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Extreme Beams for Single-shot Ultrafast Electron Diffraction

Published online by Cambridge University Press:  03 August 2008

J Luiten ,
T Van Oudheusden ,
B Siwick ,
E De Jong ,
W Op 't Root  and
B Van der Geer
J Luiten
Affiliation:
Eindhoven University of Technology, Netherlands
T Van Oudheusden
Affiliation:
Eindhoven University of Technology, Netherlands
B Siwick
Affiliation:
McGill University, Canada
E De Jong
Affiliation:
Eindhoven University of Technology, Netherlands
W Op 't Root
Affiliation:
Eindhoven University of Technology, Netherlands
B Van der Geer
Affiliation:
Eindhoven University of Technology, Netherlands
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 494 - 495
Copyright
© 2008 Microscopy Society of America

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