Microscopy and Microanalysis: Volume 14 -

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Volume 14 - August 2008

Contents

Page 20 of 48

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article

Molecular Depth Profiling to 3D Molecular Imaging with XPS and TOF-SIMS
JS Hammond, GL Fisher, S Raman, JF Moulder
Published online by Cambridge University Press:

03 August 2008, pp. 466-467
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Analysis of Multi-Component Polymer Blends with the Confocal Raman AFM
U Schmidt, J Mueller, K Weishaupt, O Hollricher
Published online by Cambridge University Press:

03 August 2008, pp. 468-469
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Surface Microscopy and Microanalysis in the Medical Device Industry
AM Belu
Published online by Cambridge University Press:

03 August 2008, pp. 470-471
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

New Approaches in Accelerating Material Development Through Structure-to-Property Relationships built from XPS and Microscopic Data
K Artyushkova, JE Fulghum, P Atanassov
Published online by Cambridge University Press:

03 August 2008, pp. 472-473
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Correlative Microscopic and Spectroscopic Characterization of Carboxylated Single-Walled Carbon Nanotubes
P Bajaj, K Artyushkova, I Musselman
Published online by Cambridge University Press:

03 August 2008, pp. 474-475
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Probing Polymeric Interfaces with Synchrotron Techniques
JL Lenhart, DA Fischer
Published online by Cambridge University Press:

03 August 2008, pp. 476-477
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Surface Versus Bulk Defects on Devices using Complementary Techniques
VS Smentkowski, SG Ostrowski, L Denault, CG Woychik
Published online by Cambridge University Press:

03 August 2008, pp. 478-479
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Evaluation of Chemical State Analysis and Imaging by Micro XPS
H Iwai, H Yoshikawa, S Fukushima, S Tanuma
Published online by Cambridge University Press:

03 August 2008, pp. 480-481
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Ultrafast Electron Microscopy and Ultrafast Science

Research Article

Single-Shot Dynamic Transmission Electron Microscopy: Present and Future
BW Reed, MR Armstrong, ND Browning, GH Campbell, WJ DeHope, JS Kim, WE King, TB LaGrange, JB Pesavento, BJ Pyke, S Raoux, RM Shuttlesworth, BC Stuart, ML Taheri, T Topuria
Published online by Cambridge University Press:

03 August 2008, pp. 482-483
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Lights, Action, Camera: Making Movies of Molecules (and Materials) with Femtosecond Electron Diffraction
BJ Siwick
Published online by Cambridge University Press:

03 August 2008, pp. 484-485
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Time-Resolved Electron Microscopy: Accomplishments, Challenges, and the Future Directions
VA Lobastov
Published online by Cambridge University Press:

03 August 2008, pp. 486-487
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Dynamic Studies by Repetively Pulsed and Pump-probe Microscopy
A Howie
Published online by Cambridge University Press:

03 August 2008, pp. 488-489
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Exanding In-situ Mechanical Testing into the "Ultrafast" Regime
EA Stach
Published online by Cambridge University Press:

03 August 2008, pp. 490-491
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Benefits of Aberration Correction for Ultra-Fast TEM Experiments
B Kabius
Published online by Cambridge University Press:

03 August 2008, pp. 492-493
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Extreme Beams for Single-shot Ultrafast Electron Diffraction
J Luiten, T Van Oudheusden, B Siwick, E De Jong, W Op 't Root, B Van der Geer
Published online by Cambridge University Press:

03 August 2008, pp. 494-495
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Review of Single Shot Electron Diffraction Experiments with Sub ps Resolution Using an RF Gun Electron Source
JF Schmerge
Published online by Cambridge University Press:

03 August 2008, pp. 496-497
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Optimizing the RF Photoinjector for Ultra-fast Electron Diffraction
JB Rosenzweig
Published online by Cambridge University Press:

03 August 2008, pp. 498-499
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A Quantum-degenerate Electron Source
M Zolotorev
Published online by Cambridge University Press:

03 August 2008, pp. 500-501
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Development of Time Resolved Reflection High-Energy Electron Diffraction System to Study Ultrafast Phases Transition at Surfaces
H Park, TD Pounds, JM Zuo
Published online by Cambridge University Press:

03 August 2008, pp. 502-503
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Particle Swarm Optimization of Iterative Phase Retrieval Algorithms for Ultrafast Coherent Diffractive Imaging
D Masiel, B Gipson, DG Morgan, JCH Spence, ND Browning
Published online by Cambridge University Press:

03 August 2008, pp. 504-505
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 20 of 48

Microscopy and Microanalysis

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Volume 14 - August 2008

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article

Molecular Depth Profiling to 3D Molecular Imaging with XPS and TOF-SIMS

Analysis of Multi-Component Polymer Blends with the Confocal Raman AFM

Surface Microscopy and Microanalysis in the Medical Device Industry

New Approaches in Accelerating Material Development Through Structure-to-Property Relationships built from XPS and Microscopic Data

Correlative Microscopic and Spectroscopic Characterization of Carboxylated Single-Walled Carbon Nanotubes

Probing Polymeric Interfaces with Synchrotron Techniques

Surface Versus Bulk Defects on Devices using Complementary Techniques

Evaluation of Chemical State Analysis and Imaging by Micro XPS

Ultrafast Electron Microscopy and Ultrafast Science

Research Article

Single-Shot Dynamic Transmission Electron Microscopy: Present and Future

Lights, Action, Camera: Making Movies of Molecules (and Materials) with Femtosecond Electron Diffraction

Time-Resolved Electron Microscopy: Accomplishments, Challenges, and the Future Directions

Dynamic Studies by Repetively Pulsed and Pump-probe Microscopy

Exanding In-situ Mechanical Testing into the "Ultrafast" Regime

Benefits of Aberration Correction for Ultra-Fast TEM Experiments

Extreme Beams for Single-shot Ultrafast Electron Diffraction

Review of Single Shot Electron Diffraction Experiments with Sub ps Resolution Using an RF Gun Electron Source

Optimizing the RF Photoinjector for Ultra-fast Electron Diffraction

A Quantum-degenerate Electron Source

Development of Time Resolved Reflection High-Energy Electron Diffraction System to Study Ultrafast Phases Transition at Surfaces

Particle Swarm Optimization of Iterative Phase Retrieval Algorithms for Ultrafast Coherent Diffractive Imaging

Microscopy and Microanalysis

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Volume 14 - August 2008

Surface Microscopy and Microanalysis in Materials and Biological Systems

Research Article

Ultrafast Electron Microscopy and Ultrafast Science

Research Article