and multiple element SDD
R Terborg, M Rohde
Published online by Cambridge University Press:

03 August 2008, pp. 1166-1167
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Performance Comparison of SDDs with Si(Li)s for SEM/EDS Analysis
NC Barbi, ET Dobi, SD DaVilla, RM Mott
Published online by Cambridge University Press:

03 August 2008, pp. 1168-1169
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Analyzing and Expanding the Detector Efficiency of Silicon Drift Detectors
A Niculae, H Soltau, P Lechner, G Lutz, A Bechteler, R Eckhardt, K Hermenau, A Liebel, O Jaritschin, A Simsek, G Schaller, F Schopper, L Strüder
Published online by Cambridge University Press:

03 August 2008, pp. 1170-1171
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Performance of a Commercial Silicon Drift Detector for X-ray Microanalysis
EA Kenik
Published online by Cambridge University Press:

03 August 2008, pp. 1172-1173
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Determination of the Efficiency of Energy Dispersive X-ray Spectrometers with an EDS-CRM Reference Specimen
H Demers, R Gauvin
Published online by Cambridge University Press:

03 August 2008, pp. 1174-1175
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

DTSA-II: A New Tool for Simulating and Quantifying EDS Spectra - Application to Difficult Overlaps
N Ritchie, JM Davis, DE Newbury
Published online by Cambridge University Press:

03 August 2008, pp. 1176-1177
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Sum Peaks in Energy-Dispersive X-ray Spectroscopy
A Eades
Published online by Cambridge University Press:

03 August 2008, pp. 1178-1179
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Characterizing EDS Coincidence Detection At High Rates For Low Energies
RB Mott
Published online by Cambridge University Press:

03 August 2008, pp. 1180-1181
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Rutile Rock: Ti-L, O-K peak deconvolution in the presence of Fe-K
P Camus, D Rohde, B Leite
Published online by Cambridge University Press:

03 August 2008, pp. 1182-1183
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

21st Century Scanning Microscopy - Electrons and He Ions

Research Article

Application of the Helium Ion Microscope for the Imaging and Analysis of Nanomaterials
DC Bell, LA Stern, L Farkas, JA Notte
Published online by Cambridge University Press:

03 August 2008, pp. 1184-1185
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 37 of 48

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 14 - August 2008

Problem Solving Using Microanalytical Techniques

Research Article

Analytical TEM of Nb3Sn Multifilament Superconductor Wires

EMCD in the TEM – Optimization of signal acquisition and data evaluation

Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts

Research Article

Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts

40 Years of Energy Dispersive X-ray Spectrometry

Research Article

Celebrating 40 years of energy dispersive X-ray spectrometry in electron probe microanalysis (EPMA)

35 Years of EDS Software: the more things change, the more they stay the same

SDDs - Silicon Detectors for EDS with a Performance at the Theoretical Limit

Calibration of the detection efficiency of energy dispersive X-ray spectrometers for absolute intensity measurements and for establishing a basis for a more rigorous quantitation procedure

A New Solid-State Detector and Counting System for Wavelength Dispersive Spectrometers

The Spatial Resolution of X-Ray Microanalysis with EDS in the Transmission Electron Microscope

Compositional Mapping by X-ray Spectrum Imaging at 1 MHz Output Count Rate with the Silicon Drift Detector

Advances in the technology of silicon drift detectors (SDD) and multiple element SDD

Performance Comparison of SDDs with Si(Li)s for SEM/EDS Analysis

Analyzing and Expanding the Detector Efficiency of Silicon Drift Detectors

Performance of a Commercial Silicon Drift Detector for X-ray Microanalysis

Determination of the Efficiency of Energy Dispersive X-ray Spectrometers with an EDS-CRM Reference Specimen

DTSA-II: A New Tool for Simulating and Quantifying EDS Spectra - Application to Difficult Overlaps

Sum Peaks in Energy-Dispersive X-ray Spectroscopy

Characterizing EDS Coincidence Detection At High Rates For Low Energies

Rutile Rock: Ti-L, O-K peak deconvolution in the presence of Fe-K

21st Century Scanning Microscopy - Electrons and He Ions

Research Article

Application of the Helium Ion Microscope for the Imaging and Analysis of Nanomaterials

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 14 - August 2008

Problem Solving Using Microanalytical Techniques

Research Article

Electron-Probe Microanalysis (EPMA): An Overview for Beginners and a Status Report for Experts

Research Article

40 Years of Energy Dispersive X-ray Spectrometry

Research Article

21st Century Scanning Microscopy - Electrons and He Ions

Research Article