Microscopy and Microanalysis: Volume 14 -

< Back to all issues

Volume 14 - August 2008

Contents

Page 23 of 48

Image Analysis and Quantitative Microscopy

Research Article

Image Analysis in A Visual Programming Environment
L Liang
Published online by Cambridge University Press:

03 August 2008, pp. 586-587
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Accuracy of Optical Dimensional Metrology at the Nano-scale
J Potzick
Published online by Cambridge University Press:

03 August 2008, pp. 588-589
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Speed Limitations and Trade-off's for SEM/EDS Particle Analysis
S Scheller
Published online by Cambridge University Press:

03 August 2008, pp. 590-591
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

3D Metrology of Nanoparticles by Tomogram Processing
XJ Xu, Z Saghi, G Möbus
Published online by Cambridge University Press:

03 August 2008, pp. 592-593
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Quantifying the layer dispersion degree in polymer layered silicate nanocomposites by quantitative transmission electron microscopy
ZP Luo, RL Littleton, H Kim, JH Koo
Published online by Cambridge University Press:

03 August 2008, pp. 594-595
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

BioImageXD software in batch analysis of integrin interactions
KA Pahajoki, PP Kankaanpää, JJ Heino
Published online by Cambridge University Press:

03 August 2008, pp. 596-597
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Co-Relation of Double Diffraction Pattern and Coincident Site Lattice
M Shamsuzzoha, R Rahman
Published online by Cambridge University Press:

03 August 2008, pp. 598-599
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Spectral Image Aberration Correction Using Image Transformations
RM Noek, HDT Jones, GA Poulter, JA Timlin
Published online by Cambridge University Press:

03 August 2008, pp. 600-601
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Development of Bayesian Segmentation Techniques for Automated Segmentation of Titanium Alloy Images
JP Simmons, B Bartha, M De Graef, M Comer
Published online by Cambridge University Press:

03 August 2008, pp. 602-603
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Extracting Rich, Quantitative Information from Images Using Open-Source Software
AE Carpenter, TR Jones
Published online by Cambridge University Press:

03 August 2008, pp. 604-605
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Determination of True Particle Size Distribution in High Impact Polystyrene (HIPS)
W Heckmann
Published online by Cambridge University Press:

03 August 2008, pp. 606-607
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Improvements in automated photometric stereo 3D SEM
R Pintus, S Podda, M Vanzi
Published online by Cambridge University Press:

03 August 2008, pp. 608-609
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Non-Contact 3D Surface Metrology of Large Grain High Purity Niobium by SLCM and FESEM
ZH Sung, PJ Lee, DC Larbalestier
Published online by Cambridge University Press:

03 August 2008, pp. 610-611
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Failure Analysis: Real World Applications and Case Studies

Research Article

Catastrophic Failure of a Wheel Assembly in a Heavy Duty Off-Road 6X6 Vehicle
CN Johnson
Published online by Cambridge University Press:

03 August 2008, pp. 612-613
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Metallurgical and Metallographic Aspects of Engineering Failure Analysis
ME Stevenson, JL McDougall, MD Hayes
Published online by Cambridge University Press:

03 August 2008, pp. 614-615
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Microstructural Evaluation of Electron Beam Melted Ti-6Al-4V
JR Wooten, DP Dennies
Published online by Cambridge University Press:

03 August 2008, pp. 616-617
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Cosmetic Defects Due to Contamination in an Electroplated Deposit
KR Wasag, FE Schmidt
Published online by Cambridge University Press:

03 August 2008, pp. 618-619
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Imaging Grain Boundary Corrosion at Low Beam Currents in a Modern FIB/SEM System Equipped With a New Secondary Ion Detector
A Laquerre, MW Phaneuf
Published online by Cambridge University Press:

03 August 2008, pp. 620-621
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Failure Analysis of a Fractured Ductile Cast Iron Bracket
S Raebel
Published online by Cambridge University Press:

03 August 2008, pp. 622-623
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Microscopy Study of Localized Gate Forward Breakdown in AlGaN/AlN/GaN High Electron Mobility Transistors
L Li, NT Nuhfer, M Skowronski
Published online by Cambridge University Press:

03 August 2008, pp. 624-625
- Article
- - Get access
    
    Check if you have access via personal or institutional login
    
    Log in Register
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 23 of 48

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 14 - August 2008

Image Analysis and Quantitative Microscopy

Research Article

Image Analysis in A Visual Programming Environment

Accuracy of Optical Dimensional Metrology at the Nano-scale

Speed Limitations and Trade-off's for SEM/EDS Particle Analysis

3D Metrology of Nanoparticles by Tomogram Processing

Quantifying the layer dispersion degree in polymer layered silicate nanocomposites by quantitative transmission electron microscopy

BioImageXD software in batch analysis of integrin interactions

Co-Relation of Double Diffraction Pattern and Coincident Site Lattice

Spectral Image Aberration Correction Using Image Transformations

Development of Bayesian Segmentation Techniques for Automated Segmentation of Titanium Alloy Images

Extracting Rich, Quantitative Information from Images Using Open-Source Software

Determination of True Particle Size Distribution in High Impact Polystyrene (HIPS)

Improvements in automated photometric stereo 3D SEM

Non-Contact 3D Surface Metrology of Large Grain High Purity Niobium by SLCM and FESEM

Failure Analysis: Real World Applications and Case Studies

Research Article

Catastrophic Failure of a Wheel Assembly in a Heavy Duty Off-Road 6X6 Vehicle

Metallurgical and Metallographic Aspects of Engineering Failure Analysis

Microstructural Evaluation of Electron Beam Melted Ti-6Al-4V

Cosmetic Defects Due to Contamination in an Electroplated Deposit

Imaging Grain Boundary Corrosion at Low Beam Currents in a Modern FIB/SEM System Equipped With a New Secondary Ion Detector

Failure Analysis of a Fractured Ductile Cast Iron Bracket

Electron Microscopy Study of Localized Gate Forward Breakdown in AlGaN/AlN/GaN High Electron Mobility Transistors

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 14 - August 2008

Image Analysis and Quantitative Microscopy

Research Article

Failure Analysis: Real World Applications and Case Studies

Research Article